Mass analyser and method of mass analysis

Patent metadata

Field	Value
Publication number	US-9997343-B2
Application number	US-201715618959-A
Country	US
Kind code	B2
Filing date	Jun 9, 2017
Priority date	Feb 28, 2011
Publication date	Jun 12, 2018
Grant date	Jun 12, 2018

Abstract

An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.

First claim

The invention claimed is:

1. An ion trap for mass analysis comprising:
a first array of electrodes and
a second array of electrodes, spaced from the first array of electrodes,
voltage being supplied, in use, to electrodes of the first and second arrays of electrodes to create an electrostatic field in the space between the electrode arrays,
a magnet for superimposing a static magnetic field on said electrostatic field,
wherein electrodes of the first array and electrodes of the second array are supplied, in use, with substantially the same pattern of voltage,
whereby the distribution of electrical potential in said space is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in said space, and
said magnetic field is in the direction of said flight direction to assist focusing and stabilization of ion motion transverse to the flight direction, substantially mid-way between the first and second arrays of electrodes;
wherein at least one electrode of said arrays is connected to amplifier circuitry for detection of image current having frequency components related to the mass-to-charge ratio of ions undergoing said periodic oscillatory motion in said space between the first and second arrays of electrodes.

2. The ion trap as claimed in claim 1 , wherein said magnet is a superconducting magnet.

3. The ion trap as claimed in claim 1 , wherein said magnet comprises a rare-earth metal based permanent magnet.

4. A method of mass analysis comprising the steps of:
injecting ions into a mass analysis space between first and second arrays of electrodes of an electrostatic ion trap, the first array of electrodes being spaced from the second array of electrodes,
supplying substantially the same pattern of voltage to electrodes of the first and second arrays of electrodes to create an electrostatic field in the space between the electrode arrays, and
superimposing a static magnetic field on said electrostatic field using a magnet;
whereby distribution of electrical potential in said space between the first and second array of electrodes is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in said space, and said static magnetic field is in the direction of said flight direction to assist focusing and stabilization of ion motion substantially mid-way between the first and second arrays of electrodes and
wherein at least one electrode of said arrays is connected to amplifier circuitry for detection of image current having frequency components related to the mass-to-charge ratio of ions undergoing said periodic oscillatory motion in said space between the first and second arrays of electrodes.

5. The method of claim 4 , further comprising detecting image current on at least one electrode of said arrays, the detected image current having frequency components related to the mass-to-charge ratio of ions undergoing said periodic, oscillatory motion in said space.

Assignees

• Shimadzu Corp

Inventors

• Ding Li
• Sudakov Mikhail
• Kumashiro Sumio

Classifications

• H01J49/061

  Ion deflecting means, e.g. ion gates · CPC title

• H01J49/406

  with multiple reflections · CPC title

• H01J49/408

  with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight · CPC title

• H01J49/4245

  Electrostatic ion traps (H01J49/422 takes precedence) · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title