Apparatus and method for treating substrate

US9975151B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9975151-B2
Application numberUS-201514749010-A
CountryUS
Kind codeB2
Filing dateJun 24, 2015
Priority dateJul 8, 2014
Publication dateMay 22, 2018
Grant dateMay 22, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Embodiments of the inventive concepts provide an apparatus and a method for treating a substrate. The apparatus includes a substrate support unit supporting the substrate, and a liquid supply unit supplying a treatment solution to the substrate supported by the substrate support unit. The liquid supply unit includes a nozzle discharging the treatment solution to the substrate, a liquid supply line supplying the treatment solution to the nozzle, a mixing member installed on the liquid supply line, a mixing space formed within the mixing member, and a gas supply line connected to the mixing member to supply a gas into the mixing space. The mixing member includes a body within which the mixing space is formed, and an inflow port combined with the body such that the gas supplied through the inflow port is mixed with the treatment solution in the mixing space to form nano-sized bubbles.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for treating a substrate, the method comprising: supplying a treatment solution into a mixing member at a first flow rate; supplying a gas into the mixing member at a second flow rate such that the gas is mixed with the treatment solution to form the treatment solution including bubbles; measuring, by a controller, the first flow rate and the second flow rate; controlling, by the controller, at least one of the first flow rate or the second flow rate such that the treatment solution includes a plurality of bubbles having nanometer-sized diameters in response to a result of the measuring; and supplying the treatment solution including the bubbles to the substrate to treat the substrate based on the result of the measuring. 2. The method of claim 1 , wherein the controlling comprises: adjusting the second flow rate to be greater than the first flow rate. 3. The method of claim 2 , wherein the supplying supplies the treatment solution including the bubbles to the substrate in response to the result of the measuring indicating that the diameters of the bubbles are equal to or smaller than a size. 4. The method of claim 3 , wherein the size is about 1 micrometer. 5. The method of claim 2 , wherein the first flow rate corresponds to a first pressure, the second flow rate corresponds to a second pressure, and the adjusting comprises adjusting at least one of the first flow rate and the second flow rate such that a difference between the first pressure and the second pressure is 100 kpa or less. 6. The method of claim 1 , wherein the supplying supplies the treatment solution including the bubbles to the substrate in response to the result of the measuring indicating that diameters of the bubbles are equal to or smaller than a size. 7. The method of claim 6 , wherein the size is about 1 micrometer. 8. The method of claim 1 , further comprising: exhausting the treatment solution including the bubbles in response to the results of the measuring indicating that the diameters of the bubbles are greater than a size so that the treatment solution including the bubbles is not provided to the substrate. 9. The method of claim 8 , wherein the size is about 1 micrometer. 10. The method of claim 1 , wherein the supplying includes, opening a supply valve and closing an exhaust valve in response to the results of the measuring indicating that the diameters of the bubbles are equal to or smaller than a threshold size to provide the treatment solution including the bubbles to the substrate, and, opening the exhaust valve and closing the supply valve in response to the results of the measuring indicating that the diameters of the bubbles are greater than the threshold size to not provide the treatment solution including the bubbles to the substrate. 11. The method of claim 1 , wherein the measuring, by the controller determines whether the bubbles have nano-sized diameters based on a difference between the first flow rate and the second flow rate. 12. The method of claim 1 , wherein the supplying includes controlling, by the controller, opening and closing of a supply valve and an exhaust valve based on whether a difference between the first flow rate and the second flow rate is within a value range, the supply valve being a valve configured to supply the treatment solution including the bubble to the substrate, the exhaust valve being a valve configure to collect the treatment solution including the bubble to not supply the treatment solution including the bubbles to the substrate.

Assignees

Inventors

Classifications

  • using mainly spraying means, e.g. nozzles · CPC title

  • Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title

  • Cleaning of wafers, substrates or parts of devices · CPC title

  • for general liquid treatment, e.g. etching followed by cleaning · CPC title

  • B08B3/10Primary

    with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration · CPC title

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What does patent US9975151B2 cover?
Embodiments of the inventive concepts provide an apparatus and a method for treating a substrate. The apparatus includes a substrate support unit supporting the substrate, and a liquid supply unit supplying a treatment solution to the substrate supported by the substrate support unit. The liquid supply unit includes a nozzle discharging the treatment solution to the substrate, a liquid supply l…
Who is the assignee on this patent?
Semes Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10P72/0402. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue May 22 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).