Optical locking system and entrance guard system

Patent metadata

Field	Value
Publication number	US-9857224-B2
Application number	US-201715409826-A
Country	US
Kind code	B2
Filing date	Jan 19, 2017
Priority date	Jan 22, 2016
Publication date	Jan 2, 2018
Grant date	Jan 2, 2018

Abstract

An optical locking system comprises a light emitter, an optical wavelength identifying system, and a locking unit. The optical wavelength identifying system comprises an optical wavelength detecting device, a memory, a modulator, a comparison module, and an instruction module. The optical wavelength detecting device comprises a polarizer, a detecting element, a measuring device, and a data processor. The detecting element configured to form a temperature difference or a potential difference between two points of the detecting element when exposed to the polarized light, wherein the detecting element comprises a carbon nanotube structure comprising a plurality of carbon nanotubes oriented along the same direction, and angles between a polarizing direction of the polarized light and an oriented direction of the plurality of carbon nanotubes is adjustable.

First claim

What is claimed is:

1. An optical locking system, the system comprising:
a light emitter configured to emit a light;
an optical wavelength identifying system configured to identify the light and send a work instruction, wherein the optical wavelength identifying system comprises:
an optical wavelength detecting device configured to detect an optical wavelength of an incident light, comprising:
a polarizer configured to transform the incident light into a polarized light;
a detecting element configured to form a temperature difference or a potential difference between two points of the detecting element when exposed to the polarized light, wherein the detecting element comprises a carbon nanotube structure comprising a plurality of carbon nanotubes oriented along the same direction, and angles between a polarizing direction of the polarized light and an oriented direction of the plurality of carbon nanotubes is adjustable;
a measuring device electrically connected to the detecting element and configured to measure the temperature difference or the potential difference;
a data processor electrically connected to the measuring device and configured to obtain the optical wavelength by calculating and analyzing the temperature difference or the potential difference;

a memory configured to store a predetermined value and a standard database of transmittance-angle-wavelength values and predetermined values;
a modulator configured to set or reset the predetermined value;
a comparison module configured to compare the optical wavelength of the incident light with the predetermined value to obtain a comparison result; and
an instruction module configured to send the work instruction according to the comparison result; and

a locking unit configured to perform an unlocking operation or a locking operation according to the work instruction.

2. The system as claimed in claim 1 , wherein the polarizer is rotatable to adjust the angles between the direction of the polarized light and the orientation of the carbon nanotubes in the carbon nanotube structure.

3. The system as claimed in claim 1 , wherein the optical wavelength identifying system further comprises a receiver for collecting the incident light.

4. The system as claimed in claim 1 , wherein the detecting element is suspended.

5. The system as claimed in claim 1 , wherein the detecting element is a carbon nanotube layer, and the carbon nanotube layer comprises a plurality of carbon nanotubes, connected to each other one by one by van der Waals attractive force.

6. The system as claimed in claim 1 , wherein the optical wavelength detecting device further comprises a first electrode and a second electrode, the first electrode and the second electrode are electrically connected to the carbon nanotube structure.

7. The system as claimed in claim 1 , wherein the detecting element comprises a P-type semiconductor carbon nanotube layer and an N-type semiconductor carbon nanotube layer, a P-N junction is formed between the P-type semiconductor carbon nanotube layer and the N-type semiconductor carbon nanotube layer, and the measuring device is respectively electrically connected to the P-type semiconductor carbon nanotube layer and the N-type semiconductor carbon nanotube layer.

8. The system as claimed in claim 7 , wherein the P-type semiconductor carbon nanotube layer and the N-type semiconductor carbon nanotube layer are stacked with each other.

9. The system as claimed in claim 8 , wherein the N-type semiconductor carbon nanotube layer is sandwiched between a first P-type semiconductor carbon nanotube layer and a second P-type semiconductor carbon nanotube layer, a first part of the N-type semiconductor carbon nanotube layer extends to the outside of the two P-type semiconductor carbon nanotube layers to form an exposed part, and the exposed part of the N-type semiconductor carbon nanotube layer is coated by the second electrode; and the first electrode comprises a first electrode unit and a second electrode unit, the first electrode unit is located on a second part of the first P-type semiconductor carbon nanotube layer, the second electrode unit is located on a third part of the second P-type semiconductor carbon nanotube layer, and the first electrode unit and the second electrode unit are electrically connected with each other.

10. The system as claimed in claim 8 , wherein the P-type semiconductor carbon nanotube layer is sandwiched between a first N-type semiconductor carbon nanotube layer and a second N-type semiconductor carbon nanotube layer, a first part of the P-type semiconductor carbon nanotube layer extends to the outside of the two N-type semiconductor carbon nanotube layers to form an exposed part, and the exposed part of the P-type semiconductor carbon nanotube layer is coated by the second electrode; and the first electrode comprises a first electrode unit and a second electrode unit, the first electrode unit is located on a second part of the first N-type semiconductor carbon nanotube layer, the second electrode unit is located on a third part of the second N-type semiconductor carbon nanotube layer, and the first electrode unit and the second electrode unit are electrically connected with each other.

11. The system as claimed in claim 7 , wherein the P type semiconductor carbon nanotube layer and the N type semiconductor carbon nanotube layer are arranged side by side in the same plane.

12. The system as claimed in claim 1 , wherein the measuring device is a voltage measuring device or a thermocouple device configured to measure the voltage differences or the temperature differences.

13. The system as claimed in claim 1 , wherein the optical wavelength analyzer further comprises a plurality of optical wavelength detecting devices, the plurality of optical wavelength detecting devices independently detect the wavelength of light, and each optical wavelength detecting device is corresponding to an initial signal.

14. An entrance guard system, the system comprising: an optical locking system, a door frame and a door leaf; wherein the optical locking system comprises:
a light emitter configured to emit a light;
an optical wavelength identifying system configured to identify the light wavelength and send a work instruction according to the light wavelength; and
a locking unit configured to perform an unlocking operation or a locking operation according to the work instruction.

15. The system as claimed in claim 14 , wherein the optical wavelength identifying system comprises:
an optical wavelength detecting device configured to detect an optical wavelength of an incident light;
a memory configured to store a predetermined value and a standard database of transmittance-angle-wavelength values and predetermined values;
a modulator configured to set or reset the predetermined value;
a comparison module configured to compare the optical wavelength of the incident light with the predetermined value to obtain a comparison result; and
an instruction module configured to send the work instruction according to the comparison result.

16. The system as claimed in claim 15 , wherein the optical wavelength detecting device comprising:
a polarizer configured to transform the incident light into a polarized light;
a detecting element configured to form a temperature difference or a potential difference between two points of the detecting element when exposed to the polarized light, wherein the detecting element comprises a carbon nanotube structure comprising a plurality of carbon nanotubes oriented along the same direction, and angles betwe

Assignees

• Univ Tsinghua
• Hon Hai Prec Ind Co Ltd

Inventors

• Zhang Ling
• Deng Lei
• Wu Yang
• Liu Chang-Hong
• Jiang Kai-Li
• Fan Shou-Shan

Classifications

• E05B65/06

  for swing doors {or windows, i.e. opening inwards and outwards} · CPC title

• E05B15/16

  Use of special materials for parts of locks · CPC title

• E05B17/00

  Accessories in connection with locks (buffers E05F5/00; means for preventing rattling of wings E05F7/04; means for taking the weight of the wing E05F7/06) · CPC title

• G02B5/3025

  Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state (G02B5/3008, G02B5/3016 take precedence) · CPC title

• Y10S977/742

  Carbon nanotubes, CNTs · CPC title