Method for preparing structured graphene on SiC substrate based on Cl2 reaction

US9951418B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9951418-B2
Application numberUS-201214397633-A
CountryUS
Kind codeB2
Filing dateDec 31, 2012
Priority dateMay 23, 2012
Publication dateApr 24, 2018
Grant dateApr 24, 2018

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Abstract

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Disclosed is a method for preparing structured graphene on a SiC substrate on the basis of Cl 2 reaction, the procedures are as follows: firstly, performing standard cleaning to a SiC sample chip; depositing a layer of SiO 2 on the surface of the SiC sample chip and engraving a figure window on the SiO 2 layer; then arranging the windowed sample chip in a quartz tube, introducing a mixed gas of Ar and Cl 2 into the quartz tube, reacting the bare SiC with Cl 2 for 3-8 min at 700-1100° C. to generate a carbon film; arranging the generated carbon film in Ar gas, annealing for 10-30 min at 1000-1200° C. to generate the structured graphene on the window on the carbon film. The method is simple and safe; the generated structured graphene has a smooth surface and low porosity and can be used for making microelectronic devices.

First claim

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What is claimed is: 1. A method for preparing structured graphene on SiC substrate based on Cl 2 reaction, characterized in that said process comprises the following steps: (1) performing cleaning to a SiC sample chip to remove contaminants on its surface; (2) depositing a layer of SiO 2 with a thickness of 0.4-1.2 μm as a mask on the surface of the cleaned SiC sample chip by a Plasma Enhanced Chemical Vapor Deposition (PECVD) method; (3) coating a layer of photoresist on the surface of the mask; photo-engraving a figure window on the mask in accordance with the shape of an expected device substrate to expose the SiC and form a structured pattern; (4) placing the windowed sample chip in a quartz tube, heating the windowed sample chip to 700-1100° C. for 3-8 minutes as a mixed gas of Ar and Cl 2 is flowed into the quartz tube, and Cl 2 is reacted with the bare SiC to generate a carbon film; (5) arranging the generated carbon film in Ar gas, annealing for 10-30 min under a temperature of 1000-1200° C., wherein the carbon film on the window is reconfigured to graphene so as to obtain a structured graphene. 2. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 1 , characterized in that said step (1) performing cleaning to a SiC sample chip is, firstly the SiC sample chip is soaked for 10-30 minutes by using reagent NH 4 OH+H 2 O 2 , then taken out and dried to remove the organic residue on the sample surface, and then the sample is soaked in reagent HCl+H 2 O 2 for 10-30 minutes, then taken out and dried to remove ionic contaminant. 3. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 1 , characterized in that in said step (2), the condition of depositing SiO 2 by PECVD method is, the flow rate of SiH 4 , N 2 O and N 2 is respectively 30 sccm, 60 sccm and 200 sccm, the pressure of a reaction chamber is 3.0 Pa, RF power is 100 W, the deposition temperature is 150° C. and the deposition time is 20-100 minutes. 4. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 1 , characterized in that in said step (2), the condition of depositing SiO 2 by PECVD method is, the flow rate of SiH 4 , N 2 O and N 2 is respectively 8-45 sccm, 35-450 sccm and 150-565 sccm, the pressure of a reaction chamber is 2-10 Pa, RF power is 30-220 W, the deposition temperature is 100-300° C. and the deposition time is 20-100 minutes. 5. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 4 , characterized in that in step (4), the flow rate of the flowed Ar and Cl 2 is respectively 95-98 sccm and 2-5 sccm. 6. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 5 , characterized in that in step (5), the flow rate of Ar when annealing is 25-100 sccm. 7. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 6 , characterized in that the SiC sample chip has a crystal type of 4H—SiC or 6H—SiC. 8. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 5 , characterized in that the SiC sample chip has a crystal type of 4H—SiC or 6H—SiC. 9. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 4 , characterized in that in step (5), the flow rate of Ar when annealing is 25-100 sccm. 10. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 4 , characterized in that the SiC sample chip has a crystal type of 4H—SiC or 6H—SiC. 11. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 1 , characterized in that in step (4), the flow rate of the flowed Ar and Cl 2 is respectively 95-98 sccm and 2-5 sccm. 12. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 11 , characterized in that in step (5), the flow rate of Ar when annealing is 25-100 sccm. 13. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 1 , characterized in that in step (5), the flow rate of Ar when annealing is 25-100 sccm. 14. The method for preparing structured graphene on SiC substrate based on Cl 2 reaction according to claim 1 , characterized in that the SiC sample chip has a crystal type of 4H—SiC or 6H—SiC.

Assignees

Inventors

Classifications

  • C01B32/186Primary

    by chemical vapour deposition [CVD] · CPC title

  • by epitaxial growth · CPC title

  • C23C16/26Primary

    Deposition of carbon only · CPC title

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What does patent US9951418B2 cover?
Disclosed is a method for preparing structured graphene on a SiC substrate on the basis of Cl 2 reaction, the procedures are as follows: firstly, performing standard cleaning to a SiC sample chip; depositing a layer of SiO 2 on the surface of the SiC sample chip and engraving a figure window on the SiO 2 layer; then arranging the windowed sample chip in a quartz tube, introducing a mixed gas…
Who is the assignee on this patent?
Univ Xidian
What technology area does this patent fall under?
Primary CPC classification C01B32/186. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Apr 24 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).