Method of monitoring quality of liquid crystal display panel

US9842523B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9842523-B2
Application numberUS-201514437927-A
CountryUS
Kind codeB2
Filing dateJan 16, 2015
Priority dateDec 31, 2014
Publication dateDec 12, 2017
Grant dateDec 12, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The invention provides a method of monitoring a quality of a liquid crystal display including: selecting multiple quality parameters related to the quality of the liquid crystal display and obtaining an expression of the quality with respect to the quality parameters; acquiring a value of each of the quality parameters and substituting the value of each of the quality parameters into the expression of the quality with respect to the quality parameters to obtain a first value; judging the first value whether falls into a predetermined range; and when the first value falls into the predetermined range, determining the quality of the liquid crystal display as normal.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of monitoring a quality of a liquid crystal display, comprising: selecting a plurality of quality parameters related to the quality of the liquid crystal display and obtaining an expression of the quality with respect to the plurality of quality parameters; acquiring a value of each of the plurality of quality parameters and substituting the value of each of the plurality of quality parameters into the expression of the quality with respect to the plurality of quality parameters to obtain a first value; judging whether the first value falls into a predetermined range; when the first value falls into the predetermined range, determining the quality of the liquid crystal display as normal; monitoring a corresponding quality parameter(s) of each process of the liquid crystal display; if it is found in a certain process that finally obtained first value does not fall into the predetermined range, adjusting a corresponding quality parameter(s) of at least one process being after the certain process. 2. The method of monitoring a quality of a liquid crystal display as claimed in claim 1 , further comprising: when the first value does not fall into the predetermined range, determining the quality of the liquid crystal display as abnormal. 3. The method of monitoring a quality of a liquid crystal display as claimed in claim 2 , further comprising: when the quality of the liquid crystal display is determined as abnormal, adjusting a corresponding process(es) of at least one of the plurality of quality parameters. 4. The method of monitoring a quality of a liquid crystal display as claimed in claim 1 , further comprising: when the first value obtained after adjusting the corresponding quality parameter(s) of the at least one process being after the certain process still does not fall into the predetermined range, adjusting a corresponding quality parameter(s) of at least one process being before the certain process. 5. The method of monitoring a quality of a liquid crystal display as claimed in claim 1 , wherein the step of selecting a plurality of quality parameters related to the quality of the liquid crystal display and obtaining an expression of the quality with respect to the plurality of quality parameters uses a least square method to obtain the expression of the quality with respect to the plurality of quality parameters. 6. The method of monitoring a quality of a liquid crystal display as claimed in claim 1 , wherein the quality of the liquid crystal display comprises Gamma value, contrast ratio or transmittance of the liquid crystal display. 7. The method of monitoring a quality of a liquid crystal display as claimed in claim 1 , wherein the plurality of quality parameters of the liquid crystal display comprise one of thickness of alignment film, temperature of alignment film, distance between pixel electrodes, thickness of pixel electrode, interval between a color filter substrate and a thin film transistor array substrate, applied voltage of liquid crystal panel, brightness of liquid crystal panel and mass of liquid crystal, or a combination of at least one thereof.

Assignees

Inventors

Classifications

  • Test circuits or failure detection circuits included in a display system, as permanent part thereof · CPC title

  • G09G3/006Primary

    Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309) · CPC title

  • Arrangements or methods for testing or calibrating a device · CPC title

  • Repairing; Testing · CPC title

  • using liquid crystals · CPC title

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What does patent US9842523B2 cover?
The invention provides a method of monitoring a quality of a liquid crystal display including: selecting multiple quality parameters related to the quality of the liquid crystal display and obtaining an expression of the quality with respect to the quality parameters; acquiring a value of each of the quality parameters and substituting the value of each of the quality parameters into the expres…
Who is the assignee on this patent?
Shenzhen China Star Optoelect, Shenzhen China Star Optoelect
What technology area does this patent fall under?
Primary CPC classification G09G3/006. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 12 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).