Nephelometry method and apparatus for determining the concentration of suspended particles in an array of sample containers

US9970868B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9970868-B2
Application numberUS-201414913148-A
CountryUS
Kind codeB2
Filing dateAug 19, 2014
Priority dateAug 22, 2013
Publication dateMay 15, 2018
Grant dateMay 15, 2018

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Abstract

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Described are devices, methods, and systems that are suitable for rapidly and simultaneously determining the concentration of suspended particles in a sample. The devices, methods, and systems allow for the rapid and simultaneous interrogation of a large number of sample wells in a single vessel, for example, samples contained in a two-dimensional array or micro-titer plate, without the need for moving reading heads or moving the sample vessel. The nephelometry system allows the user to rapidly and simultaneously measure the concentration of the particles in numerous samples, adjust the concentration of the particles in the sample with a sample handling system, and re-measure the concentration of the samples in order to achieve a desired concentration.

First claim

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The invention claimed is: 1. A nephelometry system for determining the concentration of suspended particles in an array of sample containers comprising: a) nephelometry device for determining the concentration of suspended particles, in a vessel segmented into individual sample wells comprising: a vessel segmented into a plurality of sample wells positioned on a housing over an opening in the housing, wherein each sample well is capable of receiving a liquid sample and wherein the plurality of sample wells have a bottom that is optically transmissive; a plurality of light sources positioned within the housing, flanking the sample wells, wherein the light sources uniformly illuminate the bottoms of the plurality of sample wells; and a photoelectric sensor array positioned within the housing containing an imaging system that is oriented to receive back-scatter light produced by particles, if present, in each sample upon illumination by the light sources, and wherein the photoelectric sensor array is configured such that each sensor or group of sensors will receive back-scatter light that is associated with at least one well in the array; b) a sample handling system, comprising a robotic pipette adapted to introduce sample into the sample wells of the vessel in response to instructions from an instrument controller; c) an image processor for receiving an image of the illuminated bottom of the vessel disposed on the nephelometry device housing; and d) a system computer adapted to receive instructions from an operator and, in response thereto provide instructions to the instrument controller and the image processor, obtain the image of the illuminated bottom of the vessel, and based upon the image, determine a concentration of particles in at least one sample in at least one well of the vessel. 2. The system of claim 1 , wherein the housing is opaque and light-tight. 3. The system of claim 1 , wherein the vessel is a multi-well micro-titer plate. 4. The system of claim 1 , wherein the sample wells have flat bottoms. 5. The system of claim 1 , wherein the light sources illuminate the bottoms of the sample wells with light selected from the group consisting of visible light, narrow-band light, ultra-violet light, and broad band light. 6. The system of claim 1 , wherein the light sources are light-emitting diodes. 7. The system of claim 1 , wherein walls of the sample wells are opaque. 8. The system of claim 1 , further comprising baffles located under the light sources, wherein the baffles are configured to trap specular reflections and prevent those specular reflections from reaching the photoelectric sensor array. 9. The system of claim 1 , wherein the photoelectric sensor array comprises a CMOS chip. 10. The system of claim 1 , wherein the photoelectric sensor array comprises a digital camera. 11. The system of claim 10 , wherein the digital camera comprises an objective lens that transmits the back-scattered light to the photoelectric sensor array. 12. The system of claim 1 , further comprising a 45 degree mirror that deflects back-scatter light to the photoelectric sensor array. 13. The system of claim 1 further comprising a gradient neutral filter interposed between each light source and the vessel. 14. The system of claim 1 , wherein the vessel is covered with an opaque light shield at the opening of the housing. 15. The system of claim 1 , wherein each well has a flat and optically transmissive bottom. 16. The system of claim 1 , wherein the vessel is a multi-well, micro-titer plate. 17. The system of claim 1 , wherein the light sources illuminate the bottoms of all sample wells with visible light. 18. The system of claim 1 , wherein the light sources illuminate the bottoms of all sample wells with narrow-band light. 19. The system of claim 1 , wherein the bottoms of the sample wells are illuminated by the light sources at an angle of incidence that deviates from a normal angle of incidence by 45 degrees to 85 degrees. 20. The system of claim 1 , wherein the bottoms of the sample wells are illuminated by the light sources at an angle of incidence that deviates from a normal angle of incidence by 75 degrees. 21. The system of claim 1 , wherein the instrument controller determines that the particle concentration of the sample is outside a preset range of particle concentrations, the instrument controller instructs the robotic pipette add liquid sample without particle if the concentration is above the preset range and to concentrate the particle in the sample if the particle concentration is below the preset range.

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What does patent US9970868B2 cover?
Described are devices, methods, and systems that are suitable for rapidly and simultaneously determining the concentration of suspended particles in a sample. The devices, methods, and systems allow for the rapid and simultaneous interrogation of a large number of sample wells in a single vessel, for example, samples contained in a two-dimensional array or micro-titer plate, without the need fo…
Who is the assignee on this patent?
Becton Dickinson Co, Highet David W
What technology area does this patent fall under?
Primary CPC classification G01N21/51. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 15 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).