Spectrometer and spectrometer module

Patent metadata

Field	Value
Publication number	US-9989413-B1
Application number	US-201715442851-A
Country	US
Kind code	B1
Filing date	Feb 27, 2017
Priority date	Nov 18, 2016
Publication date	Jun 5, 2018
Grant date	Jun 5, 2018

Abstract

A spectrometer and a spectrometer module are disclosed. The spectrometer includes a liquid crystal (LC) filter including an LC layer configured to pass light having a wavelength that is tunable based on an electrical stimulus that is applied to the LC layer, and a photodetector configured to detect the light passed through the LC filter.

First claim

What is claimed is:

1. A spectrometer comprising:
a liquid crystal (LC) filter comprising:
an LC layer configured to pass light having a wavelength that is tunable based on an electrical stimulus that is applied to the LC layer; and

a first dielectric mirror and a second dielectric mirror,
wherein the LC layer is interposed between the first dielectric mirror and the second dielectric mirror,
the first dielectric mirror has a first laminated structure in which a first inorganic layer of SiN or TiO 2 and a second inorganic layer of SiO 2 are alternately stacked on each other, and
the second dielectric mirror has a second laminated structure in which a third inorganic layer of SiN or TiO 2 and a fourth inorganic layer of SiO 2 are alternately stacked on each other;

a photodetector configured to detect the light passed through the LC filter;
a spectrum scanner configured to apply the electrical stimulus to the LC layer; and
a spectrum generator configured to:
measure intensities of the detected light of different wavelengths; and
generate a spectrum, based on the measured intensities of the detected light.

2. The spectrometer of claim 1 , wherein the LC filter further comprises a first electrode and a second electrode,
the first electrode is interposed between the first dielectric mirror and the LC layer, and
the second electrode is interposed between the LC layer and the second dielectric mirror.

3. The spectrometer of claim 1 , wherein the first dielectric mirror and the second dielectric mirror have different thicknesses.

4. A spectrometer comprising:
liquid crystal (LC) filters, each of the LC filters comprising:
an LC layer configured to pass light having a wavelength that is tunable based on an electrical stimulus that is applied to the LC layer; and
a first dielectric mirror and a second dielectric mirror,
wherein the LC layer is interposed between the first dielectric mirror and the second dielectric mirror,
the first dielectric mirror has a first laminated structure in which a first inorganic layer of SiN or TiO 2 and a second inorganic layer of SiO 2 are alternately stacked on each other, and
the second dielectric mirror has a second laminated structure in which a third inorganic layer of SiN or TiO 2 and a fourth inorganic layer of SiO 2 are alternately stacked on each other;
a photodetector configured to detect the light passed through the LC filters;
a spectrum scanner configured to apply the electrical stimulus to the LC layer; and
a spectrum generator configured to:
measure intensities of the detected light of different wavelengths; and
generate a spectrum, based on the measured intensities of the detected light.

5. The spectrometer of claim 4 , wherein the LC filters have different thicknesses.

6. A spectrometer module comprising:
a light source configured to irradiate light onto an object;
a spectrometer configured to receive scattered light from the object onto which the light is irradiated, and measure a spectrum, based on the received scattered light; and
a processor configured to analyze physical properties of the object, based on the measured spectrum,
wherein the spectrometer comprises:
a liquid crystal (LC) filter comprising:
an LC layer configured to pass light having a wavelength that is tunable based on an electrical stimulus that is applied to the LC layer; and
a first dielectric mirror and a second dielectric mirror,
wherein the LC layer is interposed between the first dielectric mirror and the second dielectric mirror,
the first dielectric mirror has a first laminated structure in which a first inorganic layer of SiN or TiO 2 and a second inorganic layer of SiO 2 are alternately stacked on each other; and
the second dielectric mirror has a second laminated structure in which a third inorganic layer SiN or TiO 2 and a fourth inorganic layer of SiO 2 are alternately stacked on each other; and

a photodetector configured to detect the light passed through the LC filter.

7. The spectrometer module of claim 6 , wherein the LC filter further comprises a first electrode and a second electrode,
the first electrode is interposed between the first dielectric mirror and the LC layer, and
the second electrode is interposed between the LC layer and the second dielectric mirror.

8. The spectrometer module of claim 6 , wherein the processor is further configured to analyze the physical properties of the object, using near-infrared (NIR) absorption spectroscopy or Raman spectroscopy.

9. The spectrometer module of claim 6 , wherein the spectrometer is further configured to receive the scattered light that is reflected from the object onto which the light is irradiated.

10. The spectrometer module of claim 6 , wherein the spectrometer is further configured to receive the scattered light that is transmitted through the object onto which the light is irradiated.

Assignees

• Samsung Electronics Co Ltd

Inventors

• Ungnapatanin Jesada

Classifications

• G01J3/26

  using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters · CPC title

• G01J3/12 Primary

  Generating the spectrum; Monochromators · CPC title

• G01J3/28

  Investigating the spectrum (using colour filters G01J3/51) · CPC title

• G02F1/13306

  Circuit arrangements or driving methods for the control of single liquid crystal cells (G02F1/132, G02F1/133382 take precedence) · CPC title

• G02F1/139

  based on orientation effects in which the liquid crystal remains transparent · CPC title