Process measuring device for a measuring and control technology

Patent metadata

Field	Value
Publication number	US-9903909-B2
Application number	US-31243407-A
Country	US
Kind code	B2
Filing date	Oct 15, 2007
Priority date	Nov 10, 2006
Publication date	Feb 27, 2018
Grant date	Feb 27, 2018

Abstract

An electronic device including electronics arranged in an electronics compartment and having electronic and/or electromechanical components. The device automatically detects and/or monitors wear of its electronic and/or electromechanical components and includes an apparatus for detecting and/or monitoring wear of the electronic and/or electromechanical components. Included is at least one element arranged in the electronics compartment. This element is independent of the electronics and has at least one physical property, which changes irreversibly as a function of wear of the element. The apparatus further includes a circuit for measuring the physical property, and an evaluating unit, which, based on the measured physical property, detects and/or monitors wear of the element and makes available a wear-dependent output signal.

First claim

The invention claimed is:

1. A process measuring device for a measuring- and control-technology, which is mounted on a container, comprising:
a housing;
electronics arranged in an electronics compartment in said housing and having a plurality of electronic and/or electromechanical components; and
an apparatus for detecting and/or monitoring wear of said electronic and/or electromechanical components caused by aggressive media penetrating into the electronics compartment and/or high temperatures and/or rapid temperature fluctuations and/or ionizing rays and/or vibration and/or shock, said apparatus includes at least one element, arranged in said electronics compartment in said housing and independent of said electronics, wherein:
said at least one element has at least one physical property, which changes irreversibly as a function of wear of said element, and independently of an operating state of the electronics;
said apparatus further includes a circuit for measuring said at least one physical property, and an evaluating unit;
based on the measured physical property, said evaluating unit detects and/or monitors wear of said element and makes available a wear-dependent output signal,
said output signal being fed directly to a display or a control room so that the output signal is accessible outside for an operator, without an opening of the measuring device being needed; and
said output signal provides an operator with the opportunity for long-term planning of maintenance intervals, or, in given cases, of required replacement of the process measuring device.

2. The process measuring device as claimed in claim 1 , wherein:
said at least one element is arranged at an exposed position.

3. The process measuring device as claimed in claim 1 , wherein:
said at least one element includes a plastic block, which is enveloped, at least partially, by a coating of base metal.

4. The process measuring device as claimed in claim 1 , wherein:
said at least one element is a discretely constructed capacitor, and the property is a capacitance of the capacitor.

5. The process measuring device as claimed in claim 1 , wherein:
said at least one element is a resistor.

Assignees

• Spanke Dietmar
• Schroth Herbert
• Hammer Manfred
• Endress Hauser Gmbh Co Kg

Inventors

• Spanke Dietmar
• Schroth Herbert
• Hammer Manfred

Classifications

• G01R31/2849 Primary

  Environmental or reliability testing, e.g. burn-in or validation tests (of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855) · CPC title