Method of generating reference data for inspecting a circuit board

Patent metadata

Field	Value
Publication number	US-9911185-B2
Application number	US-201415021349-A
Country	US
Kind code	B2
Filing date	Sep 11, 2014
Priority date	Sep 12, 2013
Publication date	Mar 6, 2018
Grant date	Mar 6, 2018

Abstract

The present invention relates to a method of generating reference data for inspecting a circuit board. The method comprises steps of scanning a bare circuit board to obtain image information of the bare circuit board, generating a compensation matrix using pad coordinate information extracted from the image information and pad coordinate information prestored in design data, and generating, by applying the compensation matrix to the image information, a reference data including coordinate information of a distinctive object. According to the method, inspection efficiency may optimized through quickly generating reference data without CAD information necessary for circuit board inspection.

First claim

The invention claimed is:

1. A method of generating reference data for inspecting a circuit board, the method including:
scanning a bare circuit board for the circuit board to obtain image information of the bare circuit board;
generating a compensation matrix using pad coordinate information extracted from the image information and pad coordinate information prestored in design data; and
generating, by applying the compensation matrix to the image information, a reference data including coordinate information of a distinctive object,
wherein the reference data correspond to CAD information, and are prepared for a step of inspecting the circuit board.

2. The method of claim 1 , wherein the generating a reference data includes:
extracting the coordinate information of the distinctive object from the image information;
generating, by applying the compensation matrix to the extracted coordinate information of the distinctive object, the reference data.

3. The method of claim 2 , wherein the distinctive object includes at least one of hole pattern, circle pattern, and a corner portion of a curved pattern formed on the bare circuit board.

4. The method of claim 1 , wherein the reference data is image information generated by applying the compensation matrix to the image information.

5. The method of claim 1 , wherein the image information is a 2-dimensional image information of the bare circuit board.

6. A computer-readable storage medium storing computer-executable program for performing the method of claim 1 .

7. A computer-readable storage medium storing computer-executable program for performing the method of claim 2 .

8. A computer-readable storage medium storing computer-executable program for performing the method of claim 3 .

9. A computer-readable storage medium storing computer-executable program for performing the method of claim 4 .

10. A computer-readable storage medium storing computer-executable program for performing the method of claim 5 .

Assignees

• Koh Young Tech Inc

Inventors

• Jung Seungwon
• Choi Jongjin
• You Heewook

Classifications

• G01N21/93 Primary

  Detection standards; Calibrating {baseline adjustment, drift correction} · CPC title

• G06T7/0004

  Industrial image inspection · CPC title

• G06T2207/10016

  Video; Image sequence · CPC title

• G01N21/956

  Inspecting patterns on the surface of objects {(contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H10P74/20)} · CPC title

• G01N21/95607

  using a comparative method · CPC title