Shaping system with cutouts in an optical diaphragm and method of use
US-12111570-B2 · Oct 8, 2024 · US
US9975291B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9975291-B2 |
| Application number | US-201314441866-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 19, 2013 |
| Priority date | Dec 27, 2012 |
| Publication date | May 22, 2018 |
| Grant date | May 22, 2018 |
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A nanostructure that is visually recognized as being seamless by its more regularly and more uniformly formed fine concave-convex structure and that exhibits an excellent antireflection effect against light in a visible wavelength range is provided. Such a nanostructure is configured by a number of rows of tracks each including structures, formed by protrusions or depressions on a surface of a substrate, arranged at a predetermined fine pitch. In this nanostructure, a distance between centers of the structures adjacent to each other across a strip-shaped portion (seam) in which portions with no structures within the predetermined pitch are continuously formed in a track arrangement direction is adjusted so as to prevent visual recognition of the seam.
Opening claim text (preview).
The invention claimed is: 1. A nanostructure master used for manufacturing a nanostructure, the nanostructure master including surface concavities and convexities and an area without concavities and convexities that forms a seam in the nanostructure, so as to form the nanostructure comprising a number of tracks, each including arrangement of structures formed by the surface concavities and convexities on a surface of a substrate with a predetermined pitch, wherein every track includes a portion in which there are no additional structures continuously formed within the predetermined pitch so as to form the seam across a plurality of tracks, wherein the portion includes a distance between centers of the structures adjacent to each other across the seam, the distance between the centers of the structures adjacent to each other across the seam or a length of the seam is determined so as to prevent visual recognition of the seam, the distance between the centers of the structures adjacent to each other across the seam is set to be: (i) 1 to 1.52 times the predetermined pitch, or (ii) greater than 1.52 times the pitch when the length of the seam continuously formed across a plurality if tracks is set at 50 μm or less, and the adjacent structures of different tracks are arranged in a staggered manner. 2. The nanostructure master according to claim 1 , wherein the nanostructure master is a roll master.
characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor · CPC title
Polymers of esters · CPC title
Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams (maskless lithography using a programmable mask G03F7/70291) · CPC title
characterised by the material or the manufacturing process (B29C33/44 takes precedence) · CPC title
Nanotechnology for materials or surface science, e.g. nanocomposites · CPC title
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