Tip clearance measurement system

Patent metadata

Field	Value
Publication number	US-9891037-B2
Application number	US-201715588125-A
Country	US
Kind code	B2
Filing date	May 5, 2017
Priority date	Oct 9, 2013
Publication date	Feb 13, 2018
Grant date	Feb 13, 2018

Abstract

A tip clearance measurement system (TCMS) includes a probe and sensing circuitry. The probe directs microwave signals toward a turbine blade and receives microwave signals reflected by the turbine blade. The sensing circuitry includes a switch having a first state in which a main frequency is provided at an output of the switch and a second state in which a reference frequency is provided at an output of the switch. The sensing circuitry further includes a first conditioning circuit that receives a frequency provided at the output of the switch and provides a conditioned frequency to the probe and a second conditioning circuit that receives both the conditioned frequency provided by the first conditioning circuit and a reflected frequency received by the probe, and provides a conditioned output based on the conditioned frequency and reflected frequency.

First claim

The invention claimed is:

1. A method of measuring tip clearance in a turbine, the method comprising:
controlling a switch to a first state to apply a main frequency signal to a probe via a first conditioning circuit, wherein the first conditioning circuit provides a first conditioned signal to a probe;
maintaining the switch in the first state while a first reflected signal is received by the probe and conditioned by a second conditioning circuit, wherein the second conditioning circuit conditions the first reflected signal based on the first conditioned signal to provide a first output;
controlling the switch to a second state to apply a reference frequency signal to the first conditioning circuit, wherein the first conditioning circuit provides a second conditioned signal to the probe;
maintaining the switch in the second state while a second reflected signal is received by the probe and conditioned by the second conditioning circuit, wherein the second conditioning circuit conditions the second reflected signal based on the second conditioned signal to provide a second output; and
calculating tip clearance based on the first output and the second output.

2. The method of claim 1 , further comprising:
controlling an amount of time between controlling the switch to the first state and controlling the switch to the second state.

3. The method of claim 1 ,
wherein the first conditioning circuit provides both the first and second conditioned signals to the probe via a coaxial cable.

4. The method of claim 1 ,
wherein controlling the switch to the first state, maintaining the switch in the first state, controlling the switch to a second state, and maintaining the switch in the second state are performed by a controller that selectively controls the switch.

5. The method of claim 1 ,
wherein controlling a switch to a first state to apply a main frequency signal to a probe is performed prior to controlling the switch to a second state to apply a reference frequency signal to the first conditioning circuit.

6. The method of claim 1 ,
wherein the second conditioning circuit conditions the first reflected signal based on the first conditioned signal to provide the first output in an I-Q reference frame.

7. The method of claim 1 , further comprising:
storing the first output and the second output.

8. The method of claim 1 ,
wherein calculating the tip clearance based on the first output and the second output comprises comparing the first output and the second output to determine the tip clearance.

Assignees

• Hamilton Sundstrand Corp

Inventors

• Singh Bhupindar
• Mcbrien Gary M

Classifications

• G01B7/14 Primary

  for measuring distance or clearance between spaced objects or spaced apertures (G01B7/30 takes precedence) · CPC title

• G01B15/00

  Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons (characterised by the use of optical techniques G01B9/00, G01B11/00) · CPC title

• G01M15/14

  Testing gas-turbine engines or jet-propulsion engines · CPC title