Liquid crystal display and method of manufacturing the same
US-2015092131-A1 · Apr 2, 2015 · US
US9851595B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9851595-B2 |
| Application number | US-201615204913-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 7, 2016 |
| Priority date | Jan 7, 2016 |
| Publication date | Dec 26, 2017 |
| Grant date | Dec 26, 2017 |
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A display device according to an exemplary embodiment includes: a substrate including a display area and a peripheral area; a thin film transistor positioned in the display area of the substrate; a first electrode connected to the thin film transistor; a roof layer positioned on the first electrode and spaced apart from the first electrode by a microcavity that is interposed between the roof layer and the first electrode; a liquid crystal layer positioned inside the microcavity; an encapsulation layer positioned on the roof layer; a pad portion positioned in the peripheral area of the substrate; and a pillar positioned in the peripheral area of the substrate.
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What is claimed is: 1. A manufacturing method of a display device comprising: forming a thin film transistor in a display area of a substrate including a display area, a peripheral area, and an extra area; forming a first electrode to be connected to the thin film transistor; forming a sacrificial layer on the first electrode; forming a roof layer on the sacrificial layer; forming a microcavity between the first electrode and the roof layer by removing the sacrificial layer; forming an encapsulation layer on the roof layer; cutting the encapsulation layer positioned on a boundary between the display area and peripheral area of the substrate; cutting a boundary between the peripheral area and extra area of the substrate; and removing the encapsulation layer positioned in the peripheral area and extra area of the substrate, and the extra area of the substrate. 2. The manufacturing method of claim 1 , further comprising: forming a gate line on the substrate; and forming a data line on the substrate, wherein the gate line and the data line are connected to the thin film transistor. 3. The manufacturing method of claim 2 , further comprising: forming, in the peripheral area of the substrate, a gate pad portion connected to the gate line; and forming, in the peripheral area of the substrate, a data pad portion connected to the data line. 4. The manufacturing method of claim 3 , further comprising: forming the sacrificial layer on the gate pad portion and the data pad portion; and forming a dummy microcavity. 5. The manufacturing method of claim 4 , further comprising: removing the dummy microcavity; and forming a pillar in the peripheral area of the substrate. 6. The manufacturing method of claim 5 , wherein the pillar includes a first layer that is made of the same material as the roof layer. 7. The manufacturing method of claim 6 , further comprising: forming a second electrode on the sacrificial layer; and forming an insulating layer on the second electrode, wherein the pillar further includes: a second layer that is positioned under the first layer and is made of the same material as the insulating layer, and a third layer that is positioned under the second layer and is made of the same material as the second electrode. 8. The manufacturing method of claim 6 , further comprising: forming a second electrode; forming an interlayer insulating layer interposed between the first electrode and the second electrode; and forming an insulating layer on the sacrificial layer, wherein the pillar further includes: a second layer that is positioned under the first layer and is made of the same material as the insulating layer. 9. The manufacturing method of claim 3 , wherein the forming of the gate pad portion includes: forming a gate pad extended from an end portion of the gate line; and forming a gate contact assistant on the gate pad. 10. The manufacturing method of claim 9 , wherein the gate pad is made of the same material as the gate line, and the gate contact assistant is made of the same material as the first electrode. 11. The manufacturing method of claim 3 , wherein the forming of the data pad portion includes: forming a data pad extended from an end portion of the data line, and forming a data contact assistant on the data pad. 12. The manufacturing method of claim 11 , wherein the data pad is made of the same material as the data line, and the data contact assistant is made of the same material as the first electrode. 13. The manufacturing method of claim 1 , further comprising: irradiating a laser to the encapsulation layer positioned on a boundary between the display area and peripheral area of the substrate to cut the encapsulation layer. 14. The manufacturing method of claim 13 , wherein a region to which a laser is irradiated does not overlap the gate pad portion or the data pad portion. 15. The manufacturing method of claim 13 , wherein a side surface of the encapsulation layer includes a heat-deformable portion.
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