Measurement scale with periodic nanostructure

Patent metadata

Field	Value
Publication number	US-9945697-B2
Application number	US-201414654952-A
Country	US
Kind code	B2
Filing date	Jan 13, 2014
Priority date	Jan 15, 2013
Publication date	Apr 17, 2018
Grant date	Apr 17, 2018

Abstract

A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.

First claim

The invention claimed is:

1. A measurement scale device comprising:
at least one scale marking, wherein:
the or each scale marking comprises at least one periodic nanostructure that (i) represents scale device information and (ii) comprises a Laser Induced Periodic Surface Structure (LIPSS), and
the measurement scale device is for determining relative position of two objects.

2. A measurement scale device according to claim 1 , wherein the or each periodic nanostructure comprises a plurality of substantially parallel lines.

3. A measurement scale device according to claim 1 , wherein the information represented by the at least one periodic nanostructure comprises position information or non-position related data concerning the scale device.

4. A measurement scale device according to claim 1 , wherein the or each periodic nanostructure represents the information using at least one of orientation, depth and period of the periodic nanostructure.

5. A measurement scale device according to claim 1 , wherein the scale device information represented by the at least one periodic nanostructure comprises at least one of (a) absolute position information; and (b) relative position information.

6. A measurement scale device according to claim 1 , wherein the scale device information represented by the at least one periodic nanostructure comprises at least one of: (a) indication of a limit; (b) indication of a reference position; and (c) direction information.

7. A measurement scale device according to claim 1 , wherein the scale device information represented by the at least one periodic nanostructure comprises at least one of: (a) error information; (b) a scale or scale manufacturer identifier; and (c) an error map representing errors in an associated series of scale markings.

8. A measurement scale device according to claim 1 , wherein the scale device information represented by the at least one periodic nanostructure comprises authentication or security data.

9. A measurement scale device according to claim 1 , wherein the at least one scale marking comprises a plurality of scale markings forming a first series of scale markings, and the measurement scale device further comprises a second series of scale markings.

10. A measurement scale device according to claim 9 , wherein the first series of scale markings and the second series of scale markings share a common axis of measurement.

11. A measurement scale device according to claim 9 , wherein the first series of scale markings comprises one of absolute scale markings, incremental scale markings and reference marks, and the second series of scale markings comprises another of absolute scale markings, incremental scale markings, and reference marks.

12. A measurement scale device according to claim 9 , wherein at least one of the first series of scale markings is overlaid with at least one of the second series of scale markings.

13. A measurement scale device according to claim 9 , wherein the first series of scale markings is interleaved with the second series of scale markings.

14. A measurement scale device according to claim 9 , wherein scale device information represented by the first series of scale markings is independently readable with regard to scale device information represented by the second series of scale markings.

15. A measurement scale device according to claim 9 , wherein the scale markings of the second series are of a type different than the scale markings of the first series.

16. A measurement scale device according to claim 1 , wherein the at least one scale marking comprises a plurality of scale markings.

17. A measurement scale device according to claim 16 , wherein the scale markings are substantially identical.

18. A measurement scale device according to claim 16 , wherein the scale markings are substantially equally-spaced along a measurement axis.

19. A measurement scale device according to claim 1 , wherein the or each periodic nanostructure represents the scale device information using a polarisation property of the periodic nanostructure.

20. A measurement scale device according to claim 19 , wherein a preferential direction of polarisation of each periodic nanostructure represents the scale device information.

21. A measurement scale device according to claim 1 , wherein for the periodic nanostructure or each of the periodic nanostructures, a property of the periodic nanostructure that represents the scale device information has one of a selected number of discrete values.

22. A measurement scale device according to claim 21 , wherein each of the selected number of discrete values represents a respective data value, with the scale device information being represented by the data values.

23. A measurement scale device according to claim 1 , wherein for the periodic nanostructure or each of the periodic nanostructures, a property of the periodic nanostructure that represents the scale device information varies with displacement along a measurement axis of the scale device.

24. A measurement scale device according to claim 1 , wherein the at least one scale marking form a measurement scale for an encoder.

25. A measurement scale device according to claim 1 , wherein the at least one scale marking form a linear scale for an encoder.

26. A measurement scale device according to claim 1 , wherein the at least one scale marking form a rotary scale for an encoder.

27. An encoder comprising:
a measurement scale device according to claim 1 ; and
a read head for reading information from the measurement scale device.

28. A method of reading a marking of a measurement scale device according to claim 1 , comprising:
detecting electromagnetic radiation that is reflected or transmitted by the at least one periodic nanostructure,
determining at least one property of the at least one periodic nanostructure from the detected electromagnetic radiation, and
determining scale device information from the at least one property.

29. A method according to claim 28 , wherein the determining of the at least one property comprises determining at least one polarisation property.

30. A method according to claim 28 , wherein the method of reading comprises at least one of imaging the measurement scale and detecting diffractive effects produced by the at least one periodic nanostructure.

31. A method according to claim 28 , wherein the at least one property has one of a selected number of discrete values, each of the selected number of discrete values representing a respective data value, and the scale device information being represented by the data values.

32. A read head for reading a marking of a measurement scale device according to claim 1 , comprising:
a source of electromagnetic radiation,
a detector for detecting electromagnetic radiation that is reflected or transmitted by the at least one periodic nanostructure of the scale,
means for determining at least one property of the at least one periodic nanostructure from the detected electromagnetic radiation, and
means for determining scale device information from the at least one property.

33. A measurement scale device according to claim 1 , wherein the or each periodic nanostructure represents a data bit that comprises a binary digit.

Assignees

• Renishaw Plc

Inventors

• Kidd Matthew Donald
• Weston Nicholas John
• Henshaw James Reynolds
• Ardron Marcus
• Dardis John
• Thomson Robert

Classifications

• B82Y20/00 Primary

  Nanooptics, e.g. quantum optics or photonic crystals · CPC title

• G01D5/344

  using polarisation (G01D5/35303 takes precedence) · CPC title

• G01D5/345 Primary

  Polarising encoders · CPC title

• B23K26/361

  for deburring or mechanical trimming (B23K26/351 takes precedence) · CPC title

• B23K26/362

  Laser etching · CPC title