Systems and methods for using interleaving window widths in tandem mass spectrometry

Patent metadata

Field	Value
Publication number	US-9842729-B2
Application number	US-201615259766-A
Country	US
Kind code	B2
Filing date	Sep 8, 2016
Priority date	May 18, 2012
Publication date	Dec 12, 2017
Grant date	Dec 12, 2017

Abstract

Systems and methods are provided for analyzing a sample using overlapping measured mass selection window widths. A mass range of a sample is divided into two or more target mass selection window widths using a processor. The two or more target widths can have the same width or variable widths. A tandem mass spectrometer is instructed to perform two or more fragmentation scans across the mass range using the processor. Each fragmentation scan of the two or more fragmentation scans includes a measured mass selection window width. The two or more measured widths of the two or more fragmentation scans can have the same width or variable widths. At least two of the two or more measured mass selection window widths overlap. The overlap in measured mass selection window widths corresponds to at least one target mass selection window width.

First claim

What is claimed is:

1. A system for analyzing a sample using overlapping measured mass selection window widths, comprising:
a tandem mass spectrometer that includes a mass analyzer that allows overlapping measured mass selection window widths; and
a controller in communication with the tandem mass spectrometer that is
configured to divide a mass range of a sample into two or more target mass selection window widths, and
configured to instruct the tandem mass spectrometer to fragment each region of the mass range at least twice using overlapping measured mass selection window widths, wherein an overlap in at least two measured mass selection window widths corresponds to at least one target mass selection window width.

2. The system of claim 1 , wherein the two or more target mass selection window widths have the same width.

3. The system of claim 1 , wherein the two or more target mass selection window widths have variable widths.

4. The system of claim 1 , wherein the two or more measured mass selection window widths have the same width.

5. The system of claim 1 , wherein the two or more measured mass selection window widths have variable widths.

6. The system of claim 1 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include the same number of measured mass selection window widths.

7. The system of claim 1 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include a variable number of measured mass selection window widths.

8. The system of claim 1 , wherein the processor further extracts information about the at least one target mass selection window width by combining information from the measured mass selection window widths, wherein equivalent information is extracted in less time.

9. A system for analyzing a sample using overlapping measured mass selection window widths, comprising:
a tandem mass spectrometer that includes a mass analyzer that allows overlapping measured mass selection window widths; and
a processor in communication with the tandem mass spectrometer, the processor being coupled to a storage medium encoded to perform steps comprising:
dividing a mass range of a sample into two or more target mass selection window widths, and
instructing the tandem mass spectrometer to fragment each region of the mass range at least twice using overlapping measured mass selection window widths, wherein an overlap in at least two measured mass selection window widths corresponds to at least one target mass selection window width.

10. The system of claim 9 , wherein the two or more target mass selection window widths have the same width.

11. The system of claim 9 , wherein the two or more target mass selection window widths have variable widths.

12. The system of claim 9 , wherein the two or more measured mass selection window widths have the same width.

13. The system of claim 9 , wherein the two or more measured mass selection window widths have variable widths.

14. The system of claim 9 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include the same number of measured mass selection window widths.

15. The system of claim 9 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include a variable number of measured mass selection window widths.

16. The system of claim 9 , wherein the processor further extracts information about the at least one target mass selection window width by combining information from the measured mass selection window widths, wherein equivalent information is extracted in less time.

17. A method for analyzing a sample using overlapping measured mass selection window widths, comprising:
dividing a mass range of a sample into two or more target mass selection window widths using a processor, and
instructing a tandem mass spectrometer to fragment each region of the mass range at least twice using overlapping measured mass selection window widths using the processor, wherein an overlap in at least two measured mass selection window widths corresponds to at least one target mass selection window width.

18. The method of claim 17 , wherein the two or more target mass selection window widths have the same width.

19. The method of claim 17 , wherein the two or more target mass selection window widths have variable widths.

20. The method of claim 17 , wherein the two or more measured mass selection window widths have the same width.

Assignees

• Dh Technologies Dev Pte Ltd

Inventors

• Tate Stephen A
• Bonner Ronald F

Classifications

• H01J49/0036

  Step by step routines describing the handling of the data generated during a measurement · CPC title

• G01N30/8631

  Peaks · CPC title

• G01N30/7233

  interfaced to liquid or supercritical fluid chromatograph (interfaces in general for introducing or extracting samples to be analysed with specially adapted mass spectrometer, see H01J49/04) · CPC title

• H01J49/004

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title

• H01J49/0031 Primary

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title