Active matrix substrate and manufacturing method of the same
US-2015001530-A1 · Jan 1, 2015 · US
US9891518B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9891518-B2 |
| Application number | US-201414547399-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 19, 2014 |
| Priority date | Jul 18, 2014 |
| Publication date | Feb 13, 2018 |
| Grant date | Feb 13, 2018 |
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A mask, comprising an opaque region, a first semi-transparent region, and a second semi-transparent region. The transmittance of the second semi-transparent region is less than that of the first semi-transparent region. The mask solves the over-etching problem caused by the difference between the thicknesses of photoresist in different regions.
Opening claim text (preview).
What is claimed is: 1. A mask, comprising: a substrate; an opaque region; a first semi-transparent region; a second semi-transparent region; a semi-transparent film layer provided at portions of the substrate corresponding to the first semi-transparent region and the second semi-transparent region; and a light shielding layer provided in the portion of the semi-transparent film layer corresponding to the second semi-transparent region; wherein the light shielding layer is disposed below the substrate and covered by the portion of the semi-transparent film layer corresponding to the second semi-transparent region, and has a width 1-2 μm less than resolution size of the exposure machine, to allow light from a light source to be diffracted by the light shielding layer when it irradiates on the second semi-transparent region. 2. The mask according to claim 1 , wherein transmittance of the second semi-transparent region is less than that of the first semi-transparent region, and the portions of semi-transparent film layer that cover the first semi-transparent region and the second semi-transparent region have same transmittance. 3. The mask according to claim 2 , wherein the light shielding layer is made of metal material.
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