Polishing pad with foundation layer and window attached thereto

US9868185B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9868185-B2
Application numberUS-201514931737-A
CountryUS
Kind codeB2
Filing dateNov 3, 2015
Priority dateNov 3, 2015
Publication dateJan 16, 2018
Grant dateJan 16, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Polishing pads having a foundation layer and a window attached to the foundation layer, and methods of fabricating such polishing pads, are described. In an example, a polishing pad for polishing a substrate includes a foundation layer having a first modulus. A polishing layer is attached to the foundation layer and has a second modulus less than the first modulus. A first opening is through the polishing layer and a second opening is through the foundation layer. The first opening exposes at least a portion of the second opening and exposes a portion of the foundation layer. A window is disposed in the first opening and is attached to the exposed portion of the foundation layer.

First claim

Opening claim text (preview).

What is claimed is: 1. A polishing pad for polishing a substrate, the polishing pad comprising: a foundation layer having a first modulus; a polishing layer attached to the foundation layer and having a second modulus less than the first modulus; a first opening through the polishing layer and a second opening through the foundation layer, the first opening exposing at least a portion of the second opening and exposing a portion of the foundation layer; and a window disposed in the first opening and attached to the exposed portion of the foundation layer, wherein the window has a portion extending into the second opening, and wherein the window is attached to the exposed portion of the foundation layer by a snap-fit arrangement. 2. The polishing pad of claim 1 , wherein the first opening exposes the entire second opening. 3. The polishing pad or claim 1 , wherein the window is attached to the exposed portion of the foundation layer by an adhesive layer selected from the group consisting of a pressure sensitive adhesive (PSA) layer, a two-component epoxy layer, a UV-cured resin layer, a silicone-based adhesive layer, a transfer tape layer, and a hot melt layer. 4. The polishing pad of claim 3 , wherein the adhesive layer is a non-differential two-sided tape PSA layer. 5. The polishing pad of claim 3 , wherein the adhesive layer is a first two-sided tape PSA layer, and wherein the polishing layer is attached to the foundation layer using a second two-sided tape PSA layer having a thickness approximately the same as a thickness of the first two-sided tape PSA layer attaching the window to the foundation layer. 6. The polishing pad of claim 3 , wherein the adhesive layer is a differential two-sided tape PSA layer. 7. The polishing pad or claim 1 , wherein the window is attached to the exposed portion of the foundation layer by a welded region. 8. The polishing pad of claim 7 , wherein the welded region is a region selected from the group consisting of a spot weld region, a line weld region, and a multi-line weld region. 9. The polishing pad of claim 1 , further comprising: a sub pad attached to the foundation layer on a side of the foundation layer opposite the polishing layer; and a third opening through the sub pad, the third opening substantially sized and aligned with the second opening. 10. The polishing pad of claim 1 , wherein, from a plan view perspective of the polishing layer, the window has substantially a same shape as the first opening. 11. The polishing pad of claim 10 , wherein the shape is selected from the group consisting of a circle, an oval, a square, a rectangle, and a rectangle having rounded corners. 12. The polishing pad of claim 10 , wherein a perimeter of the window is reduced in size at all portions of the perimeter by an amount approximately in the range of 5-15 mils relative to a perimeter of the first opening. 13. The polishing pad of claim 1 , wherein, with respect to the foundation layer, the window has an uppermost surface lower than an uppermost surface of the polishing layer. 14. The polishing pad of claim 1 , wherein, from a plan view perspective of the polishing layer, the first opening has substantially a same shape as the second opening, and wherein a perimeter of the second opening is reduced in size at all portions of the perimeter by an amount approximately in the range of 10-500 mils relative to a perimeter of the first opening. 15. The polishing pad of claim 14 , wherein the perimeter of the second opening is reduced in size at all portions of the perimeter by an amount approximately in the range of 100-300 mils relative to the perimeter of the first opening. 16. The polishing pad of claim 1 , wherein the polishing layer is attached to the foundation layer by an adhesive layer. 17. The polishing pad of claim 1 , wherein the polishing layer is attached to the foundation layer through covalent bonding of the polishing layer to the foundation layer. 18. The polishing pad of claim 1 , wherein the window comprises a material selected from the group consisting of a polyethylene terephthalate material, a polyurethane material, a cyclic olefin copolymer material, a polycarbonate material, a polyester material, a polypropylene material, and a polyethylene material. 19. The polishing pad of claim 1 , wherein the window comprises a material transparent to a broad spectrum irradiation approximately in the range of 300-800 nanometers. 20. The polishing pad of claim 1 , wherein the foundation layer has an energy loss factor of less than approximately 100 KEL at 1/Pa at 40° C. 21. The polishing pad of claim 1 , wherein the foundation layer comprises a material selected from the group consisting of a polycarbonate material, an epoxy board material, a polyurethane material, a composite fiber board, a polymethylmethacrylate (PMMA) material, and a cyclic olefin copolymer material. 22. The polishing pad of claim 1 , wherein the polishing layer has an energy loss factor of greater than approximately 1000 KEL at 1/Pa at 40° C. 23. The polishing pad of claim 1 , wherein a combination of the foundation layer and the polishing layer has an energy loss factor of less than approximately 1000 KEL at 1/Pa at 40° C. 24. The polishing pad of claim 1 , wherein the polishing layer comprises a thermoset polyurethane material, the foundation layer comprises a polycarbonate layer, and the window comprises a polyethylene terephthalate material. 25. The polishing pad of claim 1 , wherein the polishing layer has an elastic storage modulus (E′) at 40 degrees Celsius approximately in the range of 50 MPa-100 MPa, and wherein the foundation layer has an elastic storage modulus (E′) at 40 degrees Celsius approximately in the range of 1500 MPa-3000 MPa. 26. The polishing pad of claim 1 , wherein the foundation layer has a hardness approximately in the range of 70-90 Shore D, and the polishing layer has a hardness approximately in the range of 20-65 Shore D. 27. The polishing pad of claim 1 , wherein the polishing layer has grooves disposed therein, the grooves formed to a depth of approximately 10%-60% of a total thickness of the polishing layer. 28. The polishing pad of claim 27 , wherein the grooves are formed to a depth of approximately half of the total thickness of the polishing layer.

Assignees

Inventors

Classifications

  • characterised by the composition or properties of the pad materials · CPC title

  • B24B37/205Primary

    provided with a window for inspecting the surface of the work being lapped · CPC title

  • B24B37/22Primary

    characterised by a multi-layered structure · CPC title

  • Anti-slip materials; Abrasives {(products specifically intended for the fabrication of abrasive tools, blocks or papers, or for operations of the kind of sand-blasting and barrelling B24B31/14, B24C1/00; polishing compositions containing abrasive or grinding agents C09G1/02; friction compositions for brakes or clutches F16D69/02; polishing of semi-conductors H10P52/40)} · CPC title

  • characterised by the shape of the lapping pad surface, e.g. grooved · CPC title

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What does patent US9868185B2 cover?
Polishing pads having a foundation layer and a window attached to the foundation layer, and methods of fabricating such polishing pads, are described. In an example, a polishing pad for polishing a substrate includes a foundation layer having a first modulus. A polishing layer is attached to the foundation layer and has a second modulus less than the first modulus. A first opening is through th…
Who is the assignee on this patent?
Cabot Microelectronics Corp
What technology area does this patent fall under?
Primary CPC classification B24B37/205. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jan 16 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).