Solid-state imaging device

US9860471B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9860471-B2
Application numberUS-201514925333-A
CountryUS
Kind codeB2
Filing dateOct 28, 2015
Priority dateApr 18, 2003
Publication dateJan 2, 2018
Grant dateJan 2, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A CMOS sensor has unit pixels each structured by a light receiving element and three transistors, to prevent against the phenomenon of saturation shading and the reduction of dynamic range. The transition time (fall time), in switching off the voltage on a drain line shared in all pixels, is given longer than the transition time in turning of any of the reset line and the transfer line. For this reason, the transistor constituting a DRN drive buffer is made proper in its W/L ratio. Meanwhile, a control resistance or current source is inserted on a line to the GND, to make proper the operation current during driving. This reduces saturation shading amount. By making a reset transistor in a depression type, the leak current to a floating diffusion is suppressed to broaden the dynamic range.

First claim

Opening claim text (preview).

What is claimed is: 1. An imaging device comprising: a plurality of pixels; and a driving circuit configured to drive the plurality of pixels, wherein at least one of the plurality of pixels includes: a photodiode; a floating diffusion; a transfer transistor connected between the photodiode and the floating diffusion; a reset transistor connected between the floating diffusion and a drain line; and an amplifier transistor, a gate of the amplifier transistor connected to the floating diffusion, wherein the driving circuit includes a transistor connected to the drain line, and wherein a W/L ratio (W is a gate width, L is a gate length) of the transistor connected to the drain line is in a range of 1/0.6 to 1/20. 2. An imaging device according to claim 1 , wherein an off transition time on the drain line is a half of a pixel clock period or greater. 3. An imaging device according to claim 1 , wherein a transfer drive buffer includes a transistor connected at least to the transfer line, a reset drive buffer includes a transistor connected at least to the reset line, and wherein the transistor connected to the drain line has a W/L ratio set in a range of 1/5 times to 1/2500 times greater than any of a W/L ratio of the transistor connected to the transfer line and a W/L ratio of the transistor connected to the reset line. 4. An imaging device according to claim 3 , wherein the transistor connected to the drain line has a W/L ratio set in a range of 1/10 times to 1/500 times greater than any of a W/L ratio of the transistor connected to the transfer line and a W/L ratio of the transistor connected to the reset line. 5. An imaging device according to claim 1 , further comprising a resistance element for limiting a drive current provided between an off-side reference line of a drain drive buffer and a reference power source regulating an off voltage to the drain line. 6. An imaging device according to claim 1 , further comprising a current source for regulating a drive current provided between an off-side reference line of a drain drive buffer and a reference power source regulating an off voltage to the drain line. 7. An imaging device comprising: a plurality of pixels; and a driving circuit configured to drive the plurality of pixels, wherein at least one of the plurality of pixels includes: a photodiode; a floating diffusion; a transfer transistor connected between the photodiode and the floating diffusion; a reset transistor connected between the floating diffusion and a drain line; and an amplifier transistor, a gate of the amplifier transistor connected to the floating diffusion, wherein the driving circuit includes a transistor connected to the drain line, and wherein a W/L ratio (W is a gate width, L is a gate length) of the transistor connected to the drain line is in a range of 1/1 to 1/20. 8. An imaging device according to claim 7 , wherein an off transition time on the drain line is a half of a pixel clock period or greater. 9. An imaging device according to claim 7 , wherein a transfer drive buffer includes a transistor connected at least to the transfer line, a reset drive buffer includes a transistor connected at least to the reset line, and wherein the transistor connected to the drain line has a W/L ratio set in a range of 1/5 times to 1/2500 times greater than any of a W/L ratio of the transistor connected to the transfer line and a W/L ratio of the transistor connected to the reset line. 10. An imaging device according to claim 9 , wherein the transistor connected to the drain line has a W/L ratio set in a range of 1/10 times to 1/500 times greater than any of a W/L ratio of the transistor connected to the transfer line and a W/L ratio of the transistor connected to the reset line. 11. An imaging device according to claim 7 , further comprising a resistance element for limiting a drive current provided between an off-side reference line of a drain drive buffer and a reference power source regulating an off voltage to the drain line. 12. An imaging device according to claim 7 , further comprising a current source for regulating a drive current provided between an off-side reference line of a drain drive buffer and a reference power source regulating an off voltage to the drain line. 13. An imaging device comprising: a plurality of pixels; and a driving circuit configured to drive the plurality of pixels, wherein at least one of the plurality of pixels includes: a photodiode; a floating diffusion; a transfer transistor connected between the photodiode and the floating diffusion; a reset transistor connected between the floating diffusion and a drain line; and an amplifier transistor, a gate of the amplifier transistor connected to the floating diffusion, wherein the driving circuit includes a transistor connected to the drain line, and wherein a W/L ratio (W is a gate width, L is a gate length) of the transistor connected to the drain line is in a range of 500/0.6 to 2/0.6. 14. An imaging device according to claim 13 , wherein an off transition time on the drain line is a half of a pixel clock period or greater. 15. An imaging device according to claim 13 , wherein a transfer drive buffer includes a transistor connected at least to the transfer line, a reset drive buffer includes a transistor connected at least to the reset line, and wherein the transistor connected to the drain line has a W/L ratio set in a range of 1/5 times to 1/2500 times greater than any of a W/L ratio of the transistor connected to the transfer line and a W/L ratio of the transistor connected to the reset line. 16. An imaging device according to claim 15 , wherein the transistor connected to the drain line has a W/L ratio set in a range of 1/10 times to 1/500 times greater than any of a W/L ratio of the transistor connected to the transfer line and a W/L ratio of the transistor connected to the reset line. 17. An imaging device according to claim 13 , further comprising a resistance element for limiting a drive current provided between an off-side reference line of a drain drive buffer and a reference power source regulating an off voltage to the drain line. 18. An imaging device according to claim 13 , further comprising a current source for regulating a drive current provided between an off-side reference line of a drain drive buffer and a reference power source regulating an off voltage to the drain line.

Assignees

Inventors

Classifications

  • H04N25/709Primary

    Circuitry for control of the power supply · CPC title

  • Citrus fruit squeezers; Other fruit juice extracting devices · CPC title

  • Parts or details, e.g. mixing tools, whipping tools · CPC title

  • A47J19/06Primary

    Juice presses for vegetables · CPC title

  • Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils · CPC title

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What does patent US9860471B2 cover?
A CMOS sensor has unit pixels each structured by a light receiving element and three transistors, to prevent against the phenomenon of saturation shading and the reduction of dynamic range. The transition time (fall time), in switching off the voltage on a drain line shared in all pixels, is given longer than the transition time in turning of any of the reset line and the transfer line. For thi…
Who is the assignee on this patent?
Sony Corp
What technology area does this patent fall under?
Primary CPC classification H04N25/709. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 02 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).