Unusable column mapping in flash memory devices

Patent metadata

Field	Value
Publication number	US-9952775-B2
Application number	US-201715599059-A
Country	US
Kind code	B2
Filing date	May 18, 2017
Priority date	Aug 11, 2016
Publication date	Apr 24, 2018
Grant date	Apr 24, 2018

Abstract

A memory device for generating a mapping between one or more unusable columns and one or more backup columns within a memory. The memory includes a plurality of memory cells for storing data. The memory also includes a plurality of columns including a first subset of the plurality of memory cells. Each of the plurality of columns belongs to one of a plurality of data chunks. The memory further includes one or more backup columns including a second subset of the plurality of memory cells. The memory device also includes a controller communicatively coupled to the memory and configured to perform operations including identifying unusable columns, detecting a condition associated with each data chunk, and generating a mapping between the backup columns and the unusable columns based on the condition such that each of the backup columns is mapped to a different unusable column.

First claim

What is claimed is:

1. A memory device comprising:
a memory including:
a plurality of memory cells for storing data;
a plurality of columns including a first subset of the plurality of memory cells, wherein each of the plurality of columns belongs to one of a plurality of data chunks; and
one or more backup columns including a second subset of the plurality of memory cells; and

a controller communicatively coupled to the memory and configured to perform operations including:
identifying one or more unusable columns of the plurality of columns;
detecting a condition associated with each individual data chunk of the plurality of data chunks; and
generating a mapping between the one or more backup columns and the one or more unusable columns based on the condition such that each of the one or more backup columns is mapped to a different unusable column.

2. The memory device of claim 1 , wherein detecting the condition associated with each individual data chunk of the plurality of data chunks includes:
determining a number of unusable columns that belong to each individual data chunk; and
determining whether the number of unusable columns that belong to each individual data chunk exceeds a threshold.

3. The memory device of claim 2 , wherein the threshold is proportional to a number of bit errors that can be tolerated in each individual data chunk using an error correction scheme.

4. The memory device of claim 2 , wherein the mapping is based on determining whether the number of unusable columns that belong to each individual data chunk exceeds the threshold such that, a particular unusable column is mapped to a particular backup column only if the number of unusable columns that belong to a particular data chunk to which the particular column belongs exceeds the threshold.

5. The memory device of claim 2 , wherein the mapping is based on determining whether the number of unusable columns that belong to each individual data chunk exceeds the threshold such that, for each individual data chunk, the number of unusable columns that belong to the individual data chunk minus a number of backup columns that are mapped to the unusable columns that belong to the individual data chunk is less than the threshold.

6. The memory device of claim 1 , wherein the operations further include:
modifying the plurality of data chunks such that at least one of the plurality of columns changes with respect to which data chunk it belongs.

7. The memory device of claim 6 , wherein the operations further include:
modifying the mapping such that at least one of the one or more unusable columns changes with respect to which backup column it is mapped to.

8. The memory device of claim 1 , wherein a particular backup column is mapped to a particular unusable column such that the particular backup column is used for storing data instead of the particular unusable column.

9. The memory device of claim 1 , wherein the error correction scheme is error correcting coding (ECC).

10. A method for generating a mapping between one or more unusable columns and one or more backup columns within a memory, the method comprising:
identifying the one or more unusable columns of a plurality of columns;
detecting a condition associated with each individual data chunk of a plurality of data chunks; and
generating the mapping between the one or more backup columns and the one or more unusable columns based on the condition such that each of the one or more backup columns is mapped to a different unusable column;
wherein the memory includes:
a plurality of memory cells for storing data;
the plurality of columns including a first subset of the plurality of memory cells, wherein each of the plurality of columns belongs to one of the plurality of data chunks; and
the one or more backup columns including a second subset of the plurality of memory cells.

11. The method of claim 10 , wherein detecting the condition associated with each individual data chunk of the plurality of data chunks includes:
determining a number of unusable columns that belong to each individual data chunk; and
determining whether the number of unusable columns that belong to each individual data chunk exceeds a threshold.

12. The method of claim 11 , wherein the threshold is proportional to a number of bit errors that can be tolerated in each individual data chunk using an error correction scheme.

13. The method of claim 11 , wherein the mapping is based on determining whether the number of unusable columns that belong to each individual data chunk exceeds the threshold such that, a particular unusable column is mapped to a particular backup column only if the number of unusable columns that belong to a particular data chunk to which the particular column belongs exceeds the threshold.

14. The method of claim 11 , wherein the mapping is based on determining whether the number of unusable columns that belong to each individual data chunk exceeds the threshold such that, for each individual data chunk, the number of unusable columns that belong to the individual data chunk minus a number of backup columns that are mapped to the unusable columns that belong to the individual data chunk is less than the threshold.

15. The method of claim 10 , further comprising:
modifying the plurality of data chunks such that at least one of the plurality of columns changes with respect to which data chunk it belongs.

16. The method of claim 15 , further comprising:
modifying the mapping such that at least one of the one or more unusable columns changes with respect to which backup column it is mapped to.

17. The method of claim 10 , wherein a particular backup column is mapped to a particular unusable column such that the particular backup column is used for storing data instead of the particular unusable column.

18. The method of claim 10 , wherein the error correction scheme is error correcting coding (ECC).

19. A controller communicatively coupled to a memory, the controller configured to perform operations comprising:
identifying one or more unusable columns of a plurality of columns;
detecting a condition associated with each individual data chunk of a plurality of data chunks; and
generating a mapping between one or more backup columns and the one or more unusable columns based on the condition such that each of the one or more backup columns is mapped to a different unusable column;
wherein the memory includes:
a plurality of memory cells for storing data;
the plurality of columns including a first subset of the plurality of memory cells, wherein each of the plurality of columns belongs to one of the plurality of data chunks; and
the one or more backup columns including a second subset of the plurality of memory cells.

20. The controller of claim 19 , wherein detecting the condition associated with each individual data chunk of the plurality of data chunks includes:
determining a number of unusable columns that belong to each individual data chunk; and
determining whether the number of unusable columns that belong to each individual data chunk exceeds a threshold.

Assignees

• Sk Hynix Inc

Inventors

• Cai Yu
• Zhang Fan
• Xiong Chenrong
• Lee June
• Sim Jaesung
• Kim Hyungseok

Classifications

• G06F3/0619

  in relation to data integrity, e.g. data losses, bit errors · CPC title

• G06F3/067

  Distributed or networked storage systems, e.g. storage area networks [SAN], network attached storage [NAS] · CPC title

• G06F3/065

  Replication mechanisms · CPC title

• G06F3/061 Primary

  Improving I/O performance · CPC title

• G06F3/0688

  Non-volatile semiconductor memory arrays · CPC title