Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons

Patent metadata

Field	Value
Publication number	US-9915626-B2
Application number	US-201514633020-A
Country	US
Kind code	B2
Filing date	Feb 26, 2015
Priority date	Feb 26, 2014
Publication date	Mar 13, 2018
Grant date	Mar 13, 2018

Abstract

Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering-stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.

First claim

What is claimed is:

1. A method for identifying a scattering-stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles, the method comprising:
exposing, at a charge particle detection system, the range of low-density materials located within a volume of interest (VOI) to cosmic ray charged particles including cosmic-ray muons and cosmic-ray electrons;
determining a scattering number associated with a subset of the exposed cosmic ray charged particles entering the VOI, interacting with the range of low-density materials located within the VOI, and exiting the VOI;
determining a raw stopping number associated with a subset of the exposed cosmic ray charged particles entering the VOI, interacting with the range of low-density materials within the VOI, and stopping inside the VOI; and
determining, based at least partly on a scattering signal and a stopping power, a scattering-stopping ratio that enables a classification of the range of low-density materials,
wherein the scattering signal is expressed in terms of a scattering angle of the subset of the exposed cosmic ray charged particles entering the VOI, interacting with the range of low-density materials located within the VOI, and exiting the VOI, a momentum of the cosmic ray charged particles, and a dimension of the VOI,
wherein the stopping power is expressed in terms of the scattering number, the raw stopping number, the momentum of the cosmic ray charged particles, and the dimension of the VOI, and
wherein the cosmic-ray electrons demonstrate greater scattering responses than the cosmic-ray muons in materials having low-atomic-mass elements and greater stopping responses than the cosmic-ray muons in materials having medium-atomic-mass elements such that combining scattering and stopping responses of the cosmic-ray electrons and the cosmic-ray muons enables a classification of materials that is extended beyond Special Nuclear Materials.

2. The method of claim 1 , wherein the exposing, determining the scattering number, determining the raw stopping number, and determining the scattering-stopping ratio are performed for the range of low-density materials one material at a time.

3. The method of claim 1 , further comprises: determining an effect of a container defining the VOI by separately measuring a scattering signal and a stopping power associated with the container empty.

4. The method of claim 1 , wherein at least one material in the range of low-density materials has a density below 3 g/cc.

5. The method of claim 1 , wherein values of the scattering signal and stopping power increase with densities of the range of low-density materials.

6. The method of claim 1 , wherein determining the scattering number includes:
detecting, from a first set of position sensitive cosmic ray charged particle detectors of the charged particle detection system, events of incident charge particles from the exposed cosmic ray charged particles that penetrate the first set of position sensitive cosmic ray charged particle detectors and enter the VOI;
detecting, from a second set of position sensitive cosmic ray charged particle detectors of the charged particle detection system, events of outgoing charged particles from the exposed cosmic ray charged particles exiting the VOI;
receiving, at a signal processing unit of the charged particle detection system, signals associated with the events of the incident cosmic ray charged particles from the first set of position sensitive cosmic ray charged particle detectors and signals associated with events of the outgoing cosmic ray charged particles from the second set of position sensitive cosmic ray charged particle detectors; and
determining, by the signal processing unit, the scattering number based at least on the received signals associated with the events of the outgoing cosmic ray charged particles from the second set of position sensitive cosmic ray charged particle detectors.

7. The method of claim 6 , wherein determining the raw stopping number associated with a subset of the exposed cosmic ray charged particles interacting with the VOI includes:
using received signals associated with the events of the incident cosmic ray charged particles from the first set of position sensitive cosmic ray charged particle detectors to determine a number of the incident cosmic ray charged particles and using received signals associated with the events of the outgoing cosmic ray charged particles from the second set of position sensitive cosmic ray charged particle detectors to determine a number of scattered cosmic ray charged particles; and
computing the raw stopping number of stopped cosmic ray charged particles by subtracting the number of scattered cosmic ray charged particles from the number of incident cosmic ray charged particles.

8. The method of claim 7 , wherein the stopping power is normalized by dividing the raw stopping number of stopped cosmic ray charged particles by the scattering number to account for variations in detection efficiency at different locations of the cosmic ray detector.

9. The method of claim 7 , further comprising correcting the raw stopping number of stopped cosmic ray charged particles to compensate for effects of a thickness of the VOI.

10. The method of claim 6 , wherein the method further comprises correcting the scattering signal and stopping power to compensate for a geometric effect of the VOI.

11. A method for identifying contents of a volume of interest (VOI) exposed to cosmic ray charged particles, the method comprising:
determining, by a charged particle detection system, a number of scattered cosmic ray charged particles from cosmic-ray charged particles that include cosmic-ray muons and cosmic-ray electrons interacting with the VOI;
determining a number of stopped cosmic ray charged particles from the cosmic ray charged particles that include the cosmic-ray muons and the cosmic-ray electrons interacting with the VOI;
determining, based at least partly on a scattering signal and a stopping power, a scattering-stopping ratio; and
comparing the scattering-stopping ratio against a predetermined set of scattering-stopping ratios for a range of low-density materials to determine whether the contents of the VOI match a material in the range of low-density materials to enable a classification of the contents of the VOI,
wherein the scattering signal is expressed in terms of a scattering angle of the scattered cosmic ray charged particles, a momentum of the cosmic ray charged particles, and a dimension of the VOI,
wherein the stopping power is expressed in terms of the number of stopped cosmic ray charged particles, the momentum of the cosmic ray charged particles, the number of scattered cosmic ray charged particles, and the dimension of the VOI, and
wherein the cosmic-ray electrons demonstrate greater scattering responses than the cosmic-ray muons in materials having low-atomic-mass elements and greater stopping responses than the cosmic-ray muons in materials having medium-atomic-mass elements such that combining scattering and stopping responses of the cosmic-ray electrons and the cosmic-ray muons enables the classification of the contents of the VOI that is extended beyond Special Nuclear Materials.

12. The method of claim 11 , wherein the VOI is exposed to the cosmic ray charged particles from inside a container.

13. The method of claim 12 , wherein the container includes a shipping container, a vehicle, or, a package.

14. The method of claim 12 , wherein the method further comprises correcting the numbers of scattered and stopped cosmic ray charged particles for an effe

Assignees

• Decision Sciences Int Corp

Inventors

• Blanpied Gary
• Kumar Sankaran
• Dorroh Dustin
• Morgan Craig
• Sossong Michael James

Classifications

• G01N23/20

  by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials · CPC title

• G01V5/0016

  Physics · mapped topic

• G01N23/046 Primary

  using tomography, e.g. computed tomography [CT] · CPC title

• G01V5/0091

  Physics · mapped topic

• G01N2223/05

  by diffraction, scatter or reflection · CPC title