Tamper resistant amorphous alloy joining

Patent metadata

Field	Value
Publication number	US-9945017-B2
Application number	US-201114348399-A
Country	US
Kind code	B2
Filing date	Sep 30, 2011
Priority date	Sep 30, 2011
Publication date	Apr 17, 2018
Grant date	Apr 17, 2018

Abstract

A method to form an enclosure or assembly which is fitted together and joined via a thermoplastic forming operation in order to seal the enclosure and hinder attempts to tamper with the contents.

First claim

What is claimed:

1. An article comprising a tamper evident amorphous alloy interlock, comprising:
a first component formed from a unitary bulk solidifying amorphous alloy; and
a second component retained to the first component wherein the second component is formed from a unitary bulk solidifying amorphous alloy and the second component comprises:
a structural member comprising a substantially amorphous microstructure; and
an interlock member comprising a crystalline microstructure different from the amorphous microstructure of the structural member.

2. The article of claim 1 , wherein:
the structural member comprises a shaft extending through a hole in the first component; and
the interlock member comprises a head at an end of the shaft, the head overlapping a surface of the first component adjacent the hole.

3. The article of claim 1 , wherein;
the article is an enclosure for an electronic device; and
the tamper evident amorphous alloy interlock seals the enclosure.

4. The article of claim 1 , wherein the article comprises an electronic device between the first component and the second component.

5. The article of claim 1 , wherein the bulk solidifying amorphous alloy is described by the following molecular formula: (Zr, Ti) a (Ni, Cu, Fe) b (Be, Al, Si, B) c , wherein “a” is in the range of from 30 to 75, “b” is in the range of from 5 to 60, and “c” is in the range of from 0 to 50 in atomic percentages.

6. The article of claim 1 , wherein the bulk solidifying amorphous alloy is described by the following molecular formula: (Zr, Ti) a (Ni, Cu) b (Be) c , wherein “a” is in the range of from 40 to 75, “b” is in the range of from 5 to 50, and “c” is in the range of from 5 to 50 in atomic percentages.

7. The article of claim 1 , wherein the interlock member is integrally formed-as a projection of the second component and the projection overlaps a ridge of the first component.

8. The article of claim 1 , wherein the crystalline microstructure has at least 40 vol % crystalline phase.

9. An article, comprising:
a first housing component defining a first portion of an interior volume of an electronic device and comprising a first interlock feature; and
a second housing component of unitary construction defining a second portion of the interior volume of the electronic device and comprising:
a body portion comprising a substantially amorphous form of a bulk solidifying amorphous alloy; and
a second interlock feature comprising a substantially crystalline form of the bulk solidifying amorphous alloy and engaged with the first interlock feature to retain the second housing component to the first housing component.

10. The article of claim 9 , wherein the first interlock feature defines an undercut.

11. The article of claim 9 , wherein the first interlock feature extends around an outer perimeter of the first housing component.

12. The article of claim 9 , wherein:
the first interlock feature comprises a hole through the first housing component from an exterior surface of the first housing component to an interior surface of the first housing component; and
the second interlock feature comprises:
a shaft extending through the hole; and
a rivet head integrated with the shaft and engaged with the exterior surface of the first housing component to retain the second housing component to the first housing component.

13. The article of claim 12 , wherein the rivet head comprises the substantially crystalline form of the bulk solidifying amorphous alloy.

Assignees

• Waniuk Theodore Andrew
• Pham Tran Quoc
• Ogawa Dennis
• Crucible Intellectual Prop Llc

Inventors

• Waniuk Theodore Andrew
• Pham Tran Quoc
• Ogawa Dennis

Classifications

• H10W42/40

  protecting against tampering, e.g. unauthorised inspection or reverse engineering · CPC title

• H10W76/60

  Seals · CPC title

• C22C45/00 Primary

  Amorphous alloys (making amorphous non-ferrous alloys C22C1/11) · CPC title

• H01L23/10

  Electricity · mapped topic

• H01L23/573

  Electricity · mapped topic