Built-in self test circuit for measuring performance of clock data recovery and system-on-chip including the same
US-2024302432-A1 · Sep 12, 2024 · US
US9843315B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9843315-B2 |
| Application number | US-201214351955-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 26, 2012 |
| Priority date | Nov 1, 2011 |
| Publication date | Dec 12, 2017 |
| Grant date | Dec 12, 2017 |
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An integrated circuit includes a delay circuit and first and second interface circuits. The delay circuit delays a first timing signal by an internal delay to generate an internal timing signal. The first interface circuit communicates data to an external device in response to the internal timing signal. The second interface circuit transmits an external timing signal for capturing the data in the external device. An external delay is added to the external timing signal in the external device to generate a delayed external timing signal. The delay circuit sets the internal delay based on a comparison between the delayed external timing signal and a calibration signal transmitted by the first interface circuit.
Opening claim text (preview).
What is claimed is: 1. An integrated circuit comprising: a first delay circuit to delay a first timing signal by an internal delay to generate an internal timing signal; a first interface circuit to communicate data to an external device in response to the internal timing signal; a second interface circuit to transmit an external timing signal for capturing the data in the external device; and a second delay circuit to delay the first timing signal by a second internal delay to generate a second internal timing signal, wherein the external timing signal is generated based on the second internal timing signal during a normal mode, and wherein the external timing signal is generated using a circuit path that bypasses the second delay circuit during a calibration mode. 2. The integrated circuit of claim 1 , further comprising: a circuit to receive a phase comparison signal from the external device, wherein the first delay circuit sets the internal delay based on the phase comparison signal. 3. The integrated circuit of claim 1 , further comprising: a multiplexer circuit configurable to cause the first interface circuit to communicate the data in response to the first timing signal or the internal timing signal. 4. The integrated circuit of claim 1 , wherein the external timing signal is generated based on the first timing signal during the calibration mode. 5. The integrated circuit of claim 1 , wherein the internal delay is adjusted to cause the first interface circuit to communicate the data with an approximate quadrature-phase relationship with the external timing signal. 6. The integrated circuit of claim 1 , wherein the external device comprises a memory circuit, and wherein the first interface circuit communicates the data during a write operation to the memory circuit. 7. A method comprising: delaying a first timing signal by an internal delay using a first delay circuit to generate an internal timing signal; communicating data to an external device using a first interface circuit in response to the internal timing signal; transmitting an external timing signal for capturing the data in the external device using a second interface circuit, wherein an external delay is added to the external timing signal in the external device to generate a delayed external timing signal; setting the internal delay of the first delay circuit based on a comparison in the external device between the delayed external timing signal and a signal transmitted by the first interface circuit; and delaying the first timing signal by a second internal delay using a second delay circuit to generate a second internal timing signal, wherein the external timing signal is generated based on the second internal timing signal during a normal mode, and wherein the external timing signal is generated using a circuit path that bypasses the second delay circuit during a calibration mode. 8. The method of claim 7 further comprising: adjusting the internal delay to substantially match the external delay. 9. The method of claim 7 further comprising: generating the external timing signal based on the first timing signal during the calibration mode. 10. The method of claim 7 , wherein the external delay is caused by a buffer circuit to drive the delayed external timing signal to a plurality of data capture circuits in the external device. 11. The method of claim 7 , wherein communicating data to an external device using a first interface circuit in response to the internal timing signal comprises communicating the data during a write operation to a memory circuit in the external device. 12. The method of claim 7 , further comprising: selectively causing the first interface circuit to communicate the data in response to the first timing signal or the internal timing signal. 13. The method of claim 7 , wherein the internal delay is adjustable, and the external delay is non-adjustable. 14. The method of claim 7 , further comprising: adjusting the internal delay to cause the first interface circuit to communicate the data with an approximate quadrature-phase relationship with the external timing signal.
Output synchronization · CPC title
with adaption or trimming of parameters · CPC title
with means for avoiding disturbances due to temperature effects · CPC title
Input synchronization · CPC title
Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units (interface circuits for specific input/output devices G06F3/00 {; multiprogram control therefor G06F9/46}; multiprocessor systems G06F15/16 ) · CPC title
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