Gamma-ray spectrometer calibration systems and methods

Patent metadata

Field	Value
Publication number	US-9964665-B2
Application number	US-201515026874-A
Country	US
Kind code	B2
Filing date	Mar 26, 2015
Priority date	Mar 26, 2015
Publication date	May 8, 2018
Grant date	May 8, 2018

Abstract

A gamma-ray spectrometer calibration system comprises a light guide, a photomultiplier tube, a laser, and analysis electronics. The light guide is optically coupled to the scintillation crystal, the laser and the photomultiplier tube, such that the laser can provide reference signals to the photomultiplier tube. In some embodiments, one or more temperature sensors are provided, such that the analysis electronics determine initial settings and adjust the initial settings based on the temperatures measured by the temperature sensors. Additional apparatus, methods, and systems are disclosed.

First claim

What is claimed is:

1. A method, comprising:
measuring, at a first sensor, a first temperature of a laser;
measuring, at a second sensor, a first temperature of a scintillation crystal associated with a gamma-ray spectrometer;
determining an initial current setting for the laser based on the first temperature of the laser and the first temperature of the scintillation crystal; and
applying the initial current to the laser.

2. The method of claim 1 , further comprising:
determining a voltage setting for a photomultiplier tube optically coupled to the laser, based on the first temperature of the scintillation crystal.

3. The method of claim 2 , wherein determining the voltage setting comprises selecting the voltage setting based on an empirical relationship between photomultiplier tube voltage and scintillation crystal temperature.

4. The method of claim 1 , further comprising:
generating, at the laser, a laser emission comprising one or more reference signals;
calculating gain of the gamma-ray spectrometer based on the one or more laser reference signals; and
determining an updated current setting for the laser based on the gain.

5. The method of claim 1 , further comprising:
generating, at the laser, a laser emission as one or more reference signals;
calculating a channel offset of the gamma-ray spectrometer based on the one or more reference signals; and
determining an updated voltage setting for a photomultiplier tube optically coupled to the laser based on the channel offset.

6. The method of claim 1 , further comprising:
measuring a second temperature of the laser; and
determining an updated current setting for the laser based on the second temperature of the laser.

7. The method of claim 1 , further comprising:
measuring a second temperature of the scintillation crystal; and
determining an updated current setting for the laser based on the second temperature of the scintillation crystal.

8. The method of claim 1 , further comprising:
controlling an initial gain setting of the gamma-ray spectrometer upon power-up of the gamma-ray spectrometer.

9. A system, comprising:
a scintillation crystal;
a light guide optically coupled to the scintillation crystal;
a photomultiplier tube coupled to the light guide;

a laser optically coupled to the light guide to provide reference signals to the photomultiplier tube; and
analysis electronics to determine a laser current setting, in conjunction with a gamma-ray spectrometer coupled to receive signals representing emissions from the scintillation crystal when the crystal is excited by gamma rays, based on a temperature of the laser.

10. The system of claim 9 , further comprising a sensor proximate to the laser, wherein the sensor is to measure the temperature of the laser.

11. The system of claim 9 , further comprising a sensor proximate to the scintillation crystal, wherein the sensor is to measure a temperature of the scintillation crystal.

12. The system of claim 11 , wherein the analysis electronics are to determine the laser current setting based on the temperature of the scintillation crystal.

13. The system of claim 11 , wherein the analysis electronics are to determine a voltage setting for the photomultiplier tube based on the temperature of the scintillation crystal.

14. A method, comprising:
measuring a first temperature of a gamma-ray spectrometer;
determining initial settings for the gamma-ray spectrometer based on the first temperature;
measuring a second temperature of the gamma-ray spectrometer; and
adjusting the initial settings for the gamma-ray spectrometer based on the second temperature to adjust a calibration of the gamma-ray spectrometer.

15. The method of claim 14 , wherein:
measuring the first temperature comprises measuring a temperature of a laser included in the gamma-ray spectrometer; and
determining initial settings for the gamma-ray spectrometer comprises determining an initial current setting for the laser.

16. The method of claim 15 , further comprising:
measuring a temperature of a scintillation crystal included in the system, wherein the initial current setting is determined based on the temperature of the scintillation crystal.

17. The method of claim 14 , wherein:
measuring the first temperature comprises measuring a temperature of a scintillation crystal included in the gamma-ray spectrometer; and
determining initial settings for the gamma-ray spectrometer comprises determining an initial voltage for the gamma-ray spectrometer.

18. The method of claim 14 , wherein:
measuring the second temperature comprises measuring a temperature of a laser included in the gamma-ray spectrometer and optically coupled to a photomultiplier tube; and
adjusting the initial settings for the gamma-ray spectrometer comprises determining an updated current setting for the laser.

19. The method of claim 18 , further comprising measuring a temperature of a scintillation crystal included in the gamma-ray spectrometer, wherein the updated current setting is determined based on the temperature of the scintillation crystal when the scintillation crystal is excited by gamma rays.

20. The method of claim 14 , wherein:
measuring the second temperature comprises measuring a temperature of a scintillation crystal included in the gamma-ray spectrometer; and
adjusting the initial settings for the gamma-ray spectrometer comprises determining an updated voltage for the gamma-ray spectrometer.

Assignees

• Halliburton Energy Services Inc

Inventors

• Galford James E
• Guo Weijun

Classifications

• G01V13/00 Primary

  Manufacturing, calibrating, cleaning, or repairing instruments or devices covered by groups G01V1/00 – G01V11/00 · CPC title

• G01T1/362

  with scintillation detectors · CPC title

• G01V5/08

  using primary nuclear radiation sources or X-rays {(, e.g. for inducing radioactivity; investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays, neutrons G01N23/00)} · CPC title

• G01T7/005

  calibration techniques (stabilization of spectrometer G01T1/40) · CPC title

• G01T1/1648

  Ancillary equipment for scintillation cameras, e.g. reference markers, devices for removing motion artifacts, calibration devices (adapted for flow studies G01T1/1647) · CPC title