Spectral measurement device and analysis apparatus

Patent metadata

Field	Value
Publication number	US-9903758-B2
Application number	US-201715606298-A
Country	US
Kind code	B2
Filing date	May 26, 2017
Priority date	Jun 3, 2016
Publication date	Feb 27, 2018
Grant date	Feb 27, 2018

Abstract

A spectral measurement device includes a light reflection grating having a plurality of movable gratings and a movable grating drive unit that displaces the movable gratings to alter a grating pattern of the light reflection grating, a light detecting element that detects light incident on the light reflection grating, a storage unit storing a relationship between a light quantity to be detected by the light detecting element and corresponding light intensities at differing wavelengths for different grating patterns, and a computation unit that calculates light intensities at the differing wavelengths of the light incident on the light reflection grating based on the light quantity of the incident light detected by the light detecting element for each of the different grating patterns by altering the grating pattern based on the relationship between the light quantity and the corresponding light intensities for the different grating patterns stored in the storage unit.

First claim

What is claimed is:

1. A spectral measurement device comprising:
a light reflection grating including a plurality of movable gratings arranged side by side along a lateral direction to have a same length in a longitudinal direction, and a movable grating drive power source configured to displace the plurality of movable gratings, wherein a grating pattern of the light reflection grating is altered by the movable grating drive power source displacing at least one of the plurality of movable gratings;
a light detecting element configured to detect light that is incident on the light reflection grating and reflected by the light reflection grating;
a memory storing a relationship between a light quantity to be detected by the light detecting element and corresponding light intensities at a plurality of different wavelengths for each of a plurality of different grating patterns of the light reflection grating; and
a processor configured to calculate light intensities at the plurality of different wavelengths of the light incident on the light reflection grating based on a detected light quantity of the incident light detected by the light detecting element for each of the plurality of different grating patterns by altering the grating pattern of the light reflection grating based on the relationship between the light quantity to be detected by the light detecting element and the corresponding light intensities at the plurality of different wavelengths for each of the plurality of different grating patterns stored in the memory.

2. The spectral measurement device according to claim 1 , wherein
the light reflection grating includes a substrate having a recess formed therein and a fixed electrode formed on a bottom surface of the recess;
at least one longitudinal direction side end portion of each of the plurality of movable gratings is supported on an upper surface of an outer edge of the recess formed in the substrate; and
the movable grating drive power source applies a voltage between the fixed electrode and at least one of the movable gratings such that an electrostatic force produced by the applied voltage causes the at least one of the movable gratings to be displaced toward the fixed electrode.

3. The spectral measurement device according to claim 1 , wherein
the light reflection grating includes a substrate, a fixing support portion formed on the substrate, and a fixed electrode formed on a surface of the substrate;
at least one longitudinal direction side end portion of each of the plurality of movable gratings is supported by the fixing support portion; and
the movable grating drive power source applies a voltage between the fixed electrode and at least one of the movable gratings such that an electrostatic force produced by the applied voltage causes the at least one of the movable gratings to be displaced toward the fixed electrode.

4. The spectral measurement device according to claim 1 , wherein
the light reflection grating includes a substrate and a fixing support portion formed on the substrate;
at least one longitudinal direction side end portion of each of the plurality of movable gratings is supported by the fixing support portion;
each of the plurality of movable gratings includes a piezoelectric element; and
the movable grating drive power source applies a voltage to the piezoelectric element of at least one of the movable gratings such that the at least one of the movable gratings including the piezoelectric element that is applied the voltage is displaced.

5. The spectral measurement device according to claim 1 , wherein
the light reflection grating includes a substrate and a fixing support portion formed on the substrate;
at least one longitudinal direction side end portion of each of the plurality of movable gratings is supported by the fixing support portion;
each of the plurality of movable gratings is formed of a piezoelectric material; and
the movable grating drive power source applies a voltage to at least one of the movable gratings such that the at least one of the movable gratings that is applied the voltage is displaced.

6. The spectral measurement device according to claim 1 , further comprising:
a light entrance portion into which light is incident;
a first reflecting portion that reflects the light incident through the light entrance portion and causes the light to be incident on the light reflection grating; and
a second reflecting portion that reflects the light reflected by the light reflection grating and causes the light to be incident on the light detecting element.

7. The spectral measurement device according to claim 1 , further comprising:
a grating control unit that controls a voltage applied by the movable grating drive power source such that the grating pattern of the light reflection grating is arranged into one of the plurality of different grating patterns stored in the memory.

8. The spectral measurement device according to claim 1 , wherein
each of the plurality of movable gratings includes a grating portion, a connecting portion, and a movable portion; and
the grating pattern of the light reflection grating is altered by displacing the movable portion of at least one of the movable gratings.

9. An analysis apparatus comprising:
the spectral measurement device according to claim 1 ; and
a light source;
wherein the light source irradiates light on an object to be measured, the object reflects the light from the light source, and the spectral measurement device spectrally separates the light reflected by the object to obtain a wavelength spectrum of the object.

10. A light detector comprising:
a plurality of movable gratings arranged side by side along a lateral direction to have a same length in a longitudinal direction;
a light reflection grating having a grating pattern that is altered by displacing at least one of the plurality of movable gratings; and
a light detecting element configured to detect light that is incident on the light reflection grating and reflected by the light reflection grating;
wherein the grating pattern of the light reflection grating is altered based on a relationship between a light quantity to be detected by the light detecting element and corresponding light intensities at a plurality of different wavelengths for each of a plurality of different grating patterns.

11. The spectral measurement device according to claim 2 , further comprising:
a light entrance portion into which light is incident;
a first reflecting portion that reflects the light incident through the light entrance portion and causes the light to be incident on the light reflection grating; and
a second reflecting portion that reflects the light reflected by the light reflection grating and causes the light to be incident on the light detecting element.

12. The spectral measurement device according to claim 3 , further comprising:
a light entrance portion into which light is incident;
a first reflecting portion that reflects the light incident through the light entrance portion and causes the light to be incident on the light reflection grating; and
a second reflecting portion that reflects the light reflected by the light reflection grating and causes the light to be incident on the light detecting element.

13. The spectral measurement device according to claim 4 , further comprising:
a light entrance portion into which light is incident;
a first reflecting portion that reflects the light incident through the light entrance portion and causes the light to be incident on the light reflection grating; and
a second reflecting portion that reflects the light ref

Assignees

• Azumi Junichi
• Noguchi Hidetaka
• Kato Hidenori
• Suematsu Masashi
• Fujishima Masayuki
• Ricoh Co Ltd

Inventors

• Azumi Junichi
• Noguchi Hidetaka
• Kato Hidenori
• Suematsu Masashi
• Fujishima Masayuki

Classifications

• G01J3/18 Primary

  using diffraction elements, e.g. grating (gratings per se G02B) · CPC title

• G01J3/021

  using plane or convex mirrors, parallel phase plates, or particular reflectors · CPC title

• G01J3/28

  Investigating the spectrum (using colour filters G01J3/51) · CPC title

• G01J3/0256

  Compact construction · CPC title

• G01J3/06

  Scanning arrangements {arrangements for order-selection} · CPC title