System for non-destructive testing and method for processing data generated therein

Patent metadata

Field	Value
Publication number	US-9869645-B2
Application number	US-201113116930-A
Country	US
Kind code	B2
Filing date	May 26, 2011
Priority date	May 26, 2011
Publication date	Jan 16, 2018
Grant date	Jan 16, 2018

Abstract

Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

First claim

What is claimed is:

1. A testing system, comprising:
a scanner device, wherein the scanner device comprises a computed tomography (CT) scanner; and
a control unit coupled to the scanner device, the control unit operatively configured to generate one or more control signals to which the scanner device responds to generate a volumetric representation of a part-under-inspection,
wherein the control unit is further configured to locate a region of interest comprising a defect in the volumetric representation and a volume immediately proximate the defect in the volumetric representation and to generate a formatted volumetric representation having less data than the volumetric representation, generating the formatted volumetric representation comprising deleting data found outside the region of interest in the volumetric representation.

2. A testing system according to claim 1 , further comprising a conveyance device that is configured to transport the part-under-inspection to the scanner device.

3. A testing system according to claim 1 , further comprising a data storage device, wherein the control unit is further configured to transfer data respecting the formatted volumetric representation to the data storage device.

4. A testing system according to claim 3 , wherein the data storage device is remote from the control unit.

5. A testing system according to claim 3 , wherein the control unit is further configured to establish the region of interest around the defect and to compress data outside of the region of interest.

6. A testing system according to claim 1 , further comprising a workstation, wherein the workstation is configured to render an image of the part-under-inspection, and wherein the image comprises the formatted volumetric representation and a reference volumetric representation that provides peripheral details of the part-under-inspection.

7. A testing system according to claim 1 , wherein the control unit is integrated into the scanner device.

8. A method for reducing data in a non-destructive testing system, said method comprising the steps of:
performing, by a processor, a scan of a part-under-inspection;
generating a volumetric representation from the scan;
identifying, by the processor, a defect in the volumetric representation;
establishing a region of interest around the defect in the volumetric representation and a volume immediately proximate the defect; and
generating a formatted volumetric representation having less data than the volumetric representation, generating the formatted volumetric representation comprising deleting data found outside the region of interest in the volumetric representation.

9. The method of claim 8 , further comprising the step of formatting data corresponding to each of the data inside the region of interest and outside the region of interest.

10. The method of claim 9 , further comprising the step of applying a first format to data corresponding to data inside the region of interest.

11. The method of claim 10 , further comprising the step of applying a second format to data corresponding to data outside the region of interest.

12. The method according to claim 11 , wherein the first format is different from the second format.

13. The method of claim 8 , further comprising the step of compressing data outside the region of interest.

14. The method of claim 13 , further comprising the step of compressing each of the data inside and data outside of the region of interest.

15. The method of claim 8 , further comprising the steps of:
generating a reference volumetric representation; and
rendering an image of the part-under-inspection using the formatted volumetric representation and the reference volumetric representation.

16. The method of claim 15 , further comprising the step of formatting the reference volumetric representation so as to have less data than the volumetric representation.

17. The method of claim 8 , wherein the scan utilizes a computed tomography (CT) scanner.

18. The method of claim 8 , further comprising the step of receiving an input respecting parameters for the region of interest.

Assignees

• Stuke Ingo
• Guenzler Til Florian
• Wuestenbecker Michael
• Beyer Andreas
• Gen Electric

Inventors

• Stuke Ingo
• Guenzler Til Florian
• Wuestenbecker Michael
• Beyer Andreas

Classifications

• G06T7/0004

  Industrial image inspection · CPC title

• G06T2207/30164

  Workpiece; Machine component · CPC title

• G01N2223/419

  computed tomograph · CPC title

• G01N23/046 Primary

  using tomography, e.g. computed tomography [CT] · CPC title