Eddy current testing probe and eddy current testing method

Patent metadata

Field	Value
Publication number	US-9903838-B2
Application number	US-201414179225-A
Country	US
Kind code	B2
Filing date	Feb 12, 2014
Priority date	Oct 22, 2013
Publication date	Feb 27, 2018
Grant date	Feb 27, 2018

Abstract

An eddy current testing probe includes: exciter coils 2 including a first exciter coil 2 a and a second exciter coil 2 b identical with each other and arranged in point symmetry, and each of which generates an alternating magnetic field to generate an eddy current in a test object; and detector coils 1 including a first detector coil 1 a and a second detector coil 1 b identical with each other, arranged in point symmetry, arranged in phase, and differentially connected to each other. The exciter coils 2 and the detector coils 1 are arranged on a single plane. A center of symmetry O on a center line of symmetry CL 2 of the coils 2 a, 2 b , is identical with a center of symmetry O on a center line of symmetry CL 1 of the coils 1 a, 1 b , and the CL 1 intersects with the CL 2 at a right angle.

First claim

What is claimed is:

1. An eddy current testing probe comprising a plurality of probe units arranged in a predetermined direction, each probe unit comprising:
exciter coils including a first exciter coil and a second exciter coil which are identical with each other and arranged in point symmetry, and each of which generates an alternating magnetic field to generate an eddy current in a test object; and
detector coils including a first detector coil and a second detector coil which are identical with each other, arranged in point symmetry, and differentially connected to each other, wherein
the exciter coils and the detector coils are arranged on a single surface without overlapping with one another, and
the exciter coils and the detector coils are arranged with a first center line of symmetry of the first detector coil and the second detector coil intersecting with a second center line of symmetry of the first exciter coil and the second exciter coil at a right angle, and
a first center of symmetry on the first center line of symmetry and a second center of symmetry on the second center line of symmetry are identical with each other, as seen in a plane view of the single surface,
wherein a direction of an eddy current obtained by combining eddy currents generated by the first exciter coil and the second exciter coil is the same as a direction of the first center line of symmetry, and
wherein the eddy currents generated by the first exciter coil and the second exciter coil are combined to generate an eddy current (EC (D EC )) in the direction of the first center line of symmetry due to the arrangement of the first exciter coil and the second exciter coil which are identical with each other and arranged in point symmetry.

2. The eddy current testing probe according to claim 1 , wherein the first exciter coil and the second exciter coil, and the first detector coil and the second detector coil are each formed by a coil having a rectangle shape in a plane view.

3. The eddy current testing probe according to claim 1 , wherein all of the first exciter coil, the second exciter coil, the first detector coil, and the second detector coil are formed by identical coils.

4. An eddy current testing method for performing flaw detection to a test object by using the eddy current testing probe according to claim 1 , wherein a flaw detection process is performed in an order in which the plurality of probe units are arranged, the flaw detection process including:
an eddy current generating step of providing AC currents to the first exciter coil and the second exciter coil to generate eddy currents in the test object; and
a detecting step of detecting presence/absence of a flaw in the test object based on a voltage difference generated between the first detector coil and the second detector coil by the eddy currents.

5. The eddy current testing method according to claim 4 , wherein all of the first exciter coil, the second exciter coil, the first detector coil, and the second detector coil are formed by identical coils,
when the flaw detection process is performed with a following probe unit after performing the flaw detection process with a preceding probe unit,
the exciter coil made to function for excitation in the precedent flaw detection process is made to function for detection in the following flaw detection process, and
the detector coil made to function for detection in the precedent flaw detection process is made to function for excitation in the following flaw detection process.

Assignees

• Mitsubishi Heavy Ind Ltd

Inventors

• Kurokawa Masaaki
• Shichida Tomonori

Classifications

• G01N27/904 Primary

  with two or more sensors · CPC title

• G01N27/9013

  Arrangements for scanning · CPC title