Methods for monitoring strain and temperature in a hot gas path component

Patent metadata

Field	Value
Publication number	US-9964455-B2
Application number	US-201414504961-A
Country	US
Kind code	B2
Filing date	Oct 2, 2014
Priority date	Oct 2, 2014
Publication date	May 8, 2018
Grant date	May 8, 2018

Abstract

A method of monitoring a surface temperature of a hot gas path component includes directing an excitation beam having an excitation wavelength at a layer of a sensor material composition deposited on a hot gas path component to induce a fluorescent radiation. The method includes measuring fluorescent radiation emitted by the sensor material composition. The fluorescent radiation includes at least a first intensity at a first wavelength and a second intensity at a second wavelength. The surface temperature of the hot gas path component is determined based on a ratio of the first intensity at the first wavelength and the second intensity at the second wavelength of the fluorescent radiation emitted by the sensor material composition.

First claim

What is claimed is:

1. A method of monitoring a temperature and an amount of strain of a hot gas path component, said method comprising:
directing a first excitation beam at a first layer of a sensor material composition deposited on an outer surface of the hot gas path component;
measuring fluorescent radiation emitted by the sensor material composition in response to the first excitation beam, the fluorescent radiation including at least a first emission peak having a first baseline wavelength and a first baseline intensity, and a second emission peak having a second baseline wavelength and a second baseline intensity;
exposing the hot gas path component to a gas flow;
directing a second excitation beam at the first layer of the sensor material composition;
measuring fluorescent radiation emitted by the sensor material composition in response to the second excitation beam, wherein a first emission peak includes a first successive wavelength and a first successive intensity, and a second emission peak includes a second successive wavelength and a second successive intensity;
determining a surface temperature of the hot gas path component based on one or more of the first successive intensity and the second successive intensity; and
determining an amount of strain the in hot gas path component based on a difference between the first baseline wavelength and the first successive wavelength, and a difference between the second baseline wavelength and the second successive wavelength of the fluorescent radiation.

2. The method in accordance with claim 1 , wherein the sensor material composition comprises a combination of an alumina-based ceramic material and chromium oxide (Cr 2 O 3 ).

3. The method in accordance with claim 1 , wherein measuring fluorescent radiation comprises measuring fluorescent radiation using an optical detector including one or more of a photomultiplier tube, a photodiode, and a camera.

4. The method in accordance with claim 1 , wherein the sensor material composition includes comprises combination of aluminum oxide (Al 2 O 3 ) and chromium oxide (Cr 2 O 3 ).

5. The method in accordance with claim 4 , wherein aluminum oxide is present in a range between about 75% to about 99.9% by volume and chromium oxide is present in a range between about 0.1% and about 25% by volume.

6. The method in accordance with claim 1 further comprising producing at a point of impact of the first and second excitation beams a frequency down-conversion fluorescent radiation.

7. The method in accordance with claim 6 , wherein the first and second excitation beams have an excitation wavelength in the range between about 200 nanometers and about 400 nanometers.

8. The method in accordance with claim 1 , wherein directing the first or second excitation beams or both excitation beams comprises directing the first or second excitation beams or both excitation beams using one or more of a laser device and a broadband light source.

9. The method in accordance with claim 8 , wherein the broadband light source includes one or more of a xenon lamp, a light emitting diode (LED), or a halogen lamp (HL).

10. The method in accordance with claim 8 , wherein the laser device comprises one or more of a continuous-wave laser device and a pulsed laser device.

11. The method in accordance with claim 10 , wherein the pulsed laser device comprises one or more of a pulsed neodymium-doped yttrium aluminum garnet (Nd:YAG) excitation laser and a pulsed xenon fluoride (XeF) excimer laser.

12. The method in accordance with claim 1 , wherein directing the first and second excitation beams comprises directing the first and second excitation beams at the first layer of a sensor material composition deposited on an outer surface of the hot gas path component and a second layer of sensor material composition deposited on the first layer in a discontinuous pattern.

13. The method in accordance with claim 12 , wherein the first layer of sensor material composition includes a combination of a yttrium aluminum garnet (YAG)-based ceramic material and at least one rare earth element (REE).

14. The method in accordance with claim 13 , wherein the second layer of sensor material composition including a combination of an alumina-based ceramic material and chromium oxide (Cr 2 O 3 ).

15. The method in accordance with claim 13 , wherein the rare earth element is selected from the group consisting of scandium, yttrium, lanthanum, cerium, praseodymium, neodymium, promethium, samarium, europium, gadolinium, terbium, dysprosium, holmium, erbium, thulium, ytterbium, lutetium and mixtures thereof.

16. The method in accordance with claim 15 , wherein the rare earth element is terbium.

Assignees

• Gen Electric

Inventors

• Cheverton Mark Allen
• Setlur Anant Achyut
• Ostroverkhov Victor Petrovich
• Wang Guanghua
• Brewer James Anthony
• Venkataramani Venkat Subramaniam

Classifications

• G01K11/20

  using thermoluminescent materials (G01K11/32 takes precedence) · CPC title

• G01K1/143

  for measuring surface temperatures · CPC title

• G01L1/24 Primary

  by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis {using infrared, visible light, ultraviolet} · CPC title