X-ray fluorescence analysis method and X-ray fluorescence analysis system

Patent metadata

Field	Value
Publication number	US-9945796-B2
Application number	US-201315027262-A
Country	US
Kind code	B2
Filing date	Oct 15, 2013
Priority date	Oct 15, 2013
Publication date	Apr 17, 2018
Grant date	Apr 17, 2018

Abstract

An X-ray fluorescence analysis method in which the quantity of a contained component other than the principal component in the sample is determined by using the result of measurement of X-rays emitted from a sample whose principal component is an organic component, includes: setting a quantitative value of the contained component; calculating an area occupancy ratio representing the proportion of X-rays falling onto the sample; recalculating the area occupancy ratio based on a comparison of a measured value of the scattered X-ray intensity with a theoretical value of the scattered X-ray intensity calculated using a recalculated quantitative value of the contained component and the area occupancy ratio; repeating the recalculation of the quantitative value of the contained component and the recalculation of the area occupancy ratio, and determining the quantitative value as the definite quantitative value of the contained component when the quantitative value satisfies a previously set convergence condition.

First claim

The invention claimed is:

1. An X-ray fluorescence analysis method including steps of casting X-rays onto a sample whose principal component is an organic substance with a known molecular formula, and determining a quantity of each contained component other than the principal component in the sample by using a result of a measurement of X-rays emitted from the sample, the method further comprising steps of:
a) determining a kind of the contained component based on an energy of the fluorescent X-rays detected in the measurement;
b) setting a quantitative value of the contained component, based on a measured value of an intensity of the fluorescent X-rays from the sample;
c) calculating an area occupancy ratio which represents a proportion of the X-rays falling onto the sample, based on a measured value of an intensity of scattered X-rays from the sample and a theoretical value of the intensity of the scattered X-rays calculated on an assumption that the sample is composed of the principal component and that an entire amount of the cast X-rays fall onto the sample;
d) recalculating the quantitative value of the contained component based on a result of a comparison of the measured value of the intensity of the fluorescent X-rays with a theoretical value of the intensity of the fluorescent X-rays calculated using the quantitative value of the contained component and the area occupancy ratio;
e) recalculating the area occupancy ratio based on a result of a comparison of the measured value of the intensity of the scattered X-rays with a theoretical value of the intensity of the scattered X-rays calculated using the recalculated quantitative value of the contained component and the area occupancy ratio; and
f) repeating the recalculation of the quantitative value of the contained component and the recalculation of the area occupancy ratio, and determining the recalculated quantitative value as a definite quantitative value of the contained component when the recalculated quantitative value and/or the recalculated area occupancy ratio satisfies a previously set convergence condition.

2. An X-ray fluorescence analysis system for casting X-rays onto a sample whose principal component is an organic substance with a known molecular formula and for determining a quantity of each contained component other than the principal component in the sample by using a result of a measurement of X-rays emitted from the sample, the system further comprising:
a) a contained component determiner for determining a kind of the contained component based on an energy of the fluorescent X-rays detected in the measurement;
b) a quantitative value setter for setting a quantitative value of the contained component, based on a measured value of an intensity of the fluorescent X-rays from the sample;
c) an area occupancy ratio calculator for calculating an area occupancy ratio which represents a proportion of the X-rays falling onto the sample, based on a measured value of an intensity of scattered X-rays from the sample and a theoretical value of the intensity of the scattered X-rays calculated on an assumption that the sample is composed of the principal component and that an entire amount of the cast X-rays fall onto the sample;
d) a quantitative value recalculator for recalculating the quantitative value of the contained component based on a result of a comparison of the measured value of the intensity of the fluorescent X-rays with a theoretical value of the intensity of the fluorescent X-rays calculated using the quantitative value of the contained component and the area occupancy ratio;
e) an area occupancy ratio recalculator for recalculating the area occupancy ratio based on a result of a comparison of the measured value of the intensity of the scattered X-rays with a theoretical value of the intensity of the scattered X-rays calculated using the recalculated quantitative value of the contained component and the area occupancy ratio; and
f) a quantitative value determiner for repeating the calculation by the quantitative value recalculator and the calculation of the area occupancy ratio recalculator, and for determining the recalculated quantitative value as a definite quantitative value of the contained component when the recalculated quantitative value and/or the recalculated area occupancy ratio satisfies a previously set convergence condition.

Assignees

• Shimadzu Corp

Inventors

• Terashita Eisaku

Classifications

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title