Measuring and correcting non-idealities of a system

Patent metadata

Field	Value
Publication number	US-9945901-B1
Application number	US-201615296251-A
Country	US
Kind code	B1
Filing date	Oct 18, 2016
Priority date	Oct 18, 2016
Publication date	Apr 17, 2018
Grant date	Apr 17, 2018

Abstract

Many systems implement calibration schemes to measure and correct for the non-idealities. Such systems can be complex, which makes them impractical to implement since the cost can potentially outweigh the benefits of the calibration scheme. To implement efficient and effective calibration, non-idealities or errors of a system are detected, in foreground or in background, in a piecewise fashion based on, e.g., correlations of an output signal with an uncorrelated random signal, where the correlation results are processed separately for different open intervals of an error signal. Second order and third order correction terms can be easily determined based on three open intervals. In various embodiments, the calibration scheme can detect and correct for linear errors, (linear and non-linear) memory/frequency dependent errors, static nonlinearity errors, Hammerstein-style non-linearity errors, and Wiener-style non-linearity errors (cross-terms).

First claim

What is claimed is:

1. A method for determining correction terms of a system, the method comprising:
removing a pseudo-random signal injected in the system to obtain an error signal;
performing correlations of the error signal with the pseudo-random signal; and
updating correction terms based on the correlations accumulated based on different open intervals of the error signal.

2. The method of claim 1 , wherein the pseudo-random signal is a 1-bit pseudo-random signal.

3. The method of claim 1 , wherein the different intervals comprises: an interval including all samples, and an interval including samples whose absolute value is above a first predetermined threshold value.

4. The method of claim 1 , wherein updating the correction terms based on the correlations comprises:
updating the correction terms based on (1) correlations associated with an interval including all samples, and (2) correlations associated with an interval including samples whose absolute value is above a first predetermined threshold value.

5. The method of claim 1 , wherein the different intervals comprise: an interval including all samples, an interval including samples whose values are above a first predetermined threshold value, and an interval including samples whose values are below a second predetermined threshold value.

6. The method of claim 1 , wherein updating the correction terms based on the correlations comprises:
updating the correction terms based on (1) correlations associated with an interval including samples whose values are above a first predetermined threshold value, and (2) correlations associated with an interval including samples whose values are below a second predetermined threshold value.

7. The method of claim 1 , wherein the different open intervals comprises: an interval including all samples, and a plurality of intervals associated with different predetermined threshold values, each including samples whose absolute values are above a predetermined threshold value corresponding to a particular one of the intervals.

8. The method of claim 1 , wherein two or more ones of the different open intervals overlap each other.

9. The method of claim 1 , wherein updating the correction terms based on the correlations comprises:
estimating piecewise linear correction terms based on the different open intervals.

10. The method of claim 1 , wherein the correction terms comprises a gain coefficient and an offset for each open interval.

11. The method of claim 1 , wherein performing correlations comprises:
correlating the error signal with a lagging or leading sample of the pseudo-random signal.

12. The method of claim 1 , wherein performing correlations comprises:
correlating the error signal with a product of samples of the pseudo-random signal at a different time instants.

13. The method of claim 1 , wherein the different open intervals of the error signal comprises an open interval based on an amplitude of a leading or lagging sample of the error signal.

14. The method of claim 1 , wherein the different open intervals of the error signal comprises an open interval based on a product of samples of the error signal at different time instants.

15. A system for correcting a circuit generating an output signal, the system comprising:
a circuit part to remove an injected signal, wherein the injected signal is uncorrelated with a signal being processed by the circuit to generate an error signal;
threshold logic to determine whether the error signal falls with one or more open intervals;
a correlation block to correlate the error signal with the injected signal; and
one or more update loops for processing correlation results within one or more open intervals to generate correction terms for correcting the circuit.

16. The system of claim 14 , wherein:
the circuit part is a residue producing circuit in an analog-to-digital converter; and
the injected signal is injected at an input of an amplifier of the residue producing circuit; and
the correction terms are associated with gain errors of the amplifier.

17. The system of claim 14 , further comprising:
a digital-to-analog converter for generating the injected signal based on a one-bit pseudo random number sequence.

18. The system of claim 14 , further comprising:
a closed interval sorting block for determining in which one of closed intervals a sample of the output signal falls and outputting a selection signal to select one or more correction terms for linearizing the circuit part.

19. The system of claim 14 , further comprising:
a closed interval sorting block for determining in which one of closed intervals a sample of the output signal falls, outputting a selection signal, wherein the selection signal and one or more delayed versions of the selection signal each selects one or more correction terms for producing an intermediate value; and
a combination block for combining the intermediate values for linearizing the circuit part.

20. An apparatus for determining correction terms of an analog-to-digital converter, the apparatus comprising
means for sorting correlation results of an error signal of the analog-to-digital converter with a pseudo-random signal into overlapping open intervals based on amplitude of the error signal; and
means for estimating correction terms corresponding to the overlapping open intervals based on correlations results in each overlapping open interval.

Assignees

• Analog Devices Inc

Inventors

• Otte Eric

Classifications

• G01R31/3177

  Testing of logic operation, e.g. by logic analysers · CPC title

• G01R31/3167

  Testing of combined analog and digital circuits {(testing ADC's H03M1/1071)} · CPC title

• G01R31/2851 Primary

  Testing of integrated circuits [IC] (G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801) · CPC title

• H03M1/1042 Primary

  the look-up table containing corrected values for replacing the original digital values (H03M1/1052 takes precedence) · CPC title

• H03M1/164

  the steps being performed sequentially in series-connected stages (H03M1/161 takes precedence) · CPC title