Synthetic test circuit for valve performance test of HVDC

Patent metadata

Field	Value
Publication number	US-9869728-B2
Application number	US-201615187446-A
Country	US
Kind code	B2
Filing date	Jun 20, 2016
Priority date	Jun 18, 2015
Publication date	Jan 16, 2018
Grant date	Jan 16, 2018

Abstract

Embodiments of a synthetic test circuit for a valve performance test of high-voltage direct current (HVDC) are presented. In some embodiments, the synthetic test circuit comprises a resonance circuit configured to comprise a first test valve to test an operation of an inverter mode and a second test valve to test an operation of a rectifier mode. The synthetic test circuit may comprise a power supply (P/S) configured to provide the resonance circuit with an operating voltage. The synthetic test circuit may comprise a direct current/direct current (DC/DC) converter configured to bypass a DC offset current of the resonance circuit. The first test valve may be an inverter unit, which may have a positive DC current offset. Further, the second test valve may be a rectifier unit, which may have a negative DC current offset.

First claim

What is claimed is:

1. A synthetic test circuit for a valve performance test of HVDC, comprising:
a resonance circuit comprising a first test valve configured to test an operation of an inverter mode and a second test valve configured to test an operation of a rectifier mode;
a power supply (P/S) configured to provide the resonance circuit with an operating voltage; and
a DC/DC converter configured to bypass a DC offset current of the resonance circuit,
wherein each of the first and second test valves comprises a plurality of sub-modules, each sub-module includes a plurality of IGBTs and a capacitor,
wherein a current flowing in a sub-module disposed in the first test valve includes a positive DC current offset, and
wherein a current flowing in a sub-module disposed in the second test valve includes a negative DC current offset.

2. The synthetic test circuit of claim 1 ,
wherein the resonance circuit comprises a first inductor(L 1 ) and a second inductor(L 2 ) that are serially connected between the first and second test valves, a first auxiliary valve and a second auxiliary valve that are serially connected between the first and second test valves, and a first capacitor(C 3 ) whose one end is connected to a contact between the first inductor(L 1 ) and the second inductor(L 2 ), and whose other end is connected to a contact between the first auxiliary valve and the second auxiliary valve.

3. The synthetic test circuit of claim 2 , wherein the first inductor is connected between IGBTs of the first test valve, the second inductor is connected between IGBTs of the second test valve, the first auxiliary valve is connected between the IGBT and the capacitor of the first test valve, and the second auxiliary valve is connected between the IGBT and the capacitor of the second test valve.

4. The synthetic test circuit of claim 2 , wherein the sub-modules comprised in the first and second test valves each comprise two serially connected IGBTs, and a capacitor connected to the IGBTs in parallel.

5. The synthetic test circuit of claim 2 , wherein the first auxiliary valve comprises a first IGBT, and a second IGBT and a capacitor that are connected to the first IGBT in parallel and are serially connected with each other, and
wherein the second auxiliary valve comprises a third IGBT, and a fourth IGBT and a capacitor that are connected to the third IGBT in parallel and are serially connected with each other.

6. The synthetic test circuit of claim 5 , wherein the DC/DC converter is connected to both ends of the capacitor comprised in the first auxiliary valve and to both ends of the capacitor comprised in the second auxiliary valve.

7. The synthetic test circuit of claim 5 , wherein the power supply is connected to both ends of the capacitor comprised in the second auxiliary valve to charge the test valve and the auxiliary valve.

8. The synthetic test circuit of claim 5 , wherein the first and second IGBTs are connected in antiparallel, and the third and fourth IGBTs are connected in antiparallel.

9. The synthetic test circuit of claim 2 , wherein the first and second inductors have the same value.

10. The synthetic test circuit of claim 1 , wherein the power supply provides the first and second test valves with an operating voltage.

Assignees

• Lsis Co Ltd
• Lsis Co Ltd

Inventors

• Baek Seung Taek
• Nho Eui Cheol
• Jung Jae Hun
• Lee Jin Hee
• Chung Yong Ho

Classifications

• G01R31/40 Primary

  Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title

• G01R31/3333

  Apparatus, systems or circuits therefor · CPC title

• G01R31/3272 Primary

  Apparatus, systems or circuits therefor (G01R31/3275 takes precedence) · CPC title

• G01R31/3336

  Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions · CPC title