Test-used printed circuit board having in-series circuit involved with join test action group signal

Patent metadata

Field	Value
Publication number	US-9857426-B2
Application number	US-201615073599-A
Country	US
Kind code	B2
Filing date	Mar 17, 2016
Priority date	Dec 25, 2015
Publication date	Jan 2, 2018
Grant date	Jan 2, 2018

Abstract

A test-used PCB having an in-series circuit involved with a join test action group (JTAG) signal is provided. A first JTAG connection interface and a second JTAG connection interface are configured on test circuit boards. Test circuit boards can be seriously connected with each other through the first JTAG connection interface and the second JTAG connection interface. Therefore, the efficiency of providing series test circuit boards, reducing TAP controller and JTAG port may be achieved.

First claim

What is claimed is:

1. A test-used printed circuit board (PCB) having an in-series circuit involved with a join test action group (JTAG) signal, comprising:
a first JTAG connective interface, the first JTAG connective interface further comprising a first interface test clock (test clock, TCK) pin, a first interface test mode select (TMS) pin, a first interface test data (TDI) pin and a first interface test data out (TDO) pin;
a second JTAG connective interface, the second JTAG connective interface further comprises a second TCK pin, a second interface TMS pin, a second interface TDI, and a second interface test TDO; and
at least a JTAG control chip, the JTAG control chip further comprises a chip TCK pin, a chip TMS pin, a chip TDI, and a chip TDO;
wherein the first and second interface TCK pins and the chip TCK pin are electrically connected, the first and second interface TMS pins and the chip TMS pin are electrically connected, the first interface TDI pin is electrically connected to the chip TDI of one of the JTAG control chips, the chip TDO pin is electrically connected to the chip TDI pin of one of the JTAG control chips, or the chip TDO pin is electrically connected to the second interface TDI pin, and the first interface TDO pin is electrically connected to the second interface TDO pin.

2. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 1 , wherein a sequence of the first interface TCK pin, the first interface TMS pin, the first TDI pin and the first interface TDO pin and a sequence of the second interface TCK pin, the second interface TMS pin, the second TDI pin and the second interface TDO pin are the same.

3. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 1 , wherein the first and second interface TCK pins and the chip TCK pins are electrically connected through a buffer chip and a match resistor.

4. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 1 , wherein the first and second interface TMS pins are electrically connected through a buffer chip and a match resistor, and the first interface TMS pin and the chip TMS pin are electrically connected through the match resistor.

5. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 1 , wherein the first interface TDI pin is electrically connected through a pull-up resistor to the chip TDI pin of one of the JTAG control chips.

6. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 1 , wherein the chip TDO pin is electrically connected through a match resistor to the second interface TDI pin.

7. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 1 , wherein the first JTAG connective interface further comprises ground pins corresponded and staggered with the first interface TCK pin, the first interface TMS pin, the first interface TDI pin and the first interface TDO pin respectively.

8. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 7 , wherein the second JTAG connective interface further comprises ground pins corresponded and staggered with the second interface TCK pin, the second interface TMS pin, the second interface TDI pin and the second interface TDO pin respectively.

9. The test-used PCB having the in-series circuit involved with the JTAG signal as claimed in claim 8 , wherein a sequence of the first interface TCK pin, the first interface TMS pin, the first interface TDI pin, the first interface TDO pin and the ground pins and a sequence of a second order sequence of the second interface TCK pin, the second interface TMS pin, the second interface TDI pin, the second interface TDO pin and the ground pins are the same.

Assignees

• Inventec (Pudong) Tech Corporation
• Inventec Corp
• Nventec Corp

Inventors

• Song Ping

Classifications

• G06F11/273 Primary

  Tester hardware, i.e. output processing circuits {(G06F11/263 takes precedence)} · CPC title

• G06F11/22

  Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing · CPC title

• G01R31/318555

  Control logic · CPC title

• G01R31/3177 Primary

  Testing of logic operation, e.g. by logic analysers · CPC title

• G01R31/31723

  Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes (routing the test signal to or from the device under test G01R31/31926) · CPC title