Backlight source for instrument, its operating method, and instrument

Patent metadata

Field	Value
Publication number	US-9975478-B2
Application number	US-201515039248-A
Country	US
Kind code	B2
Filing date	Nov 12, 2015
Priority date	Jun 9, 2015
Publication date	May 22, 2018
Grant date	May 22, 2018

Abstract

A backlight source for instrument includes a backlight source region and a pointer region. The backlight source region includes at least two sub-regions, each of which is provided with a backlight source independently. The pointer region is provided with an instrument pointer. When the instrument pointer is turned into one of the at least two sub-regions, the backlight source which corresponds to the sub-region emits light individually. Thus, the backlight source is saved and the energy consumption is reduced. Backlight sources corresponding to different sub-regions emit light of different colors, and the backlight sources of different colors are sequentially arranged according to warning degree and thus can have a warning function. Further, an operation method of backlight source for instrument and an instrument are further provided.

First claim

The invention claimed is:

1. A backlight source for instrument, comprising a backlight source region and a pointer region, the backlight source region surrounding the pointer region and comprising at least two sub-regions each of which is provided with a backlight source;
the pointer region having an instrument pointer provided therein;
the backlight source region configured such that when the instrument pointer is turned into one of the at least two sub-regions, the backlight source which corresponds to the sub-region emits light individually;
wherein each of the at least two sub-regions is provided with a contact structure independently which comprises a first metal contact and a second metal contact, the first metal contact is connected with a first electrode of the backlight source and the second metal contact is connected with a second electrode of the backlight source;
the pointer region is provided with a probe structure comprising a first conductive probe and a second conductive probe, the first conductive probe and the second conductive probe are fixedly disposed with respect to the instrument pointer, the first conductive probe is connected with a first electrode of a power supply, and the second conductive probe is connected with a second electrode of the power supply:
where the instrument pointer is rotated into the sub-region, the first metal contact corresponding to the sub-region is connected with the first conductive probe, and the second metal contact corresponding to the sub-region is connected with the second conductive probe.

2. The backlight source for instrument according to claim 1 , wherein the backlight sources corresponding to adjacent sub-regions among the at least two sub-regions emit light of different colors.

3. The backlight source for instrument according to claim 1 , wherein the first conductive probe and the second conductive probe are fixedly disposed with respect to the instrument pointer through a rotation shaft.

4. The instrument backlight source for instrument according to claim 1 , wherein the first conductive probe and the second conductive probe can be directly disposed on the instrument pointer.

5. The backlight source for instrument according to claim 1 , wherein the contact structure is disposed close to the pointer region, the first metal contact is disposed above the second metal contact, and the first conductive probe has its bottom disposed above the bottom of the second conductive probe, so that the probe structure and the contact structure are matched with each other.

6. The backlight source for instrument according to claim 1 , wherein the contact structures of the at least two sub-regions are spaced apart from each other, the first conductive probe has a width in an arranging direction of adjacent first metal contacts greater than an interval between adjacent first metal contacts, and the second conductive probe has a width in an arranging direction of adjacent second metal contact greater than an interval between adjacent second metal contacts.

7. The backlight source for instrument according to claim 1 , wherein the contact structure further comprises a first insulating layer which is disposed between the first metal contact and the second metal contact.

8. The backlight source for instrument according to claim 1 , wherein the contact structure further comprises a second insulating layer and a third insulating layer, the second insulating layer is disposed above the first metal contact, and the third insulating layer is disposed below the second metal contact.

9. The backlight source for instrument according to claim 1 , wherein each of the at least two sub-regions has the same shape and/or area.

10. The backlight source for instrument according to claim 1 , wherein the backlight source of each of the at least two sub-regions has a color sequentially arranged according to warning degree.

11. The backlight source for instrument according to claim 1 , wherein the backlight source region is an annular region and the pointer region is a circular region.

12. The backlight source for instrument according to claim 1 , wherein each of the backlight source region and the pointer region is a sector region.

13. An instrument comprising a backlight source, the backlight source comprising a backlight source region and a pointer region, the backlight source region surrounding the pointer region and comprising at least two sub-regions each of which is provided with a backlight source;
the pointer region having an instrument pointer provided therein;
the backlight source region configured such that when the instrument pointer is turned into one of the at least two sub-regions, the backlight source which corresponds to the sub-region emits light individually;
wherein each of the at least two sub-regions is provided with a contact structure independently which comprises a first metal contact and a second metal contact, the first metal contact is connected with a first electrode of the backlight source and the second metal contact is connected with a second electrode of the backlight source;
the pointer region is provided with a probe structure comprising a first conductive probe and a second conductive probe, the first conductive probe and the second conductive probe are fixedly disposed with respect to the instrument pointer, the first conductive probe is connected with a first electrode of a power supply, and the second conductive probe is connected with a second electrode of the power supply;
where the instrument pointer is rotated into the sub-region, the first metal contact corresponding to the sub-region is connected with the first conductive probe, and the second metal contact corresponding to the sub-region is connected with the second conductive probe.

14. An operation method of a backlight source for instrument, wherein the instrument backlight source comprises a backlight source region and a pointer region, the backlight source region surrounds the pointer region and comprises at least two sub-regions each of which is provided with a backlight source independently, and the pointer region is provided with an instrument pointer,
the operation method comprises:
when the instrument pointer is turned into one of the at least two sub-regions, the backlight source which corresponds to the sub-region emits light individually;
wherein each of the at least two sub-regions is provided with a contact structure which comprises a first metal contact and a second metal contact, the first metal contact is connected with a first electrode of the backlight source and the second metal contact is connected with a second electrode of the backlight source;
the pointer region is provided with a probe structure comprising a first conductive probe and a second conductive probe, the first conductive probe and the second conductive probe are fixedly connected with the instrument pointer, the first conductive probe is connected with a first electrode of a power supply, and the second conductive probe is connected with a second electrode of the power supply:
the step in which when the instrument pointer is turned into one of the at least two sub-regions, the backlight source which corresponds to the sub-region emits light individually comprises:
where the instrument pointer is turned into the sub-region, the first metal contact corresponding to the sub-region is connected with the first conductive probe, and the second metal contact corresponding to the sub-region is connected with the second conductive probe.

15. The operation method of a backlight source for instrument according to claim 14 ,

Assignees

• Boe Technology Group Co Ltd
• Beijing Boe Chatani Electronics Co Ltd

Inventors

• Zhou Zhendong
• Li Jinze
• Yang Dongsheng

Classifications

• B60Q3/18

  for varying the light intensity · CPC title

• B60Q3/14 Primary

  lighting through the surface to be illuminated · CPC title

• G01D11/28 Primary

  Structurally-combined illuminating devices · CPC title