System and method for detecting design and process defects on a wafer using process monitoring features
US-9710903-B2 · Jul 18, 2017 · US
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Hess Carl patents
Hess Carl holds 2 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 2 |
| Recent patents | 0 |
| First publication | Dec 8, 2015 |
| Latest publication | Jul 18, 2017 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Method and system for hybrid reticle inspection
US-9208552-B2 · Dec 8, 2015 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Physics | 2 |
| Electricity | 1 |