3D semiconductor device and system

US9953870B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9953870-B2
Application numberUS-201715488514-A
CountryUS
Kind codeB2
Filing dateApr 16, 2017
Priority dateJun 28, 2011
Publication dateApr 24, 2018
Grant dateApr 24, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A 3D integrated circuit device, including: a first transistor; a second transistor; and a third transistor, where the third transistor is overlaying the second transistor and the third transistor is controlled by a third control line, where the second transistor is overlaying the first transistor and the second transistor is controlled by a second control line, where the first transistor is part of a control circuit controlling the second control line and the third control line, and where the second transistor and the third transistor are self-aligned.

First claim

Opening claim text (preview).

What is claimed is: 1. A 3D integrated circuit device, comprising: a first transistor; a second transistor; and a third transistor, wherein said third transistor is overlaying said second transistor and said third transistor is controlled by a third control line, wherein said second transistor is overlaying said first transistor and said second transistor is controlled by a second control line, wherein said first transistor is part of a control circuit controlling said second control line and said third control line, wherein said second transistor and said third transistor are self-aligned. 2. The device according to claim 1 , wherein said second transistor is aligned to said first transistor with less than 100 nm and greater than 5 nm misalignment. 3. The device according to claim 1 , further comprising: a third memory cell comprising said third transistor; a second memory cell comprising said second transistor; and memory periphery circuits comprising said first transistor, wherein said memory periphery circuits control at least said third memory cell and second memory cell. 4. The device according to claim 1 , wherein said second transistor is connected to said third transistor with an ohmic connection. 5. The device according to claim 1 , wherein said second transistor is a junction-less transistor. 6. The device according to claim 1 , wherein said second transistor comprises a schottky barrier. 7. The device according to claim 1 , wherein said second transistor comprises a second source and a second drain, wherein said third transistor comprises a third source and a third drain, wherein said second source is connected to said third source and said second drain is connected to said third drain, each with an ohmic connection. 8. A 3D integrated circuit device, comprising: a first transistor; a second transistor; and a third transistor, wherein said third transistor is overlaying said second transistor and said third transistor is controlled by a third control line, wherein said second transistor is overlaying said first transistor and said second transistor is controlled by a second control line, wherein said second transistor comprises a schottky barrier, and wherein said second transistor and said third transistor are self-aligned. 9. The device according to claim 8 , wherein said second transistor is aligned to said first transistor with less than 100 nm and greater than 5 nm misalignment. 10. The device according to claim 8 , further comprising: a third memory cell comprising said third transistor; a second memory cell comprising said second transistor; and memory periphery circuits comprising said first transistor, wherein said memory periphery circuits control at least said third memory cell and second memory cell. 11. The device according to claim 8 , wherein said second transistor is connected to said third transistor with an ohmic connection. 12. The device according to claim 8 , wherein said second transistor is a junction-less transistor. 13. The device according to claim 8 , wherein said first transistor is part of a control circuit controlling said second control line and said third control line. 14. The device according to claim 8 , wherein said second transistor comprises a second source and a second drain, wherein said third transistor comprises a third source and a third drain, wherein said second source is connected to said third source and said second drain is connected to said third drain, each with an ohmic connection. 15. A 3D integrated circuit device, comprising: a first transistor; a first memory cell comprising a second transistor; and a second memory cell comprising a third transistor, wherein said third transistor is overlaying said second transistor and said second transistor is overlaying said first transistor, wherein said first transistor is part of a control circuit controlling said first memory cell and second memory cell, wherein said second transistor is self-aligned to said third transistor, and wherein said second transistor is connected to said third transistor with an ohmic connection. 16. The device according to claim 15 , wherein said first transistor, said second transistor and said third transistor are aligned to each other with less than 100 nm and greater than 5 nm misalignment. 17. The device according to claim 15 , further comprising: memory periphery circuits comprising said first transistor, wherein said memory periphery circuits control at least said first memory cell and second memory cell. 18. The device according to claim 15 , wherein said second transistor is a junction-less transistor. 19. The device according to claim 15 , wherein said second transistor comprises a schottky barrier. 20. The device according to claim 15 , wherein said second transistor comprises a second source and a second drain, wherein said third transistor comprises a third source and a third drain, wherein said second source is connected to said third source and said second drain is connected to said third drain, each with an ohmic connection.

Assignees

Inventors

Classifications

  • Die-attach connectors and bond wires · CPC title

  • on active surfaces of flip-chip devices, e.g. underfills · CPC title

  • Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic · CPC title

  • comprising cells having several storage transistors connected in series · CPC title

  • comprising cells containing floating gate transistors (G11C16/0483, G11C16/0491 take precedence) · CPC title

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What does patent US9953870B2 cover?
A 3D integrated circuit device, including: a first transistor; a second transistor; and a third transistor, where the third transistor is overlaying the second transistor and the third transistor is controlled by a third control line, where the second transistor is overlaying the first transistor and the second transistor is controlled by a second control line, where the first transistor is par…
Who is the assignee on this patent?
Monolithic 3D Inc
What technology area does this patent fall under?
Primary CPC classification H10D84/01. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 24 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).