Diagnostic system for a DC-DC voltage converter

Patent metadata

Field	Value
Publication number	US-9964599-B2
Application number	US-201615249376-A
Country	US
Kind code	B2
Filing date	Aug 27, 2016
Priority date	Jun 20, 2016
Publication date	May 8, 2018
Grant date	May 8, 2018

Abstract

A diagnostic system for a DC-DC voltage converter is provided. The diagnostic system includes a first temperature sensor generating a first output voltage indicating a temperature level of a high voltage bi-directional MOSFET switch. The diagnostic system includes a microcontroller that samples the first output voltage at a first sampling rate utilizing a first channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is greater than a first threshold voltage. The microcontroller sets a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the high voltage bi-directional MOSFET switch has an over-temperature condition.

First claim

What is claimed is:

1. A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a high voltage bi-directional MOSFET switch and a low voltage bi-directional MOSFET switch, comprising:
a first temperature sensor generating a first output voltage indicating a temperature level of the high voltage bi-directional MOSFET switch;
a second temperature sensor generating a second output voltage indicating a temperature level of the low voltage bi-directional MOSFET switch;
a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels; the first bank of channels including a first channel, the second bank of channels including a second channel;
the first channel being electrically coupled to the first temperature sensor for receiving the first output voltage;
the second channel being electrically coupled to the second temperature sensor for receiving the second output voltage;
the microcontroller being programmed to sample the first output voltage at a first sampling rate utilizing the first channel in the first bank of channels to obtain a first predetermined number of voltage samples;
the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is greater than a first threshold voltage;
the microcontroller being further programmed to set a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the high voltage bi-directional MOSFET switch has an over-temperature condition;
the microcontroller being further programmed to sample the second output voltage at the first sampling rate utilizing the second channel in the second bank of channels to obtain a second predetermined number of voltage samples;
the microcontroller being further programmed to determine a second number of voltage samples in the second predetermined number of voltage samples in which the second output voltage is greater than a second threshold voltage; and
the microcontroller being further programmed to set a second temperature diagnostic flag equal to a second first fault value if the second number of voltage samples is greater than the first threshold number of voltage samples indicating the low voltage bi-directional MOSFET switch has the over-temperature condition.

2. The diagnostic system of claim 1 , wherein:
the microcontroller being further programmed to stop generating first and second control signals to induce the high voltage bi-directional MOSFET switch and the low voltage bi-directional MOSFET switch, respectively, to each transition to an open operational state, if the first temperature diagnostic flag is equal to the first fault value, or the second temperature diagnostic flag is equal to the second fault value.

3. A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a high voltage bi-directional MOSFET switch and a low voltage bi-directional MOSFET switch, comprising:
a first temperature sensor generating a first output voltage indicating a temperature level of the high voltage bi-directional MOSFET switch;
a second temperature sensor generating a second output voltage indicating a temperature level of the low voltage bi-directional MOSFET switch;
a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels; the first bank of channels including a first channel, the second bank of channels including a second channel;
the first channel being electrically coupled to the first temperature sensor for receiving the first output voltage;
the second channel being electrically coupled to the second temperature sensor for receiving the second output voltage;
the microcontroller being programmed to sample the first output voltage at a first sampling rate utilizing the first channel in the first bank of channels to obtain a first predetermined number of voltage samples;
the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is equal to a first non-functional voltage;
the microcontroller being further programmed to set a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating that the analog-to-digital converter is malfunctioning;
the microcontroller being further programmed to sample the second output voltage at the first sampling rate utilizing the second channel in the second bank of channels to obtain a second predetermined number of voltage samples;
the microcontroller being further programmed to determine a second number of voltage samples in the second predetermined number of voltage samples in which the second output voltage is equal to a second non-functional voltage; and
the microcontroller being further programmed to set a second temperature diagnostic flag equal to a second first fault value if the second number of voltage samples is greater than the first threshold number of voltage samples indicating the analog-to-digital converter is malfunctioning.

4. The diagnostic system of claim 3 , wherein:
the microcontroller being further programmed to stop generating first and second control signals to induce the high voltage bi-directional MOSFET switch and the low voltage bi-directional MOSFET switch, respectively, to each transition to an open operational state, if the first temperature diagnostic flag is equal to the first fault value, or the second temperature diagnostic flag is equal to the second fault value.

5. A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having first and second MOSFET switches in a DC-DC converter control circuit, comprising:
a first temperature sensor generating a first output voltage indicating a temperature level of the first MOSFET switch;
a second temperature sensor generating a second output voltage indicating a temperature level of the second MOSFET switch;
a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels; the first bank of channels including a first channel, the second bank of channels including a second channel;
the first channel being electrically coupled to the first temperature sensor for receiving the first output voltage;
the second channel being electrically coupled to the second temperature sensor for receiving the second output voltage;
the microcontroller being programmed to sample the first output voltage at a first sampling rate utilizing the first channel in the first bank of channels to obtain a first predetermined number of voltage samples;
the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is greater than a first threshold voltage;
the microcontroller being further programmed to set a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the first MOSFET switch has an over-temperature condition;
the microcontroller being further programmed to sample the second output voltage at the first sampling rate utilizing the second channel in the second bank of channels to obtain a second predetermined number of voltage samples;
the microcontroller being further programmed to determine a second numbe

Assignees

• Lg Chemical Ltd

Inventors

• Katrak Kerfegar K
• Rexha Mehdi

Classifications

• G01R31/40 Primary

  Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title

• G01R31/2628

  for measuring thermal properties thereof · CPC title

• G01K13/00

  Thermometers specially adapted for specific purposes · CPC title

• G01R31/327

  Testing of circuit interrupters, switches or circuit-breakers · CPC title

• H02M3/156

  with automatic control of output voltage or current, e.g. switching regulators · CPC title