Methods and apparatus for true high dynamic range (THDR) time-delay-and-integrate (TDI) imaging

Patent metadata

Field	Value
Publication number	US-9866770-B2
Application number	US-201615331455-A
Country	US
Kind code	B2
Filing date	Oct 21, 2016
Priority date	Oct 21, 2015
Publication date	Jan 9, 2018
Grant date	Jan 9, 2018

Abstract

In time-delay-and-integrate (TDI) imaging, a charge-couple device (CCD) integrates and transfers charge across its columns. Unfortunately, the limited well depth of the CCD limits the dynamic range of the resulting image. Fortunately, TDI imaging can be implemented with a digital focal plane array (DFPA) that includes a detector, analog-to-digital converter (ADC), and counter in each pixel and transfer circuitry connected adjacent pixels. During each integration period in the TDI scan, each detector in the DFPA generates a photocurrent that the corresponding ADC turns into digital pulses, which the corresponding counter counts. Between integration periods, the DFPA transfers the counts from one column to the next, just like in a TDI CCD. The DFPA also non-destructively transfers some or all of the counts to a separate memory. A processor uses these counts to estimate photon flux and correct any rollovers caused by “saturation” of the counters.

First claim

The invention claimed is:

1. A method of estimating a total number of detections by a detector element in a detector array comprising at least N detector elements and a counter array comprising at least N m-bit counters, each detector element in the detector array operably coupled to a corresponding m-bit counter in the counter array, the method comprising:
generating, in a first m-bit counter in the counter array, a first count of less than or equal to 2 m −1, the first count representative of detections by a first detector element in the detector array during a first integration period in N integration periods;
for n=1 to n=N−1:
transferring the n th count from the n th m-bit counter to the n+1 th m-bit counter;
incrementing, by the n+1 th m-bit counter, the n th count to form an n+1 th count in response to detections by the n+1 th detector element during an n+1 th integration period in the N integration periods;

estimating a total number of detections by an Nth detector element in the detector array during the N detection periods based at least in part on the first count, wherein N and m are positive integers and the N th count.

2. The method of claim 1 , wherein the N th count is a residue modulo 2 m of the total number of detections.

3. The method of claim 1 , wherein estimating the total number of detections comprises computing a floor of the total number of detections divided by 2 m .

4. The method of claim 3 , wherein estimating the total number of detections comprises adding the N th count to a product of the floor and 2 m .

5. The method of claim 1 , further comprising:
at the end of the first integration period, non-destructively reading the first count from the first m-bit counter to a memory.

6. The method of claim 5 , further comprising, for n=1 to n=N−1:
reading the n+1 th count from the n+1 th m-bit counter to the memory.

7. The method of claim 6 , wherein estimating the total number of detections is further based on the N−1 th count.

8. The method of claim 1 , wherein N is a power of 2 and wherein estimating the total number of detections comprises multiplying the first count values by N to yield a most significant bit (MSB) value.

9. The method of claim 8 , wherein estimating the total number of detections comprises appending the MSB value to the N th count.

10. A time-delay-and-integrate (TDI) image sensor comprising:
a detector array to image a scene;
a counter array, operably coupled to the detector array, to generate images of the scene during a plurality of integration periods, the counter array including a first m-bit counter that is operably coupled to a first detector element in the detector array and configured to generate a first count representative of a number of detections by the first detector element during a first integration period;
a processor, operably coupled to the counter array, to estimate a total number of detections by a plurality of detector elements in the detector array during the plurality of integration periods based at least in part on two images of the scene, and
a memory, operably coupled to the counter array and the processor, to receive the first count from the first m-bit counter at the end of the first integration period, the memory being further configured to receive a corresponding count from another m-bit counter in the counter array at the end of another integration period in the plurality of integration periods, wherein m is a positive integer.

11. The apparatus of claim 10 , wherein the first integration period is selected such that the number of detections by the first detector element during the first detection period is less than or equal to 2 m −1.

12. The apparatus of claim 10 , wherein the first integration period is one of the plurality of integration periods.

13. The apparatus of claim 10 , wherein the processor is configured to estimate the total number of detections by computing a floor of the total number of detections divided by 2 m .

14. The apparatus of claim 10 , wherein the plurality of detector elements comprises a linear array of detector elements.

15. A time-delay-and-integrate (TDI) image sensor comprising:
a detector array to image a scene;
a counter array, operably coupled to the detector array, to generate images of the scene during a plurality of integration periods; and
a processor, operably coupled to the counter array, to estimate a total number of detections by a plurality of detector elements in the detector array during the plurality of integration periods based at least in part on two images of the scene,
wherein the counter array includes a first m-bit counter that is operably coupled to a first detector element in the detector array and configured to generate a first count representative of a number of detections by the first detector element during a first integration period, and
wherein the first m-bit counter is configured to shift counts to an adjacent m-bit counter in the counter array and the adjacent m-bit counter is configured to increment the counts during another integration period of the plurality of integration periods, and m is a positive integer.

16. The apparatus of claim 15 , wherein the plurality of integration periods includes 2 x integration periods where x is a positive integer and wherein the processor is configured to estimate the total number of detections by multiplying the first count by 2 x to yield a most significant bit (MSB) value.

17. The apparatus of claim 16 , wherein the detector array comprises 2 x detector elements operably coupled to 2 x counters in the counter array and the processor is configured to estimate the total number of detections by appending the MSB value to a value equal to the number of counts in the last counter of the 2 x counters after the last of the 2 x integration periods.

18. The apparatus of claim 17 , wherein the number of counts in the last counter is a residue modulo 2 m of the total number of detections.

19. The apparatus of claim 16 , wherein the counts from the first counter are shifted and incremented 2 x −1 times.

20. The apparatus of claim 13 , wherein the processor is configured to generate the second image by adding the residue modulo m of the total number of detections to a product of the floor and 2 m .

21. A time-delay-and-integrate (TDI) image sensor comprising:
a detector array to image a scene;
a counter array, operably coupled to the detector array, to generate images of the scene during a plurality of integration periods, the counter array including a first m-bit counter that is operably coupled to a first detector element in the detector array and configured to generate a first count representative of a number of detections by the first detector element during a first integration period;
a processor, operably coupled to the counter array, to estimate a total number of detections by a plurality of detector elements in the detector array during the plurality of integration periods based at least in part on two images of the scene; and
a memory, operably coupled to the counter array and the processor, to receive the first count from the first m-bit counter at the end of the first integration period,
wherein the memory is further configured to receive a corresponding count from another m-bit counter in the counter array at the end of the final integration period in the plurality of integration periods, and m is a positive integer.

Assignees

• Colonero Curtis B
• Kelly Michael W
• Blackwell Megan H
• White Lauren L
• Massachusetts Inst Technology

Inventors

• Colonero Curtis B
• Kelly Michael W
• Blackwell Megan H
• White Lauren L

Classifications

• H04N23/683

  performed by a processor, e.g. controlling the readout of an image memory · CPC title

• H04N25/768

  for time delay and integration [TDI] · CPC title

• H04N25/57 Primary

  Control of the dynamic range · CPC title

• H04N23/6811

  based on the image signal · CPC title

• H04N25/711

  Time delay and integration [TDI] registers; TDI shift registers · CPC title