Optical observation device

Patent metadata

Field	Value
Publication number	US-9846267-B2
Application number	US-201314651364-A
Country	US
Kind code	B2
Filing date	Dec 13, 2013
Priority date	Dec 20, 2012
Publication date	Dec 19, 2017
Grant date	Dec 19, 2017

Abstract

An optical observation system includes a spatial light modulator displaying a Fresnel type kinoform on a phase modulation plane, and modulating light L 1 in phase to irradiate an observation object with modulated light L 2 , an imaging optical system imaging observation target light L 3 from the observation object, an optical system moving mechanism moving the imaging optical system in an optical axis direction of the observation target light L 3 , and a control section controlling the optical system moving mechanism such that the focal position of the imaging optical system changes in response to a change in the light condensing position of the modulated light L 2 by the Fresnel type kinoform.

First claim

The invention claimed is:

1. An optical observation system for imaging observation target light from an observation object, comprising:
a light source configured to output light;
a spatial light modulator comprising a phase modulation plane including a plurality of two-dimensionally arrayed regions, and configured to display a Fresnel type kinoform on the phase modulation plane, and modulate the light in phase in each of the plurality of regions to generate modulated light, and configured to output the modulated light to the observation object; an optical system configured to image the observation target light from the observation object;
an optical system moving mechanism installed for the optical system and configured to move the optical system; and
a controller configured to control a light condensing position of the modulated light by controlling the Fresnel type kinoform displayed on the phase modulation plane of the spatial light modulator,
calculate a calculated focal position on the basis of the Fresnel type kinoform, and
control a focal position of the optical system based on said calculated focal position such that the focal position of the optical system changes in response to a change in the light condensing position of the modulated light by the Fresnel type kinoform.

2. The optical observation system according to claim 1 , wherein the optical system images the observation target light transmitted through the observation object.

3. The optical observation system according to claim 1 , further comprising an observation object moving mechanism configured to move the observation object in an optical axis direction of the observation target light.

4. The optical observation system according to claim 1 , wherein the optical system comprises an imaging lens, and the optical system moving mechanism moves the imaging lens.

5. The optical observation system according to claim 1 , wherein the optical system comprises an imaging device, and the optical system moving mechanism moves the imaging device.

6. The optical observation system according to claim 1 , wherein the controller, during output of the modulated light to the observation object, controls the optical system moving mechanism such that a focal position of the optical system changes based on the Fresnel type kinoform which is displayed on the phase modulation plane.

7. The optical observation system according to claim 1 , wherein the controller, after output of the modulated light to the observation object, controls the optical system moving mechanism such that a focal position of the optical system changes based on the Fresnel type kinoform which has been stored in advance.

8. An optical observation method for imaging observation target light from an observation object, comprising:
by a spatial light modulator comprising a phase modulation plane including a plurality of two-dimensionally arrayed regions, modulating light output from a light source in phase in each of the plurality of regions based on a Fresnel type kinoform to generate modulated light;
irradiating the observation object with the modulated light;
by an optical system, imaging the observation target light from the observation object;
controlling a light condensing position of the modulated light by controlling the Fresnel type kinoform displayed on the phase modulation plane of the spatial light modulator:
calculating a calculated focal position on the basis of the Fresnel type kinoform; and
controlling a focal position of the optical system based on said calculated focal position such that the focal position of the optical system changes in response to a change in the light condensing position of the modulated light by the Fresnel type kinoform, the optical system moving mechanism being installed for the optical system and configured to move the optical system.

Assignees

• Hamamatsu Photonics Kk

Inventors

• Takiguchi Yuu

Classifications

• G03H2001/0094

  for patterning or machining using the holobject as input light distribution · CPC title

• G02B5/32 Primary

  Holograms used as optical elements · CPC title

• G02B21/365

  Control or image processing arrangements for digital or video microscopes (G02B21/361, G02B21/362 take precedence) · CPC title

• G03H2001/085

  Kinoform, i.e. phase only encoding wherein the computed field is processed into a distribution of phase differences · CPC title

• G02B5/18

  Diffraction gratings {(holographic optical elements G02B5/32, G03H; integrally combined with optical fibres G02B6/02057; for coupling light guides G02B6/34; integrally combined with optical integrated light guides G02B6/12; grating systems G02B27/44)} · CPC title