Systems and methods for ion isolation

Patent metadata

Field	Value
Publication number	US-9875885-B2
Application number	US-201514709387-A
Country	US
Kind code	B2
Filing date	May 11, 2015
Priority date	May 11, 2015
Publication date	Jan 23, 2018
Grant date	Jan 23, 2018

Abstract

A mass spectrometer includes a radio frequency ion trap and a controller. The controller is configured to cause an ion population to be injected into the radio frequency ion trap and supply an isolation waveform to the radio frequency ion trap. The isolation waveform has at least one notch at a target mass-to-charge ratio and a frequency profile determined to eject unwanted ions at a plurality of frequencies in a substantially similar amount of time.

First claim

What is claimed is:

1. A mass spectrometer comprising:
an ion source configured to produce an ion population, the ion population including target ions within at least one target mass-to-charge ratio region and unwanted ions outside of the target mass-to-charge ratio regions;
a radio frequency ion trap; and
a mass spectrometer controller configured to:
cause at least a portion of the ion population to be injected into the radio frequency ion trap; and
apply an isolation waveform to the radio frequency ion trap to trap the target ions and eject the unwanted ions, the isolation waveform having a frequency profile with a frequency dependent amplitude to apply an excitation force to unwanted ions at a plurality of frequencies using a minimum voltage level at which all unwanted ions are ejected during the duration of the waveform or in a substantially fixed amount of time at each of the plurality of frequencies.

2. The mass spectrometer of claim 1 , wherein the mass spectrometer controller is further configured to apply a waveform with flat frequency profile to calibrant ions in the radio frequency ion trap and identify an amplitude required to eject ions at a plurality of mass-to-charge ratios to empirically determine the frequency profile of the isolation waveform.

3. The mass spectrometer of claim 1 , wherein the controller is further configured to apply a time domain waveform amplitude gain to the isolation waveform.

4. The mass spectrometer of claim 3 , wherein the time domain waveform amplitude gain is based on a characterization of the dependence of amplitude versus mass-to-charge at a reference q value.

5. The mass spectrometer of claim 1 , wherein the isolation waveform includes a plurality of notches at a plurality of target mass-to-charge ratios.

6. The mass spectrometer of claim 5 , wherein each of the plurality of notches have a width necessary to exceed a threshold isolation efficiency for the corresponding target mass-to-charge ratio.

7. The mass spectrometer of claim 5 , wherein a frequency error correction is applied to the location of at least one notch within the isolation waveform.

8. The mass spectrometer of claim 1 , wherein the frequency profile is based on a characterization of the minimum energy needed to eject unwanted ions at a plurality of frequencies from the radio frequency trap in the fixed amount of time.

9. A mass spectrometer comprising:
an ion source configured to produce an ion population including target ions within at least one target mass-to-charge ratio region and unwanted ions outside of the target mass-to-charge ratio regions;
a storage device having data describing a frequency profile stored therein, the frequency response profile including a minimum voltage level at which all ions oscillating at a particular frequency are ejected from the RF ion trap during the duration of the waveform or in a substantially fixed amount of time for a plurality of frequencies; and
a radio frequency ion trap configured to:
receive the ion population; and
apply an isolation waveform to eject the unwanted ions of the ion population, the isolation waveform having at least one notch at the at least one target mass-to-charge ratio region, the isolation waveform having a frequency profile based on the data.

10. The mass spectrometer of claim 9 , wherein the frequency profile is based on a characterization of an amplitude required to eject calibrant ions at a plurality of mass-to-charge ratios from the trap using a waveform with a flat frequency profile.

11. The mass spectrometer of claim 9 , wherein the isolation waveform includes a time domain waveform amplitude gain.

12. The mass spectrometer of claim 11 , wherein the time domain waveform amplitude gain is based on a characterization of the dependence of amplitude versus mass-to-charge at a reference q value.

13. The mass spectrometer of claim 12 , wherein the storage device is configured to store the dependence of amplitude versus mass-to-charge at a reference q value .

14. The mass spectrometer of claim 9 , wherein the isolation waveform includes a plurality of notches at a plurality of target mass-to-charge ratios.

15. The mass spectrometer of claim 14 , wherein each of the plurality of notches have a width sufficient to exceed a threshold isolation efficiency for the corresponding target mass-to-charge ratio.

16. The mass spectrometer of claim 9 , wherein a frequency error correction is applied to the location of the at least one notch within the isolation waveform.

17. The mass spectrometer of claim 9 , wherein the isolation waveform applies an excitation force to ions at a plurality of frequencies to eject unwanted ions in substantially the same amount of time.

18. The mass spectrometer of claim 9 , wherein the frequency profile is based on a characterization of the minimum energy necessary to eject unwanted ions at a plurality of frequencies in substantially the same amount of time.

Assignees

• Thermo Finnigan Llc

Inventors

• Remes Philip M
• Schwartz Jae C

Classifications

• H01J49/0031 Primary

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/4205

  Device types · CPC title

• H01J49/025

  Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29) · CPC title

• H01J49/004 Primary

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title

• H01J49/0027

  Methods for using particle spectrometers · CPC title