PZT-film laminated structure, liquid discharge head, liquid discharge device, liquid discharge apparatus, and method of making PZT-film laminated structure

Patent metadata

Field	Value
Publication number	US-9950524-B2
Application number	US-201615389731-A
Country	US
Kind code	B2
Filing date	Dec 23, 2016
Priority date	Jan 7, 2016
Publication date	Apr 24, 2018
Grant date	Apr 24, 2018

Abstract

A PZT-film laminated structure includes a substrate, a lower electrode on the substrate, an orientation control layer on the lower electrode, a PZT layer on the orientation control layer, and an upper electrode on the PZT layer. The PZT layer has a (100) or (001) main orientation in which a peak intensity of PZT (100) or (001) is 90% or greater relative to a peak intensity of all PZT peaks in an X-ray diffraction measurement. A ratio of a total value of a secondary ion intensity of Cl relative to a total value of a secondary ion intensity of Ti in the PZT layer is equal to or smaller than 0.03 when the secondary ion intensity of Cl and the secondary ion intensity of Ti in the PZT layer are measured in a direction of thickness of the PZT layer with a magnetic-field secondary ion mass spectrometry.

First claim

What is claimed is:

1. A PZT-film laminated structure, comprising:
a substrate;
a lower electrode disposed on the substrate;
an orientation control layer disposed on the lower electrode;
a PZT layer disposed on the orientation control layer; and
an upper electrode disposed on the PZT layer,
the PZT layer having a (100) or (001) main orientation in which a peak intensity of PZT (100) or (001) is 90% or greater relative to a peak intensity of all PZT peaks in an X-ray diffraction measurement, and
a ratio of a total value of a secondary ion intensity of Cl relative to a total value of a secondary ion intensity of Ti in the PZT layer being equal to or smaller than 0.03 when the secondary ion intensity of Cl and the secondary ion intensity of Ti in the PZT layer are measured in a direction of thickness of the PZT layer with a magnetic-field secondary ion mass spectrometry.

2. The PZT-film laminated structure according to claim 1 ,
wherein the orientation control layer includes titanium oxide or lead titanate.

3. A liquid discharge head comprising:
a nozzle substrate having a nozzle orifice to discharge liquid;
a channel forming substrate including a pressurization chamber communicated with the nozzle orifice;
a diaphragm plate constituting at least one wall of the pressurization chamber; and
a piezoelectric thin-film element including the PZT-film laminated structure according to claim 1 disposed on the diaphragm plate.

4. A liquid discharge device comprising the liquid discharge head according to claim 3 .

5. The liquid discharge device according to claim 4 ,
wherein the liquid discharge head is integrated as a single unit with at least one of:
a head tank to store liquid to be supplied to the liquid discharge head;
a carriage mounting the liquid discharge head;
a supply unit to supply the liquid to the liquid discharge head;
a maintenance unit to maintain and recover the liquid discharge head; and
a main scan moving unit to move the liquid discharge head in a main scanning direction.

6. A liquid discharge apparatus comprising the liquid discharge device according to claim 4 , to discharge the liquid.

7. A liquid discharge apparatus comprising the liquid discharge head according to claim 3 , to discharge the liquid.

Assignees

• Shinkai Masaru
• Akiyama Yoshikazu
• Mizukami Satoshi
• Ricoh Co Ltd

Inventors

• Shinkai Masaru
• Akiyama Yoshikazu
• Mizukami Satoshi

Classifications

• B41J2202/03

  Specific materials used · CPC title

• B41J2/14233 Primary

  of film type, deformed by bending and disposed on a diaphragm · CPC title

• B41J2002/14241

  having a cover around the piezoelectric thin film element · CPC title