Unit pixels, image sensors including the same, and image processing systems including the same

Patent metadata

Field	Value
Publication number	US-9966407-B2
Application number	US-201514830805-A
Country	US
Kind code	B2
Filing date	Aug 20, 2015
Priority date	Aug 21, 2014
Publication date	May 8, 2018
Grant date	May 8, 2018

Abstract

A unit pixel of an image sensor which operates in global shutter mode is provided. The unit pixel includes a photo diode area including a photo diode configured to accumulate photocharges generated from incident light during a first period and a storage diode area including a storage diode configured to receive and store the photocharges from the photo diode. The photo diode corresponds to a micro lens that focuses the incident light.

First claim

What is claimed is:

1. A unit pixel of an image sensor which operates in global shutter mode, the unit pixel comprising:
a photo diode area comprising a photo diode that is covered by a micro lens and that is configured to accumulate photocharges generated from incident light focused by the micro lens; and
a storage diode area adjoining the photo diode area and comprising a storage diode that is not covered by the micro lens and that is configured to receive and store the photocharges that have been accumulated in the photo diode.

2. The unit pixel of claim 1 , wherein the micro lens is one of an array of micro lenses, wherein the storage diode area is offset from the photo diode area along a direction aslant with respect to either of a row direction and a column direction of the array of micro lenses.

3. The unit pixel of claim 1 , further comprising:
an overflow gate that is configured to prevent photocharges from overflowing from the photo diode into the storage diode;
a storage gate that is configured to transfer the photocharges accumulated at the photo diode to the storage diode; and
a transfer gate that is configured to transfer the photocharges stored in the storage diode to a floating diffusion.

4. The unit pixel of claim 3 , wherein the overflow gate, the storage gate, the transfer gate, and the floating diffusion are arranged in a line.

5. The unit pixel of claim 3 , wherein a voltage level of the floating diffusion is sensed by an adjacent unit pixel.

6. The unit pixel of claim 3 , wherein the overflow gate, the storage gate, and the transfer gate have a recess gate structure.

7. The unit pixel of claim 1 , further comprising a light shielding film which has an area corresponding to the storage diode area to block the incident light.

8. The unit pixel of claim 1 , further comprising a second deep trench isolation (DTI) between the photo diode and the storage diode to block the incident light.

9. The unit pixel of claim 1 , further comprising a first deep trench isolation (DTI) at an edge of the unit pixel that is configured to provide electrical and optical isolation between the unit pixel and an adjacent unit pixel.

10. The unit pixel of claim 1 , wherein the unit pixel shares a signal output circuit with an adjacent unit pixel, and
wherein the signal output circuit comprises:
a reset transistor that is configured to reset a floating diffusion to which the photocharges that have been accumulated in the photo diode are transferred;
a source follower that is configured to generate a current corresponding to a voltage level of the floating diffusion; and
a select transistor that is configured to output the current as a pixel signal.

11. An image sensor that operates in global shutter mode, the image sensor comprising:
a pixel array comprising a plurality of unit pixels, each of which outputs a pixel signal corresponding to incident light;
a readout circuit that is configured to perform analog-to-digital conversion on the pixel signal to generate a digital pixel signal; and
a timing generator that is configured to control the pixel array and the readout circuit,
wherein each of the unit pixels comprises:
a photo diode area comprising a photo diode that is covered by a micro lens and configured to accumulate photocharges generated from the incident light; and
a storage diode area adjoining the photo diode area and comprising a storage diode that is not covered by the micro lens and that is configured to receive and store the photocharges that have been accumulated in the photo diode.

12. The image sensor of claim 11 , wherein the micro lens is one of an array of micro lenses, wherein the storage diode area is offset from the photo diode area along a direction that is aslant with respect to either of a row direction and a column direction of the array of micro lenses.

13. The image sensor of claim 11 , wherein each of the unit pixels further comprises:
an overflow gate that is configured to prevent photocharges from overflowing from the photo diode into the storage diode;
a storage gate that is configured to transfer the photocharges accumulated at the photo diode to the storage diode; and
a transfer gate that is configured to transfer the photocharges stored in the storage diode to a floating diffusion.

14. The image sensor of claim 13 , wherein the overflow gate, the storage gate, the transfer gate, and the floating diffusion are arranged in a line.

15. An image sensor comprising:
a pixel array comprising a plurality of unit pixels, each of the unit pixels comprising:
a photo diode that is configured to accumulate photocharges generated from incident light;
a storage diode that is configured to receive and store the photocharges that have been accumulated in the photo diode; and
a floating diffusion that is configured to receive photocharges that are stored in the storage diode; and
a plurality of micro lenses arranged in rows and columns, respective ones of the micro lenses covering and focusing the incident light on respective ones of the photo diodes, with respective ones of the storage diodes being disposed at respective gaps between four adjacent ones of the micro lenses.

16. The image sensor of claim 15 , wherein each of the plurality of unit pixels comprises:
an overflow gate that is configured to prevent photocharges from overflowing from the photo diode into the storage diode;
a storage gate that is configured to transfer the photocharges accumulated at the photo diode to the storage diode; and
a transfer gate that is configured to transfer the photocharges stored in the storage diode to the floating diffusion.

17. The image sensor of claim 16 , wherein the overflow gate, the storage gate, the transfer gate, and the floating diffusion are arranged in a line.

18. The image sensor of claim 16 , wherein a voltage level of the floating diffusion is sensed by an adjacent one of the plurality of unit pixels.

19. The image sensor of claim 15 , wherein each of the plurality of unit pixels comprises:
a first deep trench isolation (DTI) at an edge of the unit pixel that is configured to provide electrical and optical isolation between the unit pixel and an adjacent one of the plurality of unit pixels; and
a second deep trench isolation (DTI) between the photo diode and the storage diode to block the incident light.

20. The image sensor of claim 15 , wherein ones of the plurality of unit pixels share a signal output circuit with adjacent ones of the plurality of unit pixels, and
wherein the signal output circuit comprises:
a reset transistor that is configured to reset a floating diffusion to which the photocharges that have been accumulated in the photo diode are transferred;
a source follower that is configured to generate a current corresponding to a voltage level of the floating diffusion; and
a select transistor that is configured to output the current as a pixel signal.

Assignees

• Samsung Electronics Co Ltd

Inventors

• Kim Young Chan
• Ahn Jung Chak
• Choi Hyuk Soon
• Lee Kyung Ho
• Lee Jun Suk
• Jung Young Woo

Classifications

• H04N25/771

  comprising storage means other than floating diffusion · CPC title

• H04N25/778

  comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself · CPC title

• H04N5/37457

  Electricity · mapped topic

• H01L27/14641

  Electricity · mapped topic

• H01L27/14623

  Electricity · mapped topic