Electroluminescent diode having delayed florescence quantum dot

Patent metadata

Field	Value
Publication number	US-9899619-B2
Application number	US-201615374450-A
Country	US
Kind code	B2
Filing date	Dec 9, 2016
Priority date	Dec 10, 2015
Publication date	Feb 20, 2018
Grant date	Feb 20, 2018

Abstract

The present invention relates to a delayed fluorescence-quantum dot (QD) electroluminescent diode, the delayed fluorescence-quantum dot electroluminescent diode includes an anode, a cathode, and a light emitting layer located between the anode and the cathode, and the light emitting layer includes a QD and a delayed fluorescence material which supplies energy to the QD.

First claim

What is claimed is:

1. A delayed fluorescence-quantum dot electroluminescent diode comprising:
an anode;
a cathode; and
a light emitting layer located between the anode and the cathode,
wherein the light emitting layer comprises a quantum dot layer including a quantum dot and a delayed fluorescence layer including a delayed fluorescence material, which is disposed above or below the quantum dot layer, and which supplies energy to the quantum dot.

2. The diode of claim 1 , wherein the light emitting layer comprises a mixture of the quantum dot and the delayed fluorescence material.

3. The diode of claim 2 , wherein the quantum dot and the delayed fluorescence material is mixed at a mass ratio of 1:2 to 1:100.

4. The diode of claim 2 , wherein excited singlet energy of the delayed fluorescence material is equal to or greater than excited singlet energy of the quantum dot.

5. The diode of claim 2 , wherein the light emitting layer further includes a host material which supplies the energy to the delayed fluorescence material.

6. The diode of claim 5 , wherein excited singlet energy or excited triplet energy of the host material is equal to or greater than excited singlet energy of the delayed fluorescence material.

7. The diode of claim 1 , wherein the quantum dot layer is located between the delayed fluorescence layer and the cathode.

8. The diode of claim 1 , wherein a recombination region of an electron injected through the cathode and a hole injected through the anode is formed in the delayed fluorescence layer.

9. The diode of claim 8 , wherein a thickness of the quantum dot layer is equal to or greater than that of the delayed fluorescence layer.

10. The diode of claim 1 , wherein the delayed fluorescence layer further comprises a host material which supplies energy to the delayed fluorescence material.

11. The diode of claim 10 , wherein excited singlet energy or excited triplet energy of the host material is equal to or greater than excited singlet energy of the delayed fluorescence material.

12. The diode of claim 10 , wherein the delayed fluorescence material and the host material are mixed at a mass ratio of 1:1 to 1:100.

13. A method of manufacturing a delayed fluorescence-quantum dot electroluminescent diode, comprising:
forming an anode;
forming a light emitting layer; and
forming a cathode,
wherein the light emitting layer comprising a mixture of a quantum dot layer including a quantum dot and a delayed fluorescence layer, which is disposed above or below the quantum dot layer, including a delayed fluorescence material which supplies energy to the quantum dot is formed to be located between the anode and the cathode.

14. A method of manufacturing a delayed fluorescence-quantum dot electroluminescent diode, comprising:
forming an anode;
forming a light emitting layer on the anode; and
forming a cathode on the light emitting layer,
wherein the light emitting layer is formed by stacking a quantum dot layer including a quantum dot and a delayed fluorescence layer including a delayed fluorescence material which supplies energy to the quantum dot, and the quantum dot layer is located between the delayed fluorescence layer and the cathode.

Assignees

• Research & Business Found Sungkyunkwan Univ

Inventors

• Lee Jun Yeob
• Chae Heeyeop
• Kim Namhun
• JEON Sangkyu

Classifications

• H01L51/5004

  Electricity · mapped topic

• H01L2251/552

  Electricity · mapped topic

• H01L51/502 Primary

  Electricity · mapped topic

• H01L51/56

  Electricity · mapped topic

• H10K2101/20

  Delayed fluorescence emission · CPC title