Air quality determination system, air quality determination method, and sensor module
US-2024036018-A1 · Feb 1, 2024 · US
US9933382B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9933382-B2 |
| Application number | US-201715621949-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 13, 2017 |
| Priority date | May 28, 2014 |
| Publication date | Apr 3, 2018 |
| Grant date | Apr 3, 2018 |
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Described herein are sensor elements for detecting the presence of organic materials comprising a boron doped n-type semiconductor material with decrease in resistivity upon organic materials exposure with increase in resistivity upon organic materials exposure.
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What is claimed: 1. A gas sensor element comprising: a first electrode and second electrode, wherein the first electrode and the second electrode are separated by a gap of about 1 to about 10 mils; and a polycrystalline n-type semiconductor material comprising: epsilon phase WO 3 that is doped with boron; wherein the polycrystalline n-type semiconductor material physically contacts both the first and second electrodes. 2. The gas sensor element of claim 1 , wherein the boron is present at about 0.001% to about 1% by weight of the polycrystalline n-type semiconductor material. 3. The gas sensor element of claim 1 , wherein the polycrystalline n-type semiconductor material is combustion synthesized. 4. The gas sensor element of claim 1 , wherein the polycrystalline n-type semiconductor is at a temperature of about 190° C. to about 360° C. 5. The gas sensor element of claim 1 , further comprising a noble metal mixed with the polycrystalline n-type semiconductor material. 6. The gas sensor element of claim 5 , wherein the noble metal is palladium, gold, platinum, or iridium. 7. The gas sensor element of claim 1 , wherein the polycrystalline n-type semiconductor material is exposed to blue light. 8. The gas sensor element of claim 1 , wherein the polycrystalline n-type semiconductor material is at a temperature of about 10° C. to about 40° C. 9. The gas sensor element of claim 1 , wherein the polycrystalline n-type semiconductor material is ball milled. 10. The gas sensor element of claim 1 , wherein the semiconductor material has an absorption edge of 600 nm or less. 11. The gas sensor element of claim 1 , further comprising a co-catalyst. 12. The gas sensor element of claim 11 , wherein the co-catalyst is CeO 2 or TiO 2 . 13. The gas sensor element of claim 11 , wherein the co-catalyst is CeO 2 . 14. The gas sensor element of claim 11 , wherein the co-catalyst is a transition metal oxide (p-type). 15. The gas sensor element of claim 14 , wherein the transition metal oxide is a Co, Mn, Ni, or Cu oxide (p-type).
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