Storage device calibration methods and controlling device using the same

Patent metadata

Field	Value
Publication number	US-9846606-B2
Application number	US-201414535335-A
Country	US
Kind code	B2
Filing date	Nov 7, 2014
Priority date	Nov 7, 2014
Publication date	Dec 19, 2017
Grant date	Dec 19, 2017

Abstract

A calibration method includes transmitting first data comprising a calibration data and a first checksum to the storage device according to each of a plurality of training parameter sets; recording a plurality of error indicators respectively which are corresponding to the plurality of training parameter sets and from the storage device; and identifying one of the plurality of training parameter sets as a predetermined parameter set according to the plurality of error indicators respectively corresponding to the plurality of training parameter sets; wherein each error indicator indicates whether transmitting the first data according to the corresponded training parameter set is successful.

First claim

What is claimed is:

1. A calibration method for a controlling device of a storage device, the calibration method comprising:
transmitting first data comprising a calibration data and a first checksum to the storage device according to each of a plurality of training parameter sets;
recording a plurality of error indicators which are respectively corresponding to the plurality of training parameter sets and from the storage device; and
identifying one of the plurality of training parameter sets as a predetermined parameter set according to the plurality of error indicators respectively corresponding to the plurality of training parameter sets;
wherein each error indicator indicates whether transmitting the first data according to the corresponded training parameter set is successful.

2. The calibration method of claim 1 , wherein the first checksum is generated according to the calibration data.

3. The calibration method of claim 1 , wherein each training parameter set comprises at least one of a reference DQ voltage parameter, a bit delay parameter, a sampling strobe parameter and a controller I/O driving ability parameter.

4. The calibration method of claim 1 , wherein each of the plurality of error indicators is generated by the storage device according to a comparison between the first checksum and a receiver end checksum, wherein the receiver end checksum is generated by the storage device based on the first data.

5. The calibration method of claim 1 , wherein the step of identifying one of the plurality of training parameter sets as the predetermined parameter set is performed during an initialization of the storage device.

6. The calibration method of claim 1 , wherein after the step of identifying one of the plurality of training parameter sets as the predetermined parameter set, the method further comprises:
transmitting second data to the storage device according to the predetermined parameter set;
periodically transmitting third data comprising at least one second checksum to the storage device according to at least one of a plurality of run-time parameter sets;
recording a plurality of error indicators corresponding to the plurality of run-time parameter sets and from the storage device; and
adjusting the predetermined parameter set according to the plurality of error indicators corresponding to the plurality of run-time parameter sets.

7. The calibration method of claim 6 , wherein a period for periodically transmitting the third data to the storage device according to the at least one of the plurality of run-time parameter sets is determined according to a refreshing period of the storage device.

8. A calibration method for a controlling device of a storage device, the calibration method comprising:
transmitting first run-time data to a storage device according to a predetermined parameter set;
periodically transmitting second run-time data comprising at least one run-time checksum to the storage device according to at least one of a plurality of run-time parameter sets;
recording a plurality of run-time error indicators which are corresponding to the plurality of run-time parameter sets and from the storage device; and
adjusting the predetermined parameter set according to the plurality of run-time error indicators corresponding to the plurality of run-time parameter sets.

9. The calibration method of claim 8 , wherein a period for periodically transmitting the second run-time data to the storage device according to the at least one of the plurality of run-time parameter sets is determined according to a refreshing period of the storage device.

10. The calibration method of claim 8 , wherein the plurality of run-time parameter sets is acquired by monotonically decreasing the values of the parameters in the predetermined parameter set.

11. The calibration method of claim 8 , wherein the plurality of run-time parameter sets is acquired by monotonically increasing the values of the parameters in the predetermined parameter set.

12. The calibration method of claim 8 , wherein each of the plurality of run-time error indicators is generated by the storage device according to a comparison between the run-time checksum and a receiver end run-time checksum, wherein the receiver end run-time checksum is generated by the storage device based on the second run-time data.

13. A controlling device for a storage device, the controlling device comprising:
an interface module, for transmitting data and signals between the controlling device and the storage device;
a data providing module, for providing a first data comprising a calibration data and a first checksum; and
a control module, for obtaining a plurality of training parameter sets;
wherein the controlling device transmits, through the interface module, the first data comprising the calibration data and the first checksum to the storage device according to each of the plurality of training parameter sets;
wherein the controlling device receives, through the interface module, a plurality of error indicators which are respectively corresponding to the plurality of training parameter sets, and each error indicator indicates whether transmitting the first data according to the corresponded training parameter set is successful;
wherein the control module identifies one of the plurality of training parameter sets as a predetermined parameter set according to the plurality of error indicators.

14. The controlling device of claim 13 , wherein each training parameter set comprises at least one of a reference DQ voltage parameter, a bit delay parameter, a sampling strobe parameter and a controller I/O driving ability parameter.

15. The controlling device of claim 13 , wherein after the controlling device transmits second data to the storage device according to the predetermined parameter set, the controlling device periodically transmits third data comprising at least one second checksum to the storage device according to at least one of a plurality of run-time parameter sets; records a plurality of error indicators which are corresponding to the plurality of run-time parameter sets and from the storage device; and adjusts the predetermined parameter set according to the plurality of error indicators corresponding to the plurality of run-time parameter sets.

16. The controlling device of claim 15 , wherein a period of the controlling device periodically transmits the third data comprising the at least one second checksum to the storage device according to the at least one of the plurality of run-time parameter sets is determined according to a refreshing period of the storage device.

17. The controlling device of claim 13 , wherein the control module identifies one of the plurality of training parameter sets as the predetermined parameter during an initialization of the storage device.

Assignees

• Mediatek Inc

Inventors

• Chen Chun-Liang

Classifications

• G01R31/2874

  related to temperature · CPC title

• G06F11/22

  Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing · CPC title

• G01R31/265

  Contactless testing {(of circuits, also in wafer-form G01R31/302)} · CPC title

• G11C11/00

  Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor (G11C14/00 - G11C21/00 take precedence) · CPC title

• G01R31/318511

  Wafer Test · CPC title