Image adjustment based on locally flat scenes

Patent metadata

Field	Value
Publication number	US-9947086-B2
Application number	US-201514956111-A
Country	US
Kind code	B2
Filing date	Dec 1, 2015
Priority date	Dec 2, 2014
Publication date	Apr 17, 2018
Grant date	Apr 17, 2018

Abstract

Imaging systems and methods are disclosed that use locally flat scenes to adjust image data. An imaging system includes an array of photodetectors configured to produce an array of intensity values corresponding to light intensity at the photodetectors. The imaging system can be configured to acquire a frame of intensity values, or an image frame, and analyze the image frame to determine if it is locally flat. If the image frame is locally flat, then that image data can be used to determine gradients present in the image frame. An offset mask can be determined from the image data and that offset mask can be used to adjust subsequently acquired image frames to reduce or remove gradients.

First claim

What is claimed is:

1. A method for adjusting an image using one or more images of locally flat scenes acquired with an imaging system comprising an imaging sensor with an array of photodetectors, the method comprising:
acquiring image data with the array of photodetectors, the image data comprising an array of pixel intensity values;
dividing at least a portion of the image data into a plurality of kernels;
determining local contrast values for individual kernels, a local contrast value of an individual kernel based at least in part on pixel values within the individual kernel;
determining that the image frame is a locally flat image if the local contrast values for at least a predetermined number of the individual kernels are less than or equal to a contrast threshold; and
in response to determining that the image frame is a locally flat image:
calculating an array of pixel adjustment values to generate an offset mask configured to adjust the pixel intensity values of the image data; and
adjusting pixel intensity values of subsequently acquired image data using the offset mask.

2. The method of claim 1 further comprising dividing individual kernels into a plurality of sub-kernels.

3. The method of claim 2 , wherein determining a local contrast value for an individual kernel comprises:
determining an average or median of pixel intensity values within each sub-kernel of the individual kernel; and
calculating a difference between a maximum sub-kernel average or median and a minimum sub-kernel average or median.

4. The method of claim 3 , wherein a pixel adjustment value in the array of pixel adjustment values of the offset mask corresponds to an average or median of the pixel intensity values within an individual kernel.

5. The method of claim 3 , wherein a pixel adjustment value in the array of pixel adjustment values of the offset mask corresponds to an average or median of the pixel intensity values within an individual kernel, the average or median being adjusted using a bi-linear interpolation between adjacent kernels.

6. The method of claim 2 , wherein individual kernels are 16 by 16 pixels and individual sub-kernels are 4 by 4 pixels.

7. The method of claim 1 , wherein individual kernels are 16 by 16pixels.

8. The method of claim 1 , wherein the imaging sensor comprises an infrared focal plane array.

9. The method of claim 8 , wherein the contrast threshold is configured to correspond to a temperature difference of less than or equal to 1 degree Celsius.

10. The method of claim 1 , wherein the offset mask is generated if the local contrast values for at least 90% of the plurality of kernels are less than or equal to a contrast threshold.

11. The method of claim 10 , wherein the offset mask is generated if the local contrast values for all of the plurality of kernels are less than or equal to a contrast threshold.

12. The method of claim 1 , wherein adjusting pixel intensity values using the offset mask comprises subtracting pixel adjustment values from corresponding pixel intensity values.

13. The method of claim 1 further comprising determining an offset mask offset comprising an average or median value of a kernel located near a center of the imaging array.

14. The method of claim 1 , wherein the pixel intensity values of the subsequently acquired image data are adjusted in response to determining that the local contrast values for individual kernels of the subsequently acquired image data are greater than a contrast threshold.

15. A thermal imaging system comprising:
an imaging array comprising an infrared focal plane array, the infrared focal plane array configured to generate signals corresponding to levels of infrared light incident on the infrared focal plane array;
a detector circuit comprising readout electronics that receive the generated signals and output image data comprising an array of pixel intensity values; and
a system controller configured to:
divide at least a portion of the image data into a plurality of kernels;
determine local contrast values for individual kernels, a local contrast value of an individual kernel based at least in part on pixel intensity values within the individual kernel;
determine that the image frame is a locally flat image if the local contrast values for at least a predetermined number of the individual kernels are less than or equal to a contrast threshold; and
in response to determining that the image frame is a locally flat image:
calculate an array of pixel adjustment values to generate an offset mask; and
adjust pixel intensity values of subsequently acquired image data using the offset mask.

16. The thermal imaging system of claim 15 , wherein the system controller is further configured to divide individual kernels into sub-kernels and to determine an average or median value of pixel intensities within each sub-kernel.

17. The thermal imaging system of claim 16 , wherein a local contrast value for an individual kernel comprises a difference between a maximum average or median value of a sub-kernel and a minimum average or median value of a sub-kernel within the individual kernel.

18. The thermal imaging system of claim 15 , wherein the contrast threshold corresponds to a temperature of less than or equal to about 1 degree Celsius.

19. The thermal imaging system of claim 15 , wherein the system controller is further configured to determine an offset mask offset comprising an average or median value of a kernel located near a center of the imaging array.

20. The thermal imaging system of claim 15 , wherein the pixel intensity values of the subsequently acquired image data are adjusted in response to determining that the local contrast values for individual kernels of the subsequently acquired image data are greater than a contrast threshold.

Assignees

• Seek Thermal Inc

Inventors

• Lee Jeffrey
• Parrish William J
• Engberg Andreas
• Williams Ross

Classifications

• G06T2207/20021

  Dividing image into blocks, subimages or windows · CPC title

• G06T2207/10048

  Infrared image · CPC title

• H04N25/674

  based on the scene itself, e.g. defocusing · CPC title

• G06T5/20

  using local operators · CPC title

• G06T5/40 Primary

  using histogram techniques · CPC title