Specimen potential measuring method, and charged particle beam device
US-9129775-B2 · Sep 8, 2015 · US
Sakai Kei was listed as an assignee on 3 patent publications in 2015.
| Metric | Value |
|---|---|
| Company | Sakai Kei |
| Year | 2015 |
| Patents | 3 |
Representative publications for Sakai Kei in 2015.
US-9129775-B2 · Sep 8, 2015 · US
US-9029045-B2 · May 12, 2015 · US
US-9024272-B2 · May 5, 2015 · US
Most common classification codes for Sakai Kei in 2015.
| CPC | Patents |
|---|---|
| H10P74/203 | 2 |
| G01B15/045 | 1 |
| G01B2210/56 | 1 |
| G01R29/24 | 1 |
| G03F7/70466 | 1 |
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