Spectrometry device and spectrometry method

Patent metadata

Field	Value
Publication number	US-9952101-B2
Application number	US-201515531772-A
Country	US
Kind code	B2
Filing date	Nov 19, 2015
Priority date	Dec 2, 2014
Publication date	Apr 24, 2018
Grant date	Apr 24, 2018

Abstract

A spectroscopic measurement apparatus includes a light source, an integrator, a first spectroscopic detector, a second spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, and a sample attachment portion for attaching the measurement object. The first spectroscopic detector receives the light output from the integrator, disperses the light of a first wavelength region, and acquires first spectrum data. The second spectroscopic detector receives the light output from the integrator, disperses the light of a second wavelength region, and acquires second spectrum data. The first wavelength region and the second wavelength region include a wavelength region partially overlapping each other.

First claim

The invention claimed is:

1. A spectroscopic measurement apparatus comprising:
an integrator including an internal space in which a measurement object is disposed, a light input portion configured to input light from outside to the internal space, and a light output portion configured to output light from the internal space to the outside;
a first spectroscopic detector configured to disperse light of a first wavelength region in the light output from the light output portion and acquire first spectrum data for a first exposure time;
a second spectroscopic detector configured to disperse light of a second wavelength region partially overlapping with the first wavelength region in the light output from the light output portion and acquire second spectrum data for a second exposure time; and
an analysis unit configured to analyze the first spectrum data and the second spectrum data on the basis of the first exposure time and the second exposure time.

2. The spectroscopic measurement apparatus according to claim 1 , wherein the analysis unit is configured to store a correction value calculated based on the first spectrum data and the second spectrum data in a common wavelength region which is a wavelength region in which the first wavelength region and the second wavelength region overlap.

3. The spectroscopic measurement apparatus according to claim 2 , wherein the analysis unit is configured to obtain the number of photons in the common wavelength region on the basis of the first spectrum data, obtain the number of photons in the common wavelength region on the basis of the second spectrum data, and calculate the correction value on the basis of these numbers of photons.

4. The spectroscopic measurement apparatus according to claim 2 , wherein the analysis unit is configured to obtain an intensity integrated value in the common wavelength region on the basis of the first spectrum data, obtain an intensity integrated value in the common wavelength region on the basis of the second spectrum data, and calculate the correction value on the basis of these intensity integrated values.

5. The spectroscopic measurement apparatus according to claim 2 , wherein the analysis unit is configured to correct at least one of the first spectrum data and the second spectrum data on the basis of the correction value, the first exposure time, and the second exposure time and obtain a spectrum in an entire wavelength region including both the first wavelength region and the second wavelength region.

6. The spectroscopic measurement apparatus according to claim 2 , wherein
when excitation light is input from the light input portion of the integrator to the internal space in a state where a measurement object which emits emission light by incidence of the excitation light is not disposed in the internal space, the analysis unit obtains the number of photons in an excitation light wavelength region on the basis of the first spectrum data and obtains the number of photons in an emission light wavelength region on the basis of the second spectrum data;
when the excitation light is input from the light input portion of the integrator to the internal space in a state where the measurement object is disposed in the internal space, the analysis unit obtains the number of photons in the excitation light wavelength region on the basis of the first spectrum data and obtains the number of photons in the emission light wavelength region on the basis of the second spectrum data; and
based on these numbers of photons, the correction value, and the first exposure time and the second exposure time, the analysis unit evaluates luminous efficiency of the measurement object.

7. The spectroscopic measurement apparatus according to claim 1 , wherein the second wavelength region is on a long-wavelength side compared to the first wavelength region, and the second exposure time is longer than the first exposure time.

8. A spectroscopic measurement method for performing spectroscopic measurement using an integrator including an internal space in which a measurement object is disposed, a light input portion configured to input light from outside to the internal space, and a light output portion configured to output light from the internal space to the outside, the method comprising:
inputting light from the light input portion of the integrator to the internal space;
dispersing light of a first wavelength region in the light output from the light output portion and acquiring first spectrum data for a first exposure time by a first spectroscopic detector;
dispersing light of a second wavelength region partially overlapping with the first wavelength region in the light output from the light output portion and acquiring second spectrum data for a second exposure time by a second spectroscopic detector; and
analyzing the first spectrum data and the second spectrum data on the basis of the first exposure time and the second exposure time by an analysis unit.

9. The spectroscopic measurement method according to claim 8 , wherein, by the analysis unit, a correction value calculated based on the first spectrum data and the second spectrum data in a common wavelength region which is a wavelength region in which the first wavelength region and the second wavelength region overlap is stored.

10. The spectroscopic measurement method according to claim 9 , wherein, by the analysis unit, the number of photons in the common wavelength region is obtained on the basis of the first spectrum data, the number of photons in the common wavelength region is obtained on the basis of the second spectrum data, and the correction value is calculated on the basis of these numbers of photons.

11. The spectroscopic measurement method according to claim 9 , wherein, by the analysis unit, an intensity integrated value in the common wavelength region is obtained on the basis of the first spectrum data, an intensity integrated value in the common wavelength region is obtained on the basis of the second spectrum data, and the correction value is calculated on the basis of these intensity integrated values.

12. The spectroscopic measurement method according to claim 9 , wherein, by the analysis unit, at least one of the first spectrum data and the second spectrum data is corrected on the basis of the correction value, the first exposure time, and the second exposure time and a spectrum in an entire wavelength region including both the first wavelength region and the second wavelength region is obtained.

13. The spectroscopic measurement method according to claim 9 , wherein
when excitation light is input from the light input portion of the integrator to the internal space in a state where a measurement object which emits emission light by incidence of the excitation light is not disposed in the internal space, by the analysis unit, the number of photons in an excitation light wavelength region is obtained on the basis of the first spectrum data and the number of photons in an emission light wavelength region is obtained on the basis of the second spectrum data;
when the excitation light is input from the light input portion of the integrator to the internal space in a state where the measurement object is disposed in the internal space, by the analysis unit, the number of photons in the excitation light wavelength region is obtained on the basis of the first spectrum data and the number of photons in the emission light wavelength region is obtained on the basis of the second spectrum data; and
based on these numbers of photons, the correction value, and the first exposure time and the second exposure time, by the analysis unit, luminous effici

Assignees

• Hamamatsu Photonics Kk

Inventors

• Suzuki Kengo
• Iguchi Kazuya

Classifications

• G01J3/36 Primary

  Investigating two or more bands of a spectrum by separate detectors · CPC title

• G01N21/64

  Fluorescence; Phosphorescence · CPC title

• G01J3/28

  Investigating the spectrum (using colour filters G01J3/51) · CPC title

• G01J3/0254

  Spectrometers, other than colorimeters, making use of an integrating sphere · CPC title

• G01N2021/6484

  Optical fibres · CPC title