Automatic wavelength or angle pruning for optical metrology
US-11175589-B2 · Nov 16, 2021 · US
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Poslavsky Leonid patents
Poslavsky Leonid holds 12 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 12 |
| Recent patents | 0 |
| First publication | Jan 6, 2015 |
| Latest publication | Nov 16, 2021 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Automatic selection of sample values for optical metrology
US-10895810-B2 · Jan 19, 2021 · US
Automatic determination of fourier harmonic order for computation of spectral information for diffraction structures
US-10481088-B2 · Nov 19, 2019 · US
Optimized spatial modeling for optical CD metrology
US-9915522-B1 · Mar 13, 2018 · US
Calculation method for local film stress measurements using local film thickness values
US-9625823-B1 · Apr 18, 2017 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Automatic wavelength or angle pruning for optical metrology
US-11175589-B2 · Nov 16, 2021 · US
Automatic selection of sample values for optical metrology
US-10895810-B2 · Jan 19, 2021 · US
Automatic determination of fourier harmonic order for computation of spectral information for diffraction structures
US-10481088-B2 · Nov 19, 2019 · US
Optimized spatial modeling for optical CD metrology
US-9915522-B1 · Mar 13, 2018 · US
Calculation method for local film stress measurements using local film thickness values
US-9625823-B1 · Apr 18, 2017 · US
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Physics | 11 |
| Electricity | 6 |
| Cross-Sectional Technologies | 1 |