Method and apparatus for ICT fixture probe cleaning

Patent metadata

Field	Value
Publication number	US-9964563-B1
Application number	US-201514802565-A
Country	US
Kind code	B1
Filing date	Jul 17, 2015
Priority date	Jul 18, 2014
Publication date	May 8, 2018
Grant date	May 8, 2018

Abstract

A probe cleaning plate is configured to clean the probe plate of an ICT fixture. In particular, the probe cleaning plate is used to support a plurality of probes included as part of the probe plate and enable cleaning of the probe heads of each probe while maintaining support of the probes and minimizing, if not preventing, seepage of cleaning solution and contaminates from to the base of the probes.

First claim

What is claimed is:

1. A cleaning device for cleaning a probe head of each of a plurality of probes included as part of an in-circuit testing fixture, the in-circuit testing fixture includes a probe plate wherein a first end of each of the plurality of probes is mounted to the probe plate and a second end of each of the plurality of probes protrudes away from the probe plate, the second end comprising the probe head, wherein the cleaning device comprises:
a. a substrate comprising a first surface, a second surface opposite the first surface, a plurality of first through holes extending from the first surface to the second surface and one or more air input through holes extending from the first surface to the second surface, wherein the plurality of first through holes are aligned such that each first through hole receives a second end of a corresponding one of the plurality of probes and that the probe head of each probe protrudes from the first surface of the substrate; and
b. an air seal gasket coupled to the second surface of the substrate, wherein the air seal gasket forms a perimeter around the plurality of first through holes and the one or more air input through holes exposed at the second surface, wherein the cleaning device is mounted to the probe plate such that the air seal gasket is coupled to the probe plate thereby forming a hollow section between the probe plate and the second surface of the substrate and bounded by the air seal gasket such that air is directed into the hollow section via the one or more air input through holes air is directed out of the hollow section via the plurality of first through holes.

2. The cleaning device of claim 1 further comprising one or more air hoses, each air hose coupled to a corresponding one of the air input through holes.

3. The cleaning device of claim 2 further comprising an air compressor coupled to the one or more air hoses.

4. The cleaning device of claim 3 further comprising an air regulator coupled between the air compressor and the one or more air hoses.

5. The cleaning device of claim 2 wherein the one or more air hoses, the one or more air input through holes, the hollow section and the plurality of first through holes are configured to force air through the plurality of first through holes from the second surface toward the first surface.

6. The cleaning device of claim 5 wherein the air forced through the plurality of first through holes forces cleaning solvent applied to the probe heads away from the plurality of first through holes.

7. The cleaning device of claim 1 further comprising an dam coupled to the first surface of the substrate, wherein the dam forms a perimeter around the plurality of first through holes exposed at the first surface.

8. The cleaning device of claim 1 wherein the plurality of first through holes each comprise side walls, wherein the side walls taper from the second surface to the first surface such that a cross-section of each first through hole is larger at the second surface than at the first surface.

9. A cleaning device comprising:
a. a probe plate comprising a first substrate and a plurality of probes, wherein a first end of each of the plurality of probes is mounted to the first substrate and a second end of each of the plurality of probes protrudes away from the first substrate, further wherein the second end of each of the plurality of probes comprises a probe head;
a. a second substrate comprising a first surface, a second surface opposite the first surface, a plurality of first through holes extending from the first surface to the second surface and one or more air input through holes extending from the first surface to the second surface, wherein the plurality of first through holes are aligned such that each first through hole receives a second end of a corresponding one of the plurality of probes and that the probe head of each probe protrudes from the first surface of the second substrate; and
b. an air seal gasket coupled to the second surface of the second substrate, wherein the air seal gasket forms a perimeter around the plurality of first through holes and the one or more air input through holes exposed at the second surface, further wherein the air seal gasket is mounted to the probe plate such that the air seal gasket is coupled to the first substrate thereby forming a hollow section between the first substrate and the second surface of the second substrate and bounded by the air seal gasket such that air is directed into the hollow section via the one or more air input through holes air is directed out of the hollow section via the plurality of first through holes.

10. The cleaning device of claim 9 further comprising one or more air hoses, each air hose coupled to a corresponding one of the air input through holes.

11. The cleaning device of claim 10 further comprising an air compressor coupled to the one or more air hoses.

12. The cleaning device of claim 11 further comprising an air regulator coupled between the air compressor and the one or more air hoses.

13. The cleaning device of claim 10 wherein the one or more air hoses, the one or more air input through holes, the hollow section and the plurality of first through holes are configured to force air through the plurality of first through holes from the second surface toward the first surface.

14. The cleaning device of claim 13 wherein the air forced through the plurality of first through holes forces cleaning solvent applied to the probe heads away from the plurality of first through holes.

15. The cleaning device of claim 9 further comprising an dam coupled to the first surface of the substrate, wherein the dam forms a perimeter around the plurality of first through holes exposed at the first surface.

16. The cleaning device of claim 9 wherein the plurality of first through holes each comprise side walls, wherein the side walls taper from the second surface to the first surface such that a cross-section of each first through hole is larger at the second surface than at the first surface.

Assignees

• Flextronics Ap Llc

Inventors

• Gunasing David Durai Pandian Sam
• Min Teh Wee

Classifications

• G01R3/00 Primary

  Apparatus or processes specially adapted for the manufacture {or maintenance} of measuring instruments {, e.g. of probe tips} · CPC title

• B08B5/02 Primary

  Cleaning by the force of jets, e.g. blowing-out cavities {(airguns or nozzles per se B05B1/005)} · CPC title

• B08B1/10

  characterised by the type of cleaning tool · CPC title

• B08B3/04

  Cleaning involving contact with liquid · CPC title

• B08B11/02

  Devices for holding articles during cleaning {(B08B9/42 takes precedence)} · CPC title