Sensor arrays and methods for making same
US-9194840-B2 · Nov 24, 2015 · US
US9970897B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9970897-B2 |
| Application number | US-99926209-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 16, 2009 |
| Priority date | Jun 16, 2008 |
| Publication date | May 15, 2018 |
| Grant date | May 15, 2018 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A van der Pauw (VDP) sensor comprising an electronic circuit electrically coupled to a surface, the surface comprising a type III-V material, and the electronic circuit measuring a sheet resistivity of the surface using a VDP technique. The VDP sensor may further comprise a macromolecule, such as a porphyrin, an oligonucleotide, a protein, a polymer or a combination thereof in contact with the surface. The VDP sensors may be arranged in an array of similar or different sensors. An electronic circuit electrically coupled to a type III-V material having a two-dimensional electron gas, such as InAs or InN, the electronic circuit measuring an electrical property of the type III-V material having a two-dimensional electron gas.
Opening claim text (preview).
What is claimed is: 1. A chemical sensor comprising an electronic circuit electrically coupled to a non-doped semiconductor material having a first edge and a second edge, the non-doped semi-conductor material comprising a type III-V material having a surface and a surface electron accumulation layer, and a macromolecule being in contact with the surface of the type III-V material such that binding of an analyte to the macromolecule causes a change in an electrical property of the type III-V material by altering the surface electron accumulation layer, the electronic circuit measuring the change in the electrical property of the type III-V material to detect binding of the analyte. 2. The chemical sensor of claim 1 , wherein the type III-V material is in the shape of a surface, and the electronic circuit measures an electrical property of the surface. 3. The chemical sensor of claim 1 , wherein the type III-V material comprises at least one of InAs, InN, and a combination thereof. 4. The chemical sensor of claim 1 , wherein the electrical property is selected from the group consisting of resistivity, conductivity, capacitance, inductance, and impedance. 5. The chemical sensor of claim 1 , wherein the macromolecule comprises at least one of a porphyrin, an oligonucleotide, a protein, a polymer or a combination thereof. 6. The chemical sensor of claim 5 , wherein the macromolecule is a porphyrin. 7. The chemical sensor of claim 6 , wherein the porphyrin comprises at least one of tetraphenyl porphyrin, a hemin, a corrin, a chlorin, a corphin, or a combination thereof. 8. The chemical sensor of claim 6 , wherein the porphyrin has a central metal atom, and the central metal atom is selected from the group consisting of Fe, Co, Ni, Zn, Mg, Mn, Cu, Ru, V, Pb, and Cr. 9. The chemical sensor of claim 1 , further comprising a spacer molecule contacting the sensor. 10. The chemical sensor of claim 9 , wherein the spacer molecule is benzoic acid or a derivative of benzoic acid. 11. An array of chemical sensors, comprising multiple sensors of claim 1 . 12. The array of chemical sensors of claim 11 , wherein a first portion of the array of chemical sensors comprises porphyrins having a first central metal atom, and wherein a second portion of the array of chemical sensors comprises porphyrins having a second central metal atom, and wherein the first central metal atom and the second central metal atom are different. 13. The chemical sensor of claim 1 , wherein the first edge of the semiconductor material is configured for applying current to said first edge and the second edge is configured for measuring voltage at said second edge to determine a first value of an electrical property of the semiconductor material. 14. A chemical sensor comprising an electronic circuit electrically coupled to a non-doped semiconductor material film supported on a substrate, the non-doped semi-conductor material comprising a type III-V material having a surface and a surface electron accumulation layer, and a macromolecule being in contact with the surface of the type III-V material such that binding of an analyte to the macromolecule causes a change in an electrical property of the type III-V material by altering the surface electron accumulation layer, the electronic circuit measuring the change in the electrical property of the type III-V material to detect binding of the analyte. 15. The chemical sensor of claim 14 , wherein the semiconductor material film has a first edge and a second edge. 16. The chemical sensor of claim 15 , wherein the first edge of the semiconductor material film is configured for applying current to said first edge and the second edge is configured for measuring voltage at said second edge to determine a first value of an electrical property of the semiconductor material film.
Integrated circuits therefor, e.g. fabricated by CMOS processing · CPC title
specially adapted for biomolecules, e.g. gate electrode with immobilised receptors · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.