Self-referenced MRAM cell and magnetic field sensor comprising the self-referenced MRAM cell

Patent metadata

Field	Value
Publication number	US-9905283-B2
Application number	US-201515516098-A
Country	US
Kind code	B2
Filing date	Sep 24, 2015
Priority date	Oct 3, 2014
Publication date	Feb 27, 2018
Grant date	Feb 27, 2018

Abstract

A self-referenced MRAM cell including a reference layer having a fixed reference magnetization, a sense layer having a free sense magnetization, a tunnel barrier, a biasing layer having bias magnetization and a biasing antiferromagnetic layer pinning the bias magnetization in a bias direction when MRAM cell is at temperature equal or below a bias threshold temperature. The bias magnetization is arranged for inducing a bias field adapted for biasing the sense magnetization in a direction opposed to the bias direction, such that the biased sense magnetization varies linearly in the presence of the external magnetic field, when the external magnetic field is oriented in a direction substantially perpendicular to the one of the reference magnetization. The present disclosure further concerns a magnetic field sensor including a plurality of the self-referenced MRAM cell and a method for programming the magnetic field sensor.

First claim

What is claimed is:

1. A self-referenced MRAM cell comprising a reference layer having a fixed reference magnetization, a sense layer having a sense magnetization that is freely orientable in an external magnetic field, and a tunnel barrier comprised between the reference and sense layers;
wherein
the MRAM cell further comprises a biasing layer having a bias magnetization and a biasing antiferromagnetic layer pinning the bias magnetization in a bias direction when MRAM cell is at temperature equal or below a bias threshold temperature;
and wherein
the bias magnetization is arranged for inducing a bias field adapted for biasing the sense magnetization in a direction opposed to the bias direction, such that the biased sense magnetization varies linearly in the presence of the external magnetic field, when the external magnetic field is oriented in a direction substantially perpendicular to the one of the reference magnetization.

2. The MRAM cell according to claim 1 , wherein the MRAM cell further comprises a reference antiferromagnetic layer pinning the reference magnetization when the MRAM cell is at a temperature equal or lower to a reference threshold temperature; the bias threshold temperature being lower than the reference threshold temperature.

3. The MRAM cell according to claim 1 , wherein the bias direction forms an angle between a direction parallel and a direction orthogonal to the one of the reference magnetization.

4. The MRAM cell according to claim 1 ,
wherein the MRAM cell further comprises a decoupling layer between the sense layer and the biasing layer, such that no direct RKKY coupling between the biasing layer and the sense layer occurs.

5. A magnetic field sensor comprising:
a current line electrically connecting in series a plurality of MRAM cells; each MRAM cell comprising a reference layer having a fixed reference magnetization, a sense layer having a sense magnetization that is freely orientable in an external magnetic field, a tunnel barrier comprised between the reference and sense layers, a biasing layer having a bias magnetization, and a biasing antiferromagnetic layer pinning the bias magnetization in a bias direction when MRAM cell is at temperature equal or below a bias threshold temperature; the bias magnetization being arranged for inducing a bias field adapted for biasing the sense magnetization in a direction opposed to the bias direction, such that the biased sense magnetization varies linearly in the presence of the external magnetic field, when the external magnetic field is oriented in a direction substantially perpendicular to the one of the reference magnetization;
the current line being arranged for passing a heating current adapted for heating the MRAM cells above the bias threshold temperature; and
a programming field line for passing a programming field current inducing a magnetic field adapted for aligning the bias magnetization of the MRAM cells in the bias direction, when the MRAM cell is heated at a temperature above the bias threshold temperature.

6. The magnetic field sensor according to claim 5 ,
wherein the bias direction is aligned at an angle between a direction parallel and a direction orthogonal to the one of the reference magnetization.

7. The magnetic field sensor according to claim 5 ,
wherein the current line comprises:
a first and second branch connecting in series a first and second subset of the plurality of MRAM cells, respectively; and
a third and fourth branch connecting in series a third and fourth subset of the plurality of MRAM cells, respectively;
the first and second branch being electrically connected in parallel to the third and fourth branch in a Wheatstone bridge circuit configuration.

8. The magnetic field sensor according to claim 7 ,
wherein the programming field line comprises:
a first programming field line portion configured for passing a first programming field current inducing a first programming magnetic field; and
a second field line portion arranged substantially orthogonal to the first programming field line portion and configured for passing a second programming field current inducing a second programming magnetic field;
the programming magnetic field resultant from the combination of the first and second programming magnetic field being adapted for aligning the bias magnetization of any one of the MRAM cells comprised in the subsets.

9. The magnetic field sensor according to claim 7 ,
wherein the bias direction of the MRAM cells in the first and second subset is about −45° and 45° relative to the one of the reference magnetization, respectively; and
wherein the bias direction of the MRAM cells in the third and fourth subset is about 135° and −135° relative to the one of the reference magnetization, respectively.

10. A method for programming a magnetic field sensor, comprising:
a current line electrically connecting in series a plurality of MRAM cells; each MRAM cell comprising a reference layer having a fixed reference magnetization, a sense layer having a sense magnetization that is freely orientable in an external magnetic field, a tunnel barrier comprised between the reference and sense layers, a biasing layer having a bias magnetization, and a biasing antiferromagnetic layer pinning the bias magnetization in a bias direction when MRAM cell is at temperature equal or below a bias threshold temperature; the bias magnetization being arranged for inducing a bias field adapted for biasing the sense magnetization in a direction opposed to the bias direction, such that the biased sense magnetization varies linearly in the presence of the external magnetic field, when the external magnetic field is oriented in a direction substantially perpendicular to the one of the reference magnetization
the current line being arranged for passing a heating current adapted for heating the MRAM cells above the bias threshold temperature; and
a programming field line for passing a programming field current inducing a magnetic field adapted for aligning the bias magnetization of the MRAM cells in the bias direction, when the MRAM cell is heated at a temperature above the bias threshold temperature;
the method comprising:
heating any one of the plurality of MRAM cells to a temperature above the bias threshold temperature such as to free the bias magnetization in said any one of the plurality of MRAM cells;
aligning the bias magnetization of the heated MRAM cell in the bias direction; and
cooling said heated MRAM cell to a temperature below the bias threshold temperature such as to pin the bias magnetization in the bias direction.

11. The method according to claim 10 ,
wherein said heating any one of the plurality of MRAM cells comprises applying a heating voltage pulse across the current line, or passing a heating current in the current line.

12. The method according to claim 10 ,
wherein said aligning the bias magnetization comprises passing a programming field current inducing a magnetic field adapted for aligning the bias magnetization.

13. The method according to claim 10 , wherein the current line comprises a first and second branch connecting in series a first and second subset of the plurality of MRAM cells, respectively; and a third and fourth branch connecting in series a third and fourth subset of the plurality of MRAM cells, respectively; the first and second branch being electrically connected in parallel to the third and fourth branch in a Wheatstone bridge circuit configuration;
and wherein the method comprises:
performing the steps of heating, aligning the bias magnetization and cooling sequentially for the MRAM cells comprised in the fir

Assignees

• Crocus Technology Sa

Inventors

• Stainer Quentin

Classifications

• G11C11/1673

  Reading or sensing circuits or methods · CPC title

• G01R33/098 Primary

  comprising tunnel junctions, e.g. tunnel magnetoresistance sensors · CPC title

• G11C11/1675 Primary

  Writing or programming circuits or methods · CPC title

• G11C11/16

  using elements in which the storage effect is based on magnetic spin effect · CPC title

• G11C11/161

  details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell · CPC title