Device and method for fast recording of an absorption spectrum of a fluid using a plurality of etalons in combination with a tunable fabry-perot interferometer

Patent metadata

Field	Value
Publication number	US-9939374-B2
Application number	US-201314390523-A
Country	US
Kind code	B2
Filing date	Apr 4, 2013
Priority date	Apr 5, 2012
Publication date	Apr 10, 2018
Grant date	Apr 10, 2018

Abstract

A device for recording an absorption spectrum of a fluid has a radiation source ( 1 ) that emits a radiation in a spectral range along a beam path ( 11 ), a measuring path ( 5 ), along which the radiation passes through the fluid and arranged in the beam path, a tunable Fabry-Perot interferometer ( 7 ), arranged in the beam path and transmitting radiation in the spectral range as a displaceable bandpass filter, and a detector ( 9, 35 ) measuring the intensity of the radiation in the spectral range. An etalon ( 3 ) is arranged for spectral modulation of radiation in the beam path and has a plurality of transmission maxima ( 17 ) in the spectral range. The bandpass filter, formed by the Fabry-Perot interferometer ( 7 ), is displaceable across the spectral range such that spectral modulation of the radiation by the etalon ( 3 ) is measured by the detector ( 9, 35 ) as a modulation of radiation intensity over time.

First claim

The invention claimed is:

1. A device for recording an absorption spectrum of a fluid, the device comprising:
a radiation source, which emits radiation in a spectral range along a beam path;
a first measuring section and a second measuring section, which are arranged in the beam path and along which the radiation passes through the fluid, the first measuring section comprising a first length, the second measuring section comprising a second length, the first length being different from the second length;
a tunable Fabry-Perot interferometer, which is arranged in the beam path and which can transmit radiation in the spectral range as a displaceable bandpass filter;
a detector for measuring the radiation in the spectral range;
a first etalon, whose optical properties with respect to a transmitted wavelength range are not changed, for the spectral modulation of the radiation, which is arranged in the beam path and which has a plurality of transmission maxima in the spectral range, wherein the bandpass filter, formed by the Fabry-Perot interferometer, is displaceable over the spectral range such that the spectral modulation of the radiation by the first etalon is measured by the detector as a modulation of an intensity of the radiation over time so as to infer a transmitted wavelength and a wavelength of the radiation, the first etalon being arranged opposite the first measuring section;
a second etalon arranged in the beam path, opposite the second measuring section, the first etalon and the second etalon being arranged on one side of the first measuring section and the second measuring section, the Fabry-Perot interferometer being arranged on another side of the first measuring section and the second measuring section, the one side being opposite the another side.

2. A device in accordance with claim 1 , wherein a lock-in amplifier is provided for determining the absorption spectrum of the fluid from the radiation intensities measured with the detector, wherein said transmitted wavelength and said wavelength of the radiation are determined by an evaluation/data processing unit, the first etalon being located at a first distance from the Fabry-Perot interferometer, the second etalon being located at a second distance from the Fabry-Perot interferometer, the second distance being less than the first distance, the Fabry-Perot interferometer receiving radiation from the first measuring section and the second measuring section.

3. A device in accordance with claim 1 , wherein the radiation source is a first radiation source and the radiation emitted thereby is along a first beam path and in a first spectral range, the first measuring section comprising a first measuring section first end area and a first measuring section second end area located opposite the first measuring section first end area, the first measuring section first end area and the first measuring section second end area defining at least a portion of the first beam path, the detection device is a first detection device, the device further comprising:
a measuring structure comprising the first measuring section and the second measuring section
a second radiation source, which emits radiation in a second spectral range along a second beam path, the second measuring section comprising a second measuring section first end area and a second measuring section second end area located opposite the second measuring section first end area, the second measuring section first end area and the second measuring section second end area defining at least a portion of the second beam path;
a second detector for measuring the intensity of the radiation in the second spectral range, the radiation emitted by the second radiation source passing along the second measuring section through the fluid, arranged in the second beam path, wherein the first and second beam paths are designed such that the Fabry-Perot interferometer is arranged in the first and second beam paths and the Fabry-Perot interferometer transmits radiation in the second spectral range as a displaceable bandpass filter, the second etalon being provided for the spectral modulation of the radiation, which has a plurality of transmission maxima in the second spectral range, wherein the Fabry-Perot interferometer is set up such that the bandpass filter formed by the Fabry-Perot interferometer can be displaced over the second spectral range such that the spectral modulation of the radiation by the second etalon can be measured by the second detector as a modulation of the intensity of the radiation over time, each of said first etalon and said second etalon comprising an uncoated, polished thin wafer, said wafer comprising one of silicon and germanium, the first measuring section having a first measuring section length, the second measuring section having a second measuring section length, the first measuring section length being greater than the second measuring section length.

4. A device in accordance with claim 3 , wherein:
the Fabry-Perot interferometer is designed such that it can transmit radiation simultaneously in the first and second spectral ranges;
the first measuring section, the second measuring section, the first etalon and the second etalon being arranged upstream of the Fabry-Perot interferometer with respect to the beam path; and
the bandpass filter formed by the Fabry-Perot interferometer can be displaced simultaneously over the first and second spectral ranges such that the spectral modulation of the radiation by the first and second etalons can be measured by the first and second detectors as a modulation of the intensity of the radiation over time.

5. A device in accordance with claim 3 , wherein:
a first lock-in amplifier is provided for determining the absorption spectrum of the fluid from the radiation intensities measured with the first detector; and
a second lock-in amplifier is provided for determining the absorption spectrum of the fluid from the radiation intensities measured with the second detector.

6. A device in accordance with claim 3 , wherein the first etalon is made integrally with the second etalon.

7. A device in accordance with claim 3 , wherein the first measuring section coincides with the second measuring section.

8. A device in accordance with claim 3 , further comprising:
a measuring structure comprising the first measuring section and the second measuring section, the first etalon and the second etalon not extending parallel to an end surface of the measuring structure, wherein the first detector is made integrally with the second detector, the first measuring section comprising a first end surface, the second measuring section comprising a second end surface, the first etalon comprising a first etalon first planar surface and a first etalon second planar surface located opposite the first etalon first planar surface, the first etalon first planar surface and the first etalon second planar surface not being parallel to the first end surface, the second etalon comprising a second etalon first planar surface and a second etalon second planar surface located opposite the second etalon first planar surface, the second etalon first planar surface and the second etalon second planar surface not being parallel to the second end surface.

9. A device in accordance with claim 8 , wherein the radiation source is made integrally with the second radiation source, the first etalon being arranged adjacent to a first area of the measuring structure, the second etalon being arranged adjacent to a second area of the measuring structure, the first area being located at an axially spaced location from the second area with respect to a longitudinal axis of the measuring structure.

10. A dev

Assignees

• Draeger Medical Gmbh
• Draegerwerk Ag & Co Kgaa

Inventors

• Buchtal Ralf
• Dreyer Peter
• Fornasiero Livio

Classifications

• G01J3/433

  Modulation spectrometry; Derivative spectrometry · CPC title

• G01J3/42

  Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08) · CPC title

• G01N2201/068

  Optics, miscellaneous · CPC title

• G01N2201/0662

  Comparing measurements on two or more paths in one sample · CPC title

• G01N2201/061

  Sources · CPC title